Emanuel Elyasaf

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Machine readable element and optical indicium for authenticating an...
- Patent number 9,699,835
- Issue date Jul 4, 2017
- Goji Limited
- Itzhak Yogev
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multiple optical head inspection system and a method for imaging an...
- Patent number 7,841,529
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
High throughput multi beam detection system and method
- Patent number 7,619,203
- Issue date Nov 17, 2009
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
High throughput multi beam detection system and method
- Patent number 7,601,944
- Issue date Oct 13, 2009
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
High throughput inspection system and a method for generating trans...
- Patent number 7,518,718
- Issue date Apr 14, 2009
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
High throughput multi beam detection system and method
- Patent number 7,504,622
- Issue date Mar 17, 2009
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and a method for aerial reticle inspection
- Patent number 7,400,390
- Issue date Jul 15, 2008
- Applied Materials, Israel, Ltd.
- Alex Goldenshtein
- G01 - MEASURING TESTING
Information Patent Grant
Double inspection of reticle or wafer
- Patent number 7,355,690
- Issue date Apr 8, 2008
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High throughput multi beam system and method
- Patent number 7,326,901
- Issue date Feb 5, 2008
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
High throughput inspection system and method for generating transmi...
- Patent number 7,187,439
- Issue date Mar 6, 2007
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reticle inspection using aerial imaging
- Patent number 7,133,548
- Issue date Nov 7, 2006
- Applied Materials, Inc.
- Boaz Kenan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 7,053,395
- Issue date May 30, 2006
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
High throughput inspection system and method for generating transmi...
- Patent number 6,930,770
- Issue date Aug 16, 2005
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 6,853,475
- Issue date Feb 8, 2005
- Applied Materials Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 6,809,808
- Issue date Oct 26, 2004
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for article inspection including speckle reduc...
- Patent number 6,798,505
- Issue date Sep 28, 2004
- Applied Materials, Inc.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Grant
Method for reticle inspection using aerial imaging
- Patent number 6,268,093
- Issue date Jul 31, 2001
- Applied Materials, Inc.
- Boaz Kenan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical inspection method and apparatus
- Patent number 6,175,645
- Issue date Jan 16, 2001
- Applied Materials, Inc.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method and apparatus
- Patent number 5,892,579
- Issue date Apr 6, 1999
- Orbot Instruments Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EM ENERGY APPLICATION FOR TREATING EXHAUST GASES
- Publication number 20150300226
- Publication date Oct 22, 2015
- Goji Ltd.
- Shlomo Ben-Haim
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MACHINE READABLE ELEMENT AND OPTICAL INDICIUM FOR AUTHENTICATING AN...
- Publication number 20130334214
- Publication date Dec 19, 2013
- Itzhak Yogev
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH THROUGHPUT MULTI BEAM DETECTION SYSTEM AND METHOD
- Publication number 20080144017
- Publication date Jun 19, 2008
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT MULTI BEAM DETECTION SYSTEM AND METHOD
- Publication number 20080142689
- Publication date Jun 19, 2008
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
High throughput multi beam detection system and method
- Publication number 20070228274
- Publication date Oct 4, 2007
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
Multiple optical head inspection system and a method for imaging an...
- Publication number 20070222978
- Publication date Sep 27, 2007
- Applied Materials Israel Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
High Throughput Inspection System and a Method for Generating Trans...
- Publication number 20060221331
- Publication date Oct 5, 2006
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
Inspection system and a method for aerial reticle inspection
- Publication number 20060114453
- Publication date Jun 1, 2006
- Applied Materials Israel Ltd.
- Alex Goldenshtein
- G01 - MEASURING TESTING
Information Patent Application
High throughput multi beam detection system and method
- Publication number 20060023205
- Publication date Feb 2, 2006
- Applied Materials Israel Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
High throughput inspection system and method for generating transmi...
- Publication number 20050270521
- Publication date Dec 8, 2005
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
Double inspection of reticle or wafer
- Publication number 20050018899
- Publication date Jan 27, 2005
- Applied Materials Israel Ltd.
- Emanuel Elyasaf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for article inspection including speckle reduc...
- Publication number 20040201842
- Publication date Oct 14, 2004
- Applied Materials, Inc.
- Avner Karpol
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20040080740
- Publication date Apr 29, 2004
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20040075068
- Publication date Apr 22, 2004
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
High throughput inspection system and method for generating transmi...
- Publication number 20040027563
- Publication date Feb 12, 2004
- Applied Materials Israel Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20030179369
- Publication date Sep 25, 2003
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Method and apparatus for reticle inspection using aerial imaging
- Publication number 20010019625
- Publication date Sep 6, 2001
- Boaz Kenan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Emanuel Elyasaf

Person

Patents Grantslast 30 patents

Machine readable element and optical indicium for authenticating an...

Multiple optical head inspection system and a method for imaging an...

High throughput multi beam detection system and method

High throughput multi beam detection system and method

High throughput inspection system and a method for generating trans...

High throughput multi beam detection system and method

Inspection system and a method for aerial reticle inspection

Double inspection of reticle or wafer

High throughput multi beam system and method

High throughput inspection system and method for generating transmi...

Method and apparatus for reticle inspection using aerial imaging

Wafer defect detection system with traveling lens multi-beam scanner

High throughput inspection system and method for generating transmi...

Wafer defect detection system with traveling lens multi-beam scanner

Wafer defect detection system with traveling lens multi-beam scanner

Method and apparatus for article inspection including speckle reduc...

Method for reticle inspection using aerial imaging

Optical inspection method and apparatus

Optical inspection method and apparatus

Patents Applicationslast 30 patents

EM ENERGY APPLICATION FOR TREATING EXHAUST GASES

MACHINE READABLE ELEMENT AND OPTICAL INDICIUM FOR AUTHENTICATING AN...

HIGH THROUGHPUT MULTI BEAM DETECTION SYSTEM AND METHOD

HIGH THROUGHPUT MULTI BEAM DETECTION SYSTEM AND METHOD

High throughput multi beam detection system and method

Multiple optical head inspection system and a method for imaging an...

High Throughput Inspection System and a Method for Generating Trans...

Inspection system and a method for aerial reticle inspection

High throughput multi beam detection system and method

High throughput inspection system and method for generating transmi...

Double inspection of reticle or wafer

Method and apparatus for article inspection including speckle reduc...

Wafer defect detection system with traveling lens multi-beam scanner

Wafer defect detection system with traveling lens multi-beam scanner

High throughput inspection system and method for generating transmi...

Wafer defect detection system with traveling lens multi-beam scanner

Method and apparatus for reticle inspection using aerial imaging