Edward P. Maciejewski

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test structures connected with the lowest metallization levels in a...
- Patent number 10,796,973
- Issue date Oct 6, 2020
- GLOBALFOUNDRIES Inc.
- Mankyu Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure leveraging the lowest metallization level of an inte...
- Patent number 10,790,204
- Issue date Sep 29, 2020
- GLOBALFOUNDRIES Inc.
- Mankyu Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin-type metal-semiconductor resistors and fabrication methods thereof
- Patent number 9,595,518
- Issue date Mar 14, 2017
- GLOBALFOUNDRIES Inc.
- Anthony I-Chih Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Merged source drain epitaxy
- Patent number 9,437,496
- Issue date Sep 6, 2016
- GLOBALFOUNDRIES Inc.
- Michael P. Chudzik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring structure for trench fuse component with methods of fabrication
- Patent number 9,431,339
- Issue date Aug 30, 2016
- International Business Machines Corporation
- Toshiaki Kirihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring structure for trench fuse component with methods of fabrication
- Patent number 9,431,340
- Issue date Aug 30, 2016
- International Business Machines Corporation
- Toshiaki Kirihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming a self-aligned maskless junction butting for in...
- Patent number 9,209,200
- Issue date Dec 8, 2015
- GLOBALFOUNDRIES Inc.
- Edward P. Maciejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a gated diode structure for eliminating RIE damag...
- Patent number 9,064,972
- Issue date Jun 23, 2015
- International Business Machines Corporation
- Anthony I. Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
eFUSE and method of fabrication
- Patent number 8,980,720
- Issue date Mar 17, 2015
- International Business Machines Corporation
- Edward P. Maciejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
eFuse and method of fabrication
- Patent number 8,912,626
- Issue date Dec 16, 2014
- International Business Machines Corporation
- Edward P. Maciejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Creating anisotropically diffused junctions in field effect transis...
- Patent number 8,796,771
- Issue date Aug 5, 2014
- International Business Machines Corporation
- Brian J. Greene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gated diode structure for eliminating RIE damage from cap removal
- Patent number 8,779,551
- Issue date Jul 15, 2014
- International Business Machines Corporation
- Anthony I. Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Creating anisotropically diffused junctions in field effect transis...
- Patent number 8,633,096
- Issue date Jan 21, 2014
- International Business Machines Corporation
- Brian J. Greene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method to improve threshold voltage of MOSFETs includ...
- Patent number 8,513,085
- Issue date Aug 20, 2013
- International Business Machines Corporation
- Sunfei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High speed measurement of random variation/yield in integrated circ...
- Patent number 8,456,169
- Issue date Jun 4, 2013
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Method of providing threshold voltage adjustment through gate diele...
- Patent number 8,354,309
- Issue date Jan 15, 2013
- International Business Machines Corporation
- Brian J. Greene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method to improve threshold voltage of MOSFETS includ...
- Patent number 8,173,531
- Issue date May 8, 2012
- International Business Machines Corporation
- Sunfei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Threshold voltage adjustment through gate dielectric stack modifica...
- Patent number 8,106,455
- Issue date Jan 31, 2012
- International Business Machines Corporation
- Brian J. Greene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for pulse generation used in characterizing e...
- Patent number 7,583,125
- Issue date Sep 1, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for characterizing electronic fuses used to p...
- Patent number 7,504,875
- Issue date Mar 17, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Determining thermal absorption using ring oscillator
