Edward V. Weber

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Registration of patterns formed of multiple fields
- Patent number 5,301,124
- Issue date Apr 5, 1994
- International Business Machines Corporation
- Ken T. Chan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dynamic compensation of non-linear electron beam landing angle in v...
- Patent number 5,285,074
- Issue date Feb 8, 1994
- International Business Machines Corporation
- Don F. Haire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for generating inspection patterns
- Patent number 4,581,537
- Issue date Apr 8, 1986
- International Business Machines Corporation
- Wallace J. Guillaume
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment technique
- Patent number 4,546,260
- Issue date Oct 8, 1985
- International Business Machines Corporation
- Robert A. Simpson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection tool - method and apparatus
- Patent number 4,365,163
- Issue date Dec 21, 1982
- International Business Machines Corporation
- Donald E. Davis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for forming a variable size electron beam
- Patent number 4,243,866
- Issue date Jan 6, 1981
- International Business Machines Corporation
- Hans C. Pfeiffer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Automatic overlay measurements using an electronic beam system as a...
- Patent number 4,149,085
- Issue date Apr 10, 1979
- International Business Machines Corporation
- Donald E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling brightness and alignment of a...
- Patent number 4,000,440
- Issue date Dec 28, 1976
- International Business Machines Corporation
- Alan V. Hall
- H01 - BASIC ELECTRIC ELEMENTS

Edward V. Weber

Person

Patents Grantslast 30 patents

Registration of patterns formed of multiple fields

Dynamic compensation of non-linear electron beam landing angle in v...

Method for generating inspection patterns

Alignment technique

Pattern inspection tool - method and apparatus

Method and apparatus for forming a variable size electron beam

Automatic overlay measurements using an electronic beam system as a...

Method and apparatus for controlling brightness and alignment of a...