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Edward W. Sengle
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Hinesburg, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Test structure and methodology for semiconductor stress-induced def...
Patent number
7,132,325
Issue date
Nov 7, 2006
International Business Machines Corporation
Wagdi W. Abadeer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test structure and methodology for semiconductor stress-induced def...
Patent number
6,770,907
Issue date
Aug 3, 2004
International Business Machines Corporation
Wagdi W. Abadeer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test structure and methodology for semiconductor stress-induced def...
Patent number
6,624,031
Issue date
Sep 23, 2003
International Business Machines Corporation
Wagdi W. Abadeer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Trench isolation for active areas and first level conductors
Patent number
6,394,638
Issue date
May 28, 2002
International Business Machines Corporation
Edward W. Sengle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of photolithographically defining three regions with one mas...
Patent number
6,147,394
Issue date
Nov 14, 2000
International Business Machines Corporation
James A. Bruce
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
FET device containing a conducting sidewall spacer for local interc...
Patent number
6,140,171
Issue date
Oct 31, 2000
International Business Machines Corporation
Archibald John Allen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Formation of trench isolation for active areas and first level cond...
Patent number
6,063,687
Issue date
May 16, 2000
International Business Machines Corporation
Edward W. Sengle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of photolithographically defining three regions with one mas...
Patent number
5,972,570
Issue date
Oct 26, 1999
International Business Machines Corporation
James A. Bruce
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Trench isolation for active areas and first level conductors
Patent number
5,734,192
Issue date
Mar 31, 1998
International Business Machines Corporation
Edward W. Sengle
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Test structure and methodology for semiconductor stress-induced def...
Publication number
20040113234
Publication date
Jun 17, 2004
Wagdi W. Abadeer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Test structure and methodology for semiconductor stress-induced def...
Publication number
20030207537
Publication date
Nov 6, 2003
International Business Machines Corporation
Wagdi W. Abadeer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Test structure and methodology for semiconductor stress-induced def...
Publication number
20030094608
Publication date
May 22, 2003
International Business Machines Corporation
Wagdi W. Abadeer
H01 - BASIC ELECTRIC ELEMENTS