Efrain Velazquez

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Los Angeles, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Endpoint detection for non-transparent polishing member
- Patent number 6,942,546
- Issue date Sep 13, 2005
- ASM NuTool, Inc.
- Mukesh Desai
- B24 - GRINDING POLISHING
Information Patent Grant
Chemical mechanical polishing endpoint detection
- Patent number 6,908,374
- Issue date Jun 21, 2005
- Nutool, Inc.
- Yuchun Wang
- B24 - GRINDING POLISHING
Information Patent Grant
Advanced chemical mechanical polishing system with smart endpoint d...
- Patent number 6,857,947
- Issue date Feb 22, 2005
- ASM-Nutool, Inc.
- Yuchun Wang
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
Reduction of defects in conductive layers during electroplating
- Publication number 20050029106
- Publication date Feb 10, 2005
- Laila Baniahmad
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Advanced chemical mechanical polishing system with smart endpoint d...
- Publication number 20040023606
- Publication date Feb 5, 2004
- Yuchun Wang
- B24 - GRINDING POLISHING
Information Patent Application
In-situ endpoint detect for non-transparent polishing member
- Publication number 20030153246
- Publication date Aug 14, 2003
- Mukesh Desai
- B24 - GRINDING POLISHING