Eric L. Bogatin

Follow

Person

Olathe, KS, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe array wafer
- Patent number 7,498,826
- Issue date Mar 3, 2009
- Interconnect Devices, Inc.
- Eric L. Bogatin
- G01 - MEASURING TESTING
Information Patent Grant
Electro ceramic components
- Patent number 7,049,670
- Issue date May 23, 2006
- Glimmerglass Networks, Inc.
- Bryan P. Staker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing electro ceramic components
- Patent number 6,764,881
- Issue date Jul 20, 2004
- Glimmerglass Networks, Inc.
- Bryan P. Staker
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Probe array wafer
- Publication number 20080068034
- Publication date Mar 20, 2008
- Eric L. Bogatin
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing electro ceramic components
- Publication number 20030022424
- Publication date Jan 30, 2003
- GlimmerGlass Networks, Inc.
- Bryan P. Staker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Electro ceramic components
- Publication number 20030022423
- Publication date Jan 30, 2003
- Bryan P. Staker
- B81 - MICRO-STRUCTURAL TECHNOLOGY