Duncan Packard Gurley

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods, apparatus, and systems for contacting semiconductor dies t...
- Patent number 9,632,109
- Issue date Apr 25, 2017
- Advantest Corporation
- Larry John Dibattista
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, methods and apparatus using virtual appliances in a semicon...
- Patent number 9,317,351
- Issue date Apr 19, 2016
- Advantest Corporation
- Klaus-Dieter Hilliges
- G01 - MEASURING TESTING
Information Patent Grant
Wafer boat for semiconductor testing
- Patent number 9,146,274
- Issue date Sep 29, 2015
- Advantest Corporation
- Ajay Khoche
- G01 - MEASURING TESTING
Information Patent Grant
System and method for electronic testing of multiple memory devices
- Patent number 7,707,468
- Issue date Apr 27, 2010
- Verigy (Singapore) Pte. Ltd.
- Erik Volkerink
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer test head architecture and method of use
- Patent number 7,378,860
- Issue date May 27, 2008
- Verigy (Singapore) Pte. Ltd.
- Erik Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
Data converter with integrated MEMS resonator clock
- Patent number 7,250,892
- Issue date Jul 31, 2007
- Verigy (Singapore) Pte. Ltd.
- Michael J. Weinstein
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
System, Methods and Apparatus Using Virtual Appliances in a Semicon...
- Publication number 20150370248
- Publication date Dec 24, 2015
- Advantest Corporation
- Klaus-Dieter Hilliges
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM, METHODS AND APPARATUS USING VIRTUAL APPLIANCES IN A SEMICON...
- Publication number 20140189430
- Publication date Jul 3, 2014
- Verigy (Singapore) Pte. Ltd.
- Klaus-Dieter Hilliges
- G01 - MEASURING TESTING
Information Patent Application
Methods, Apparatus, and Systems for Contacting Semiconductor Dies t...
- Publication number 20140002122
- Publication date Jan 2, 2014
- ADVANTEST (SINGAPORE) PTE LTD
- Larry John Dibattista
- G01 - MEASURING TESTING
Information Patent Application
Wafer boat for semiconductor testing
- Publication number 20090053837
- Publication date Feb 26, 2009
- Verigy (Singapore) Pte. Ltd.
- Ajay Khoche
- G01 - MEASURING TESTING
Information Patent Application
System and method for electronic testing of multiple memory devices
- Publication number 20080235537
- Publication date Sep 25, 2008
- Erik Volkerink
- G11 - INFORMATION STORAGE
Information Patent Application
Electronic testing device for memory devices and related methods
- Publication number 20080235542
- Publication date Sep 25, 2008
- Duncan Gurley
- G11 - INFORMATION STORAGE
Information Patent Application
Wafer test head architecture and method of use
- Publication number 20080088326
- Publication date Apr 17, 2008
- Verigy (Singapore) Pte. Ltd.
- Erik Volkerink
- G01 - MEASURING TESTING
Information Patent Application
Data converter with integrated MEMS resonator clock
- Publication number 20070052565
- Publication date Mar 8, 2007
- Michael J. Weinstein
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Apparatus and method for using MEMS filters to test electronic circ...
- Publication number 20060174177
- Publication date Aug 3, 2006
- Michael J. Weinstein
- H03 - BASIC ELECTRONIC CIRCUITRY

Duncan Packard Gurley

Person

Patents Grantslast 30 patents

Methods, apparatus, and systems for contacting semiconductor dies t...

System, methods and apparatus using virtual appliances in a semicon...

Wafer boat for semiconductor testing

System and method for electronic testing of multiple memory devices

Wafer test head architecture and method of use

Data converter with integrated MEMS resonator clock

Patents Applicationslast 30 patents

System, Methods and Apparatus Using Virtual Appliances in a Semicon...

SYSTEM, METHODS AND APPARATUS USING VIRTUAL APPLIANCES IN A SEMICON...

Methods, Apparatus, and Systems for Contacting Semiconductor Dies t...

Wafer boat for semiconductor testing

System and method for electronic testing of multiple memory devices

Electronic testing device for memory devices and related methods

Wafer test head architecture and method of use

Data converter with integrated MEMS resonator clock

Apparatus and method for using MEMS filters to test electronic circ...