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Duncan M. Rogers
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Plano, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Characterizing dimensions of structures via scanning probe microscopy
Patent number
9,347,897
Issue date
May 24, 2016
Texas Instruments Incorporated
Duncan M Rogers
G01 - MEASURING TESTING
Information
Patent Grant
Characterizing dimensions of structures via scanning probe microscopy
Patent number
7,381,950
Issue date
Jun 3, 2008
Texas Instruments Incorporated
Duncan M. Rogers
G01 - MEASURING TESTING
Information
Patent Grant
Method of molecular-scale pattern imprinting at surfaces
Patent number
6,878,417
Issue date
Apr 12, 2005
John C. Polanyi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
Characterizing Dimensions of Structures Via Scanning Probe Microscopy
Publication number
20120137396
Publication date
May 31, 2012
TEXAS INSTRUMENTS INCORPORATED
Duncan M. Rogers
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Device Manufactured Using an Oxygenated Passivation P...
Publication number
20080258238
Publication date
Oct 23, 2008
TEXAS INSTRUMENTS INCORPORATED
Duncan M. Rogers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Characterizing Dimensions of Structures Via Scanning Probe Microscopy
Publication number
20060237645
Publication date
Oct 26, 2006
TEXAS INSTRUMENTS INCORPORATED
Duncan M. Rogers
G01 - MEASURING TESTING
Information
Patent Application
Characterizing dimensions of structures via scanning probe microscopy
Publication number
20060071164
Publication date
Apr 6, 2006
TEXAS INSTRUMENTS INCORPORATED
Duncan M. Rogers
G01 - MEASURING TESTING
Information
Patent Application
Method of molecular-scale pattern imprinting at surfaces
Publication number
20030157733
Publication date
Aug 21, 2003
John C. Polanyi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...