Number | Date | Country | Kind |
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3-324507 | Dec 1991 | JPX |
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3609992 | Cacheux | Oct 1971 | |
3864570 | Zingaro | Feb 1975 | |
4230945 | Mein et al. | Oct 1980 | |
4931650 | Lowe et al. | Jun 1990 | |
5065029 | Krivanek | Nov 1991 | |
5075555 | Woldseth et al. | Dec 1991 | |
5163297 | Yani et al. | Nov 1992 | |
5212953 | Kawaguchi et al. | May 1993 |
Entry |
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David D. Cohen, X-Ray Spectrometry, vol. 16, pp. 237-241 (1987), "Ice Thickness and Low-Energy Si(Li) Detector Efficiency Measurements". |