Eiichi Watanabe

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Akishima, JP

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Patents Grantslast 30 patents

Information Patent Grant
Mask and apparatus using it to prepare sample by ion milling
- Patent number 7,354,500
- Issue date Apr 8, 2008
- Jeol Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Energy-dispersive X-ray detector and method of evacuating same
- Patent number 5,324,947
- Issue date Jun 28, 1994
- Jeol Ltd.
- Eiichi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 5,289,005
- Issue date Feb 22, 1994
- Jeol Ltd.
- Mikio Naruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for preventing evaporation of liquefied gas in liquefied...
- Patent number 5,212,953
- Issue date May 25, 1993
- Iwatani Sangyo Kabushiki Kaisha
- Etsuji Kawaguchi
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Electron microscope having X-ray detector
- Patent number 4,910,399
- Issue date Mar 20, 1990
- Jeol Ltd.
- Masayuki Taira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multicavity klystron
- Patent number 4,413,207
- Issue date Nov 1, 1983
- Nippon Electric Co., Ltd.
- Takao Kageyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mask and apparatus using it to prepare sample by ion milling
- Publication number 20050081997
- Publication date Apr 21, 2005
- JEOL Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING