Eric D. Hunt-Schroeder

Person

South Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for self-destruction of device protected by a...
- Patent number 12,210,631
- Issue date Jan 28, 2025
- MARVELL ASIA PTE. LTD.
- Eric Hunt-Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structures and methods for deriving stable physical unclonable func...
- Patent number 11,962,709
- Issue date Apr 16, 2024
- Marvell Asia Pte, Ltd.
- Eric D. Hunt-Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device with mechanism to prevent reverse engineering
- Patent number 11,928,248
- Issue date Mar 12, 2024
- MARVELL ASIA PTE. LTD.
- Eric Hunt-Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage power switch
- Patent number 11,742,858
- Issue date Aug 29, 2023
- Marvell Asia Pte, Ltd.
- Eric D. Hunt-Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cascaded sensing circuits for detecting and monitoring cracks in an...
- Patent number 11,693,048
- Issue date Jul 4, 2023
- GLOBALFOUNDRIES U.S. Inc.
- Nicholas A. Polomoff
- G01 - MEASURING TESTING
Information Patent Grant
In-memory computing using a static random-access memory (SRAM)
- Patent number 11,430,505
- Issue date Aug 30, 2022
- Marvell Asia Pte, Ltd.
- Akhilesh Patil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage power switch
- Patent number 11,418,195
- Issue date Aug 16, 2022
- Marvell Asia Pte, Ltd.
- Eric D. Hunt-Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Customer-transparent logic redundancy for improved yield
- Patent number 11,293,980
- Issue date Apr 5, 2022
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Cascaded sensing circuits for detecting and monitoring cracks in an...
- Patent number 11,215,661
- Issue date Jan 4, 2022
- GLOBALFOUNDRIES U.S. INC.
- Nicholas A. Polomoff
- G01 - MEASURING TESTING
Information Patent Grant
High-density high-bandwidth static random access memory (SRAM) with...
- Patent number 11,114,155
- Issue date Sep 7, 2021
- Marvell Asia Pte, Ltd.
- Igor Arsovski
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip parameter generation system with an integrated calibration...
- Patent number 11,112,811
- Issue date Sep 7, 2021
- Marvell Asia Pte, Ltd.
- Eric Hunt-Schroeder
- G11 - INFORMATION STORAGE
Information Patent Grant
Crack detecting and monitoring system for an integrated circuit
- Patent number 11,105,846
- Issue date Aug 31, 2021
- GLOBALFOUNDRIES U.S. INC.
- Nicholas A. Polomoff
- G01 - MEASURING TESTING
Information Patent Grant
Sensing circuits for charge trap transistors
- Patent number 11,101,010
- Issue date Aug 24, 2021
- Marvell Asia Pte, Ltd.
- Eric D. Hunt-Schroeder
- G11 - INFORMATION STORAGE
Information Patent Grant
Charge pump circuit with internal pre-charge configuration
- Patent number 10,971,996
- Issue date Apr 6, 2021
- Marvell Asia Pte., Ltd.
- Eric D. Hunt-Schroeder
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Customer-transparent logic redundancy for improved yield
- Patent number 10,955,474
- Issue date Mar 23, 2021
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Zero test time memory using background built-in self-test
- Patent number 10,839,931
- Issue date Nov 17, 2020
- Marvell Asia Pte, Ltd.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sequential read mode static random access memory (SRAM)
- Patent number 10,796,750
- Issue date Oct 6, 2020
- GLOBALFOUNDRIES Inc.
- Igor Arsovski
- G11 - INFORMATION STORAGE
Information Patent Grant
IC structure with interdigitated conductive elements between metal...
- Patent number 10,770,407
- Issue date Sep 8, 2020
- GLOBALFOUNDRIES Inc.
- Zhuojie Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-low voltage level shifter
- Patent number 10,707,845
- Issue date Jul 7, 2020
- Marvell International Ltd.
- Eric D. Hunt-Schroeder
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Charge pump circuit with built-in-retry
- Patent number 10,673,321
- Issue date Jun 2, 2020
- Marvell Asia Pte., Ltd.
- Eric Hunt-Schroeder
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Customer-transparent logic redundancy for improved yield
