Erik Cho Houge

Person

Orlando, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Monitoring and control of a fabrication process
- Patent number 7,972,440
- Issue date Jul 5, 2011
- Agere Systems Inc.
- Erik C. Houge
- B24 - GRINDING POLISHING
Information Patent Grant
Crystallographic metrology and process control
- Patent number 7,342,225
- Issue date Mar 11, 2008
- Agere Systems, INC
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mechanical polishing of dual orientation polycrystalline m...
- Patent number 6,899,596
- Issue date May 31, 2005
- Agere Systems, INC
- Michael Antonell
- B24 - GRINDING POLISHING
Information Patent Grant
Method for detecting defects in a material and a system for accompl...
- Patent number 6,870,950
- Issue date Mar 22, 2005
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for scanning a crystalline sample and associated methods
- Patent number 6,825,467
- Issue date Nov 30, 2004
- Agere Systems, INC
- Jennifer Lynn Drown
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detection of chemical mechanical planariza...
- Patent number 6,783,426
- Issue date Aug 31, 2004
- Agere Systems, INC
- Jennifer Lynne Drown
- B24 - GRINDING POLISHING
Information Patent Grant
Calibration standard for high resolution electron microscopy
- Patent number 6,750,447
- Issue date Jun 15, 2004
- Agere Systems, INC
- Erik Cho Houge
- G01 - MEASURING TESTING
Information Patent Grant
Probe having a microstylet
- Patent number 6,727,720
- Issue date Apr 27, 2004
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor manufacturing using modular substrates
- Patent number 6,713,409
- Issue date Mar 30, 2004
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three dimensional reconstruction metrology
- Patent number 6,714,892
- Issue date Mar 30, 2004
- Agere Systems, INC
- Erik Cho Houge
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Abnormal photoresist line/space profile detection through signal pr...
- Patent number 6,708,574
- Issue date Mar 23, 2004
- Agere Systems, INC
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for minimizing semiconductor wafer contamination
- Patent number 6,695,572
- Issue date Feb 24, 2004
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control using three dimensional reconstruction metrology
- Patent number 6,651,226
- Issue date Nov 18, 2003
- Agere Systems, INC
- Erik Cho Houge
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Control of semiconductor processing
- Patent number 6,641,746
- Issue date Nov 4, 2003
- Agere Systems, INC
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer particle counter
- