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Eric S. Johnstone
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Redwood City, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Littrow interferometer
Patent number
7,440,113
Issue date
Oct 21, 2008
Agilent Technologies, Inc.
William R Trutna, Jr.
G01 - MEASURING TESTING
Information
Patent Grant
Active control and detection of two nearly orthogonal polarizations...
Patent number
7,362,445
Issue date
Apr 22, 2008
Agilent Technologies, Inc.
Joanne Y. Law
G01 - MEASURING TESTING
Information
Patent Grant
Polarization controller using spatial filtering
Patent number
7,076,121
Issue date
Jul 11, 2006
Agilent Technologies, Inc.
Joanne Y. Law
G01 - MEASURING TESTING
Information
Patent Grant
Active control of two orthogonal polarizations for heterodyne beam...
Patent number
7,009,709
Issue date
Mar 7, 2006
Agilent Technologies, Inc.
Joanne Y. Law
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne beam delivery with active control of two orthogonal pola...
Patent number
6,961,130
Issue date
Nov 1, 2005
Agilent Technologies, Inc.
Joanne Y. Law
G01 - MEASURING TESTING
Information
Patent Grant
Active control of two orthogonal polarizations for heterodyne inter...
Patent number
6,961,129
Issue date
Nov 1, 2005
Agilent Technologies, Inc.
Joanne Y. Law
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer using beam re-tracing to eliminate beam walk-off
Patent number
6,897,962
Issue date
May 24, 2005
Agilent Technologies, Inc.
Eric S. Johnstone
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
State Space System Simulator Utilizing Bi-quadratic Blocks to Simul...
Publication number
20150006133
Publication date
Jan 1, 2015
AGILENT TECHNOLOGIES, INC.
Daniel Y. Abramovitch
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Littrow interferometer
Publication number
20070146722
Publication date
Jun 28, 2007
William R. Trutna
G01 - MEASURING TESTING
Information
Patent Application
Active control and detection of two nearly orthogonal polarizations...
Publication number
20060285119
Publication date
Dec 21, 2006
Joanne Y. Law
G01 - MEASURING TESTING
Information
Patent Application
Discrete quarter wave plates for displacement measuring interferome...
Publication number
20060244971
Publication date
Nov 2, 2006
Robert Todd Belt
G01 - MEASURING TESTING
Information
Patent Application
Active control of two orthogonal polarizations for heterodyne beam...
Publication number
20050185190
Publication date
Aug 25, 2005
Joanne Y. Law
G02 - OPTICS
Information
Patent Application
Polarization controller using spatial filtering
Publication number
20050031245
Publication date
Feb 10, 2005
Joanne Y. Law
G02 - OPTICS
Information
Patent Application
Heterodyne beam delivery with active control of two orthogonal pola...
Publication number
20040227943
Publication date
Nov 18, 2004
Joanne Y. Law
G01 - MEASURING TESTING
Information
Patent Application
Active control of two orthogonal polarizations for heterodyne inter...
Publication number
20040227942
Publication date
Nov 18, 2004
Joanne Y. Law
G01 - MEASURING TESTING
Information
Patent Application
Interferometer using beam re-tracing to eliminate beam walk-off
Publication number
20030197869
Publication date
Oct 23, 2003
Eric S. Johnstone
G01 - MEASURING TESTING