- Patent number 10,551,436
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Latching current sensing amplifier for memory array
- Patent number 10,535,379
- Issue date Jan 14, 2020
- GLOBALFOUNDRIES Inc.
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array including distributed reference cells for current sensing
- Patent number 10,446,239
- Issue date Oct 15, 2019
- GLOBALFOUNDRIES Inc.
- John A. Fifield
- G11 - INFORMATION STORAGE
Information Patent Grant
Zero test time memory using background built-in self-test
- Patent number 10,438,678
- Issue date Oct 8, 2019
- GLOBALFOUNDRIES Inc.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip reliability monitor and method
- Patent number 10,429,434
- Issue date Oct 1, 2019
- GLOBALFOUNDRIES Inc.
- John A. Fifield
- G01 - MEASURING TESTING
Information Patent Grant
Margin test for multiple-time programmable memory (MTPM) with split...
- Patent number 10,395,752
- Issue date Aug 27, 2019
- GLOBALFOUNDRIES Inc.
- John A. Fifield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip calibration circuit and method with half-step resolution
- Patent number 10,382,049
- Issue date Aug 13, 2019
- GLOBALFOUNDARIES INC.
- Eric Hunt-Schroeder
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Differential voltage generator
- Patent number 10,192,590
- Issue date Jan 29, 2019
- GLOBALFOUNDRIES Inc.
- John A. Fifield
- G05 - CONTROLLING REGULATING
Information Patent Grant
Circuit and method for detecting time dependent dielectric breakdow...
- Patent number 10,163,526
- Issue date Dec 25, 2018
- GLOBALFOUNDRIES Inc.
- John A. Fifield
- G11 - INFORMATION STORAGE
Information Patent Grant
Parallel programming of one time programmable memory array for redu...
- Patent number 10,062,445
- Issue date Aug 28, 2018
- GLOBALFOUNDRIES Inc.
- Eric D. Hunt-Schroeder
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CASCADED SENSING CIRCUITS FOR DETECTING AND MONITORING CRACKS IN AN...
- Publication number 20220057445
- Publication date Feb 24, 2022
- GLOBALFOUNDRIES U.S. Inc.
- Nicholas A. Polomoff
- G01 - MEASURING TESTING
Information Patent Application
CASCADED SENSING CIRCUITS FOR DETECTING AND MONITORING CRACKS IN AN...
- Publication number 20210356514
- Publication date Nov 18, 2021
- GLOBALFOUNDRIES U.S. Inc.
- Nicholas A. Polomoff
- G01 - MEASURING TESTING
Information Patent Application
IN-MEMORY COMPUTING USING A STATIC RANDOM-ACCESS MEMORY (SRAM)
- Publication number 20210327495
- Publication date Oct 21, 2021
- Marvell Asia Pte, Ltd.
- Akhilesh PATIL
- G11 - INFORMATION STORAGE
Information Patent Application
ON-CHIP PARAMETER GENERATION SYSTEM WITH AN INTEGRATED CALIBRATION...
- Publication number 20210223809
- Publication date Jul 22, 2021
- Marvell International Ltd.
- Eric Hunt-Schroeder
- G11 - INFORMATION STORAGE
Information Patent Application
CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD
- Publication number 20210116498
- Publication date Apr 22, 2021
- International Business Machines Corporation
- Igor ARSOVSKI
- G01 - MEASURING TESTING
Information Patent Application
SENSING CIRCUITS FOR CHARGE TRAP TRANSISTORS
- Publication number 20210082532
- Publication date Mar 18, 2021
- GLOBALFOUNDRIES INC.
- Eric D. HUNT-SCHROEDER
- G11 - INFORMATION STORAGE
Information Patent Application
CHARGE PUMP CIRCUIT WITH INTERNAL PRE-CHARGE CONFIGURATION
- Publication number 20200295653
- Publication date Sep 17, 2020
- Marvell Asia Pte., Ltd.
- Eric D. HUNT-SCHROEDER
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
HIGH-DENSITY HIGH-BANDWIDTH STATIC RANDOM ACCESS MEMORY (SRAM) WITH...
- Publication number 20200243130
- Publication date Jul 30, 2020
- Marvell International Ltd.
- Igor ARSOVSKI
- G11 - INFORMATION STORAGE
Information Patent Application
IC STRUCTURE WITH INTERDIGITATED CONDUCTIVE ELEMENTS BETWEEN METAL...
- Publication number 20200219826
- Publication date Jul 9, 2020
- GLOBALFOUNDRIES INC.
- Zhuojie Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-LOW VOLTAGE LEVEL SHIFTER
- Publication number 20200153418
- Publication date May 14, 2020
- Marvell International Ltd.
- Eric D. HUNT-SCHROEDER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD
- Publication number 20200072902
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Igor ARSOVSKI
- G01 - MEASURING TESTING
Information Patent Application
SEQUENTIAL READ MODE STATIC RANDOM ACCESS MEMORY (SRAM)
- Publication number 20200020388
- Publication date Jan 16, 2020
- GLOBALFOUNDRIES INC.
- Igor Arsovski
- G11 - INFORMATION STORAGE
Information Patent Application
ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST
- Publication number 20190348137
- Publication date Nov 14, 2019
- GLOBALFOUNDRIES INC.
- Igor ARSOVSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-CHIP RELIABILITY MONITOR AND METHOD
- Publication number 20190265293
- Publication date Aug 29, 2019
- John A. Fifield
- G01 - MEASURING TESTING
Information Patent Application
CHARGE PUMP CIRCUIT WITH BUILT-IN RETRY
- Publication number 20190165669
- Publication date May 30, 2019
- GLOBALFOUNDRIES INC.
- Eric Hunt-Schroeder
- G05 - CONTROLLING REGULATING
Information Patent Application
MARGIN TEST FOR MULTIPLE-TIME PROGRAMMABLE MEMORY (MTPM) WITH SPLIT...
- Publication number 20190108894
- Publication date Apr 11, 2019
- GLOBALFOUNDRIES Inc.
- John A. FIFIELD
- G11 - INFORMATION STORAGE
Information Patent Application
ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST
- Publication number 20180286491
- Publication date Oct 4, 2018
- GLOBALFOUNDRIES INC.
- Igor ARSOVSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT AND METHOD FOR DETECTING TIME DEPENDENT DIELECTRIC BREAKDOW...
- Publication number 20180233216
- Publication date Aug 16, 2018
- GLOBALFOUNDRIES INC.
- John A. FIFIELD
- G11 - INFORMATION STORAGE
Information Patent Application
PARALLEL PROGRAMMING OF ONE TIME PROGRAMMABLE MEMORY ARRAY FOR REDU...
- Publication number 20180158532
- Publication date Jun 7, 2018
- GLOBALFOUNDRIES INC.
- Eric D. HUNT-SCHROEDER
- G11 - INFORMATION STORAGE
Information Patent Application
WORD LINE VOLTAGE GENERATOR FOR PROGRAMMABLE MEMORY ARRAY
- Publication number 20180075921
- Publication date Mar 15, 2018
- GLOBALFOUNDRIES INC.
- John A. FIFIELD
- G11 - INFORMATION STORAGE
Information Patent Application
CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD
- Publication number 20170370990
- Publication date Dec 28, 2017
- International Business Machines Corporation
- Igor ARSOVSKI
- G01 - MEASURING TESTING
Information Patent Application
LATCHING CURRENT SENSING AMPLIFIER FOR MEMORY ARRAY
- Publication number 20170365302
- Publication date Dec 21, 2017
- GLOBALFOUNDRIES INC.
- Darren L. ANAND
- G11 - INFORMATION STORAGE
Information Patent Application
DOUBLE BANDWIDTH ALGORITHMIC MEMORY ARRAY
- Publication number 20170315738
- Publication date Nov 2, 2017
- GLOBALFOUNDRIES INC.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STATIC RANDOM ACCESS MEMORY (SRAM) WRITE ASSIST CIRCUIT WITH IMPROV...
- Publication number 20170270999
- Publication date Sep 21, 2017
- GLOBALFOUNDRIES INC.
- Eric D. HUNT-SCHROEDER
- G11 - INFORMATION STORAGE
Information Patent Application
Application specific integrated circuit (ASIC) test screens and sel...
- Publication number 20170220727
- Publication date Aug 3, 2017
- GLOBALFOUNDRIES INC.
- Eric D. Hunt-Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENVIRONMENTALLY AWARE MOBILE COMPUTING DEVICES
- Publication number 20170208544
- Publication date Jul 20, 2017
- GLOBALFOUNDRIES INC.
- Eric D. Hunt-Schroeder
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LATCHING CURRENT SENSING AMPLIFIER FOR MEMORY ARRAY
- Publication number 20160372164
- Publication date Dec 22, 2016
- International Business Machines Corporation
- Darren L. ANAND
- G11 - INFORMATION STORAGE
Information Patent Application
CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD
- Publication number 20160131706
- Publication date May 12, 2016
- International Business Machines Corporation
- Igor ARSOVSKI
- G01 - MEASURING TESTING

Eric D. Hunt-Schroeder

Person

Patents Grantslast 30 patents

Method and apparatus for self-destruction of device protected by a...

Structures and methods for deriving stable physical unclonable func...

Semiconductor device with mechanism to prevent reverse engineering

Voltage power switch

Cascaded sensing circuits for detecting and monitoring cracks in an...

In-memory computing using a static random-access memory (SRAM)

Voltage power switch

Customer-transparent logic redundancy for improved yield

Cascaded sensing circuits for detecting and monitoring cracks in an...

High-density high-bandwidth static random access memory (SRAM) with...

On-chip parameter generation system with an integrated calibration...

Crack detecting and monitoring system for an integrated circuit

Sensing circuits for charge trap transistors

Charge pump circuit with internal pre-charge configuration

Customer-transparent logic redundancy for improved yield

Zero test time memory using background built-in self-test

Sequential read mode static random access memory (SRAM)

IC structure with interdigitated conductive elements between metal...

Ultra-low voltage level shifter

Charge pump circuit with built-in-retry

Customer-transparent logic redundancy for improved yield

Latching current sensing amplifier for memory array

Memory array including distributed reference cells for current sensing

Zero test time memory using background built-in self-test

On-chip reliability monitor and method

Margin test for multiple-time programmable memory (MTPM) with split...

On-chip calibration circuit and method with half-step resolution

Differential voltage generator

Circuit and method for detecting time dependent dielectric breakdow...

Parallel programming of one time programmable memory array for redu...

Patents Applicationslast 30 patents

CASCADED SENSING CIRCUITS FOR DETECTING AND MONITORING CRACKS IN AN...

CASCADED SENSING CIRCUITS FOR DETECTING AND MONITORING CRACKS IN AN...

IN-MEMORY COMPUTING USING A STATIC RANDOM-ACCESS MEMORY (SRAM)

ON-CHIP PARAMETER GENERATION SYSTEM WITH AN INTEGRATED CALIBRATION...

CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD

SENSING CIRCUITS FOR CHARGE TRAP TRANSISTORS

CHARGE PUMP CIRCUIT WITH INTERNAL PRE-CHARGE CONFIGURATION

HIGH-DENSITY HIGH-BANDWIDTH STATIC RANDOM ACCESS MEMORY (SRAM) WITH...

IC STRUCTURE WITH INTERDIGITATED CONDUCTIVE ELEMENTS BETWEEN METAL...

ULTRA-LOW VOLTAGE LEVEL SHIFTER

CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD

SEQUENTIAL READ MODE STATIC RANDOM ACCESS MEMORY (SRAM)

ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST

ON-CHIP RELIABILITY MONITOR AND METHOD

CHARGE PUMP CIRCUIT WITH BUILT-IN RETRY

MARGIN TEST FOR MULTIPLE-TIME PROGRAMMABLE MEMORY (MTPM) WITH SPLIT...

ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST

CIRCUIT AND METHOD FOR DETECTING TIME DEPENDENT DIELECTRIC BREAKDOW...

PARALLEL PROGRAMMING OF ONE TIME PROGRAMMABLE MEMORY ARRAY FOR REDU...

WORD LINE VOLTAGE GENERATOR FOR PROGRAMMABLE MEMORY ARRAY

CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD

LATCHING CURRENT SENSING AMPLIFIER FOR MEMORY ARRAY

DOUBLE BANDWIDTH ALGORITHMIC MEMORY ARRAY

STATIC RANDOM ACCESS MEMORY (SRAM) WRITE ASSIST CIRCUIT WITH IMPROV...

Application specific integrated circuit (ASIC) test screens and sel...

ENVIRONMENTALLY AWARE MOBILE COMPUTING DEVICES

LATCHING CURRENT SENSING AMPLIFIER FOR MEMORY ARRAY

CUSTOMER-TRANSPARENT LOGIC REDUNDANCY FOR IMPROVED YIELD