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Dwayne M. Burek
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Nepean, CA
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last 30 patents
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Patent Grant
Method and apparatus for scan testing digital circuits
Patent number
6,145,105
Issue date
Nov 7, 2000
LogicVision, Inc.
Benoit Nadeau-Dostie
G01 - MEASURING TESTING
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Patent Grant
Multiple clock rate test apparatus for testing digital systems
Patent number
5,349,587
Issue date
Sep 20, 1994
Northern Telecom Limited
Benoit Nadeau-Dostie
G06 - COMPUTING CALCULATING COUNTING