Douglas L. McKay

Follow

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
High density interconnect system having rapid fabrication cycle
- Patent number 7,884,634
- Issue date Feb 8, 2011
- Verigy (Singapore) PTE, Ltd.
- Fu Chiung Chong
- G01 - MEASURING TESTING
Information Patent Grant
High density interconnect system having rapid fabrication cycle
- Patent number 7,872,482
- Issue date Jan 18, 2011
- Verigy (Singapore) Pte. Ltd.
- Fu Chiung Chong
- G01 - MEASURING TESTING
Information Patent Grant
High density interconnect system having rapid fabrication cycle
- Patent number 7,382,142
- Issue date Jun 3, 2008
- NanoNexus, Inc.
- Fu Chiung Chong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Construction Structures and Manufacturing Processes for Integrated...
- Publication number 20120212248
- Publication date Aug 23, 2012
- Fu Chiung Chong
- G01 - MEASURING TESTING
Information Patent Application
CONSTRUCTION STRUCTURES AND MANUFACTURING PROCESSES FOR INTEGRATED...
- Publication number 20120023730
- Publication date Feb 2, 2012
- Fu Chiung Chong
- G01 - MEASURING TESTING
Information Patent Application
Construction Structures and Manufacturing Processes for Integrated...
- Publication number 20100026331
- Publication date Feb 4, 2010
- Fu Chiung Chong
- G01 - MEASURING TESTING
Information Patent Application
High Density Interconnect System Having Rapid Fabrication Cycle
- Publication number 20090153165
- Publication date Jun 18, 2009
- Fu Chiung CHONG
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTERCONNECT SYSTEM HAVING RAPID FABRICATION CYCLE
- Publication number 20080246500
- Publication date Oct 9, 2008
- Fu Chiung CHONG
- G01 - MEASURING TESTING
Information Patent Application
High density interconnect system having rapid fabrication cycle
- Publication number 20050275418
- Publication date Dec 15, 2005
- Fu Chiung Chong
- G01 - MEASURING TESTING