Douglas S. Ondricek

Person

Lafayette, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of centering probe head in mounting frame
- Patent number 12,044,704
- Issue date Jul 23, 2024
- FormFactor, Inc.
- Kalyanjit Ghosh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card thermal conditioning system
- Patent number 8,350,191
- Issue date Jan 8, 2013
- FormFactor, Inc.
- Douglas S. Ondricek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probe card alignment in a test system
- Patent number 7,977,956
- Issue date Jul 12, 2011
- FormFactor, Inc.
- Keith J. Breinlinger
- G01 - MEASURING TESTING
Information Patent Grant
Method for processing an integrated circuit
- Patent number 7,217,580
- Issue date May 15, 2007
- FormFactor. Inc.
- Douglas S. Ondricek
- G01 - MEASURING TESTING
Information Patent Grant
Method for processing an integrated circuit including placing dice...
- Patent number 6,887,723
- Issue date May 3, 2005
- FormFactor, Inc.
- Douglas S. Ondricek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the transport and tracking of an electroni...
- Patent number 6,644,982
- Issue date Nov 11, 2003
- FormFactor, Inc.
- Douglas S. Ondricek
- G01 - MEASURING TESTING
Information Patent Grant
Method for mounting an electronic component
- Patent number 6,627,483
- Issue date Sep 30, 2003
- FormFactor, Inc.
- Douglas S. Ondricek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing testing of double-sided ball gr...
- Patent number 6,020,749
- Issue date Feb 1, 2000
- Hewlett-Packard Company
- Terrel L. Morris
- G01 - MEASURING TESTING
Information Patent Grant
Backing plate for LGA mounting of integrated circuits facilitates p...
- Patent number 5,883,788
- Issue date Mar 16, 1999
- Hewlett-Packard Company
- Douglas S. Ondricek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of centering probe head in mounting frame
- Publication number 20220276281
- Publication date Sep 1, 2022
- Kalyanjit Ghosh
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROBE CARD ALIGNMENT IN A TEST SYSTEM
- Publication number 20100271062
- Publication date Oct 28, 2010
- FormFactor, Inc.
- Keith J. Breinlinger
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD THERMAL CONDITIONING SYSTEM
- Publication number 20090289050
- Publication date Nov 26, 2009
- FormFactor, Inc.
- DOUGLAS S. ONDRICEK
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROCESSING AN INTEGRATED CIRCUIT
- Publication number 20070269909
- Publication date Nov 22, 2007
- FormFactor, Inc.
- Douglas S. Ondricek
- G01 - MEASURING TESTING
Information Patent Application
Method for processing an integrated circuit
- Publication number 20050164416
- Publication date Jul 28, 2005
- FormFactor, Inc.
- Douglas S. Ondricek
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MOUNTING AN ELECTRONIC COMPONENT
- Publication number 20020025603
- Publication date Feb 28, 2002
- DOUGLAS S. ONDRICEK
- G01 - MEASURING TESTING

Douglas S. Ondricek

Person

Patents Grantslast 30 patents

Method of centering probe head in mounting frame

Probe card thermal conditioning system

Method and apparatus for probe card alignment in a test system

Method for processing an integrated circuit

Method for processing an integrated circuit including placing dice...

Method and apparatus for the transport and tracking of an electroni...

Method for mounting an electronic component

Method and apparatus for performing testing of double-sided ball gr...

Backing plate for LGA mounting of integrated circuits facilitates p...

Patents Applicationslast 30 patents

Method of centering probe head in mounting frame

METHOD AND APPARATUS FOR PROBE CARD ALIGNMENT IN A TEST SYSTEM

PROBE CARD THERMAL CONDITIONING SYSTEM

METHOD FOR PROCESSING AN INTEGRATED CIRCUIT

Method for processing an integrated circuit

METHOD FOR MOUNTING AN ELECTRONIC COMPONENT