- Patent number 7,408,421
- Issue date Aug 5, 2008
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Grant
Structure for monitoring semiconductor polysilicon gate profile
- Patent number 7,396,694
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making electrically programmable fuse for silicon-on-insu...
- Patent number 7,354,805
- Issue date Apr 8, 2008
- International Business Machines Corporation
- Chandrasekharan Kothandaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for characterizing electronic fuses used to p...
- Patent number 7,295,057
- Issue date Nov 13, 2007
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Electrically programmable fuse for silicon-on-insulator (SOI) techn...
- Patent number 7,242,072
- Issue date Jul 10, 2007
- International Business Machines Corporation
- Chandrasekharan Kothandaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for improved diode ideality
- Patent number 7,227,204
- Issue date Jun 5, 2007
- International Business Machines Corporation
- Edward P. Maciejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for monitoring semiconductor polysilicon gate profile
- Patent number 7,135,346
- Issue date Nov 14, 2006
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for avoiding oxide undercut during pre-silicide clean for th...
- Patent number 7,091,128
- Issue date Aug 15, 2006
- International Business Machines Corporation
- Atul C. Ajmera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for avoiding oxide undercut during pre-silicide clean for th...
- Patent number 6,991,979
- Issue date Jan 31, 2006
- International Business Machines Corporation
- Atul C. Ajmera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for measurement of capacitance of ultra-thin dielectrics
- Patent number 6,980,009
- Issue date Dec 27, 2005
- International Business Machines Corporation
- Edward P. Maciejewski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURE LEVERAGING THE LOWEST METALLIZATION LEVEL OF AN INTE...
- Publication number 20200152530
- Publication date May 14, 2020
- GLOBALFOUNDRIES INC.
- Mankyu Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURES CONNECTED WITH THE LOWEST METALLIZATION LEVELS IN A...
- Publication number 20200152531
- Publication date May 14, 2020
- GLOBALFOUNDRIES INC.
- Mankyu Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIRING STRUCTURE FOR TRENCH FUSE COMPONENT WITH METHODS OF FABRICATION
- Publication number 20160163642
- Publication date Jun 9, 2016
- International Business Machines Corporation
- Toshiaki Kirihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH DENSITY FINFET DEVICES WITH UNMERGED FINS
- Publication number 20150333145
- Publication date Nov 19, 2015
- International Business Machines Corporation
- Michael P. Chudzik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIRING STRUCTURE FOR TRENCH FUSE COMPONENT WITH METHODS OF FABRICATION
- Publication number 20150235945
- Publication date Aug 20, 2015
- International Business Machines Corporation
- Toshiaki Kirihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED MASKLESS JUNCTION BUTTING FOR INTEGRATED CIRCUITS
- Publication number 20150108571
- Publication date Apr 23, 2015
- International Business Machines Corporation
- Edward P. Maciejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
eFUSE AND METHOD OF FABRICATION
- Publication number 20140357045
- Publication date Dec 4, 2014
- Edward P. Maciejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming A Gated Diode Structure for Eliminating RIE Damag...
- Publication number 20140206160
- Publication date Jul 24, 2014
- Anthony I. Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREATING ANISOTROPICALLY DIFFUSED JUNCTIONS IN FIELD EFFECT TRANSIS...
- Publication number 20140042541
- Publication date Feb 13, 2014
- International Business Machines Corporation
- Brian J. Greene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATED DIODE STRUCTURE FOR ELIMINATING RIE DAMAGE FROM CAP REMOVAL
- Publication number 20130328124
- Publication date Dec 12, 2013
- International Business Machines Corporation
- Anthony I. Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
eFUSE AND METHOD OF FABRICATION
- Publication number 20120187529
