TREA

Dustin Fregeau

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  • South Burlington, VT, US
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20200049738
    • Publication date Feb 13, 2020
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOLDER BUMP ARRAY PROBE TIP STRUCTURE FOR LASER CLEANING
    • Publication number 20180059141
    • Publication date Mar 1, 2018
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20170356933
    • Publication date Dec 14, 2017
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20160077129
    • Publication date Mar 17, 2016
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOLDER BUMP ARRAY PROBE TIP STRUCTURE FOR LASER CLEANING
    • Publication number 20150331014
    • Publication date Nov 19, 2015
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    RIGID PROBE WITH COMPLIANT CHARACTERISTICS
    • Publication number 20140167801
    • Publication date Jun 19, 2014
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    RIGID PROBE WITH COMPLIANT CHARACTERISTICS
    • Publication number 20140167802
    • Publication date Jun 19, 2014
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE-ON-SUBSTRATE
    • Publication number 20130344694
    • Publication date Dec 26, 2013
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE-ON-SUBSTRATE
    • Publication number 20130342234
    • Publication date Dec 26, 2013
    • Intenational Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHODOLOGIES AND TEST CONFIGURATIONS FOR TESTING THERMAL INTERFACE...
    • Publication number 20130229198
    • Publication date Sep 5, 2013
    • International Business Machines Corporation
    • Dustin FREGEAU
    • G01 - MEASURING TESTING
  • Information Patent Application

    VERTICAL PROBE ASSEMBLY WITH AIR CHANNEL
    • Publication number 20130147502
    • Publication date Jun 13, 2013
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    High Performance Compliant Wafer Test Probe
    • Publication number 20120329295
    • Publication date Dec 27, 2012
    • International Business Machines Corporation
    • S. Jay Chey
    • G01 - MEASURING TESTING
  • Information Patent Application

    Methodologies and Test Configurations for Testing Thermal Interface...
    • Publication number 20110267082
    • Publication date Nov 3, 2011
    • International Business Machines Corporation
    • Dustin FREGEAU
    • G01 - MEASURING TESTING
  • Information Patent Application

    High Performance Compliant Wafer Test Probe
    • Publication number 20110266539
    • Publication date Nov 3, 2011
    • International Business Machines Corporation
    • S. Jay Chey
    • G01 - MEASURING TESTING