Edward I. Cole Jr.

Person

New Bernalillo, NM, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test circuits for integrated circuit counterfeit detection
- Patent number 10,060,973
- Issue date Aug 28, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Ryan Helinski
- G01 - MEASURING TESTING
Information Patent Grant
Visible light laser voltage probing on thinned substrates
- Patent number 9,599,667
- Issue date Mar 21, 2017
- Sandia Corporation
- Joshua Beutler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power spectrum analysis for defect screening in integrated circuit...
- Patent number 9,188,622
- Issue date Nov 17, 2015
- Sandia Corporation
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analyzing functional failures in integrate...
- Patent number 6,549,022
- Issue date Apr 15, 2003
- Sandia Corporation
- Edward I. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Data processing device test apparatus and method therefor
- Patent number 6,546,513
- Issue date Apr 8, 2003
- Advanced Micro Devices
- Richard Jacob Wilcox
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermally-induced voltage alteration for analysis of microelectrome...
- Patent number 6,407,560
- Issue date Jun 18, 2002
- Sandia Corporation
- Jeremy A. Walraven
- G01 - MEASURING TESTING
Information Patent Grant
Thermally-induced voltage alteration for integrated circuit analysis
- Patent number 6,078,183
- Issue date Jun 20, 2000
- Sandia Corporation
- Edward I. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for defect testing of integrated circuits
- Patent number 6,031,386
- Issue date Feb 29, 2000
- Sandia Corporation
- Edward I. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive charge generation apparatus and method for testing circuits
- Patent number 5,781,017
- Issue date Jul 14, 1998
- Sandia Corporation
- Edward I. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit failure analysis by low-energy charge-induced vo...
- Patent number 5,523,694
- Issue date Jun 4, 1996
- Edward I. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic force microscopy method and apparatus to detect and image...
- Patent number 5,465,046
- Issue date Nov 7, 1995
- Ann. N. Campbell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Light-induced voltage alteration for integrated circuit analysis
- Patent number 5,430,305
- Issue date Jul 4, 1995
- The United States of America as represented by the United States Department o...
- Edward I. Cole
- G01 - MEASURING TESTING

Edward I. Cole Jr.

Person

Patents Grantslast 30 patents

Test circuits for integrated circuit counterfeit detection

Visible light laser voltage probing on thinned substrates

Power spectrum analysis for defect screening in integrated circuit...

Apparatus and method for analyzing functional failures in integrate...

Data processing device test apparatus and method therefor

Thermally-induced voltage alteration for analysis of microelectrome...

Thermally-induced voltage alteration for integrated circuit analysis

Apparatus and method for defect testing of integrated circuits

Capacitive charge generation apparatus and method for testing circuits

Integrated circuit failure analysis by low-energy charge-induced vo...

Magnetic force microscopy method and apparatus to detect and image...

Light-induced voltage alteration for integrated circuit analysis