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Edward P. Maciejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD TO IMPROVE THRESHOLD VOLTAGE OF MOSFETS INCLUD...
- Publication number 20120168874
- Publication date Jul 5, 2012
- International Business Machines Corporation
- Sunfei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREATING ANISOTROPICALLY DIFFUSED JUNCTIONS IN FIELD EFFECT TRANSIS...
- Publication number 20120119294
- Publication date May 17, 2012
- International Business Machines Corporation
- BRIAN J. GREENE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THRESHOLD VOLTAGE ADJUSTMENT THROUGH GATE DIELECTRIC STACK MODIFICA...
- Publication number 20120108017
- Publication date May 3, 2012
- International Business Machines Corporation
- Brian J. Greene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH SPEED MEASUREMENT OF RANDOM VARIATION/YIELD IN INTEGRATED CIRC...
- Publication number 20110169499
- Publication date Jul 14, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD TO IMPROVE THRESHOLD VOLTAGE OF MOSFETS INCLUD...
- Publication number 20110031554
- Publication date Feb 10, 2011
- International Business Machines Corporation
- Sunfei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Threshold Voltage Adjustment Through Gate Dielectric Stack Modifica...
- Publication number 20100276753
- Publication date Nov 4, 2010
- International Business Machines Corporation
- Brian J. Greene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Apparatus for Characterizing Electronic Fuses Used to P...
- Publication number 20080048638
- Publication date Feb 28, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Characterizing Electronic Fuses Used to P...
- Publication number 20080048761
- Publication date Feb 28, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THERMAL ABSORPTION USING RING OSCILLATOR
- Publication number 20080007354
- Publication date Jan 10, 2008
- Ishtiaq Ahsan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTRICALLY PROGRAMMABLE FUSE FOR SILICON-ON-INSULATOR (SOI) TECHN...
- Publication number 20070190697
- Publication date Aug 16, 2007
- International Business Machines Corporation
- Chandrasekharan Kothandaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE FOR MONITORING SEMICONDUCTOR POLYSILICON GATE PROFILE
- Publication number 20070087593
- Publication date Apr 19, 2007
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR IMPROVED DIODE IDEALITY
- Publication number 20060180868
- Publication date Aug 17, 2006
- International Business Machines Corporation
- Edward P. Maciejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and apparatus for characterizing electronic fuses used to p...
- Publication number 20060158239
- Publication date Jul 20, 2006
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
AN ELECTRICALLY PROGRAMMABLE FUSE FOR SILICON-ON-INSULATOR (SOI) TE...
- Publication number 20060108662
- Publication date May 25, 2006
- International Business Machines Corporation
- Chandrasekharan Kothandaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for avoiding oxide undercut during pre-silicide clean for th...
- Publication number 20060057797
- Publication date Mar 16, 2006
- International Business Machines Corporation
- Atul C. Ajmera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure for monitoring semiconductor polysilicon gate profile
- Publication number 20060024853
- Publication date Feb 2, 2006
- International Busines Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUITS ASSOCIATED WITH FUSIBLE ELEMENTS FOR ESTABLISHING AND DETE...
- Publication number 20050225375
- Publication date Oct 13, 2005
- International Business Machines Corporation
- Mark E. Anderson
- G11 - INFORMATION STORAGE
Information Patent Application
STRUCTURE FOR MEASUREMENT OF CAPACITANCE OF ULTRA-THIN DIELECTRICS
- Publication number 20050088186
- Publication date Apr 28, 2005
- International Business Machines Corporation
- Edward P. Maciejewski
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR AVOIDING OXIDE UNDERCUT DURING PRE-SILICIDE CLEAN FOR TH...
- Publication number 20050064635
- Publication date Mar 24, 2005
- International Business Machines Corporation
- Atul C. Ajmera
- H01 - BASIC ELECTRIC ELEMENTS

Edward P. Maciejewski

Person

Patents Grantslast 30 patents

Test structures connected with the lowest metallization levels in a...

Test structure leveraging the lowest metallization level of an inte...

Fin-type metal-semiconductor resistors and fabrication methods thereof

Merged source drain epitaxy

Wiring structure for trench fuse component with methods of fabrication

Wiring structure for trench fuse component with methods of fabrication

Methods for forming a self-aligned maskless junction butting for in...

Method of forming a gated diode structure for eliminating RIE damag...

eFUSE and method of fabrication

eFuse and method of fabrication

Creating anisotropically diffused junctions in field effect transis...

Gated diode structure for eliminating RIE damage from cap removal

Creating anisotropically diffused junctions in field effect transis...

Structure and method to improve threshold voltage of MOSFETs includ...

High speed measurement of random variation/yield in integrated circ...

Method of providing threshold voltage adjustment through gate diele...

Structure and method to improve threshold voltage of MOSFETS includ...

Threshold voltage adjustment through gate dielectric stack modifica...

Methods and apparatus for pulse generation used in characterizing e...

Methods and apparatus for characterizing electronic fuses used to p...

Determining thermal absorption using ring oscillator

Structure for monitoring semiconductor polysilicon gate profile

Method of making electrically programmable fuse for silicon-on-insu...

Methods and apparatus for characterizing electronic fuses used to p...

Electrically programmable fuse for silicon-on-insulator (SOI) techn...

Structure for improved diode ideality

Structure for monitoring semiconductor polysilicon gate profile

Method for avoiding oxide undercut during pre-silicide clean for th...

Method for avoiding oxide undercut during pre-silicide clean for th...

Structure for measurement of capacitance of ultra-thin dielectrics

Patents Applicationslast 30 patents

TEST STRUCTURE LEVERAGING THE LOWEST METALLIZATION LEVEL OF AN INTE...

TEST STRUCTURES CONNECTED WITH THE LOWEST METALLIZATION LEVELS IN A...

WIRING STRUCTURE FOR TRENCH FUSE COMPONENT WITH METHODS OF FABRICATION

HIGH DENSITY FINFET DEVICES WITH UNMERGED FINS

WIRING STRUCTURE FOR TRENCH FUSE COMPONENT WITH METHODS OF FABRICATION

SELF-ALIGNED MASKLESS JUNCTION BUTTING FOR INTEGRATED CIRCUITS

eFUSE AND METHOD OF FABRICATION

Method of Forming A Gated Diode Structure for Eliminating RIE Damag...

CREATING ANISOTROPICALLY DIFFUSED JUNCTIONS IN FIELD EFFECT TRANSIS...

GATED DIODE STRUCTURE FOR ELIMINATING RIE DAMAGE FROM CAP REMOVAL

eFUSE AND METHOD OF FABRICATION

STRUCTURE AND METHOD TO IMPROVE THRESHOLD VOLTAGE OF MOSFETS INCLUD...

CREATING ANISOTROPICALLY DIFFUSED JUNCTIONS IN FIELD EFFECT TRANSIS...

THRESHOLD VOLTAGE ADJUSTMENT THROUGH GATE DIELECTRIC STACK MODIFICA...

HIGH SPEED MEASUREMENT OF RANDOM VARIATION/YIELD IN INTEGRATED CIRC...

STRUCTURE AND METHOD TO IMPROVE THRESHOLD VOLTAGE OF MOSFETS INCLUD...

Threshold Voltage Adjustment Through Gate Dielectric Stack Modifica...

Methods and Apparatus for Characterizing Electronic Fuses Used to P...

Methods and Apparatus for Characterizing Electronic Fuses Used to P...

DETERMINING THERMAL ABSORPTION USING RING OSCILLATOR

ELECTRICALLY PROGRAMMABLE FUSE FOR SILICON-ON-INSULATOR (SOI) TECHN...

STRUCTURE FOR MONITORING SEMICONDUCTOR POLYSILICON GATE PROFILE

STRUCTURE AND METHOD FOR IMPROVED DIODE IDEALITY

Methods and apparatus for characterizing electronic fuses used to p...

AN ELECTRICALLY PROGRAMMABLE FUSE FOR SILICON-ON-INSULATOR (SOI) TE...

Method for avoiding oxide undercut during pre-silicide clean for th...

Structure for monitoring semiconductor polysilicon gate profile

CIRCUITS ASSOCIATED WITH FUSIBLE ELEMENTS FOR ESTABLISHING AND DETE...

STRUCTURE FOR MEASUREMENT OF CAPACITANCE OF ULTRA-THIN DIELECTRICS

METHOD FOR AVOIDING OXIDE UNDERCUT DURING PRE-SILICIDE CLEAN FOR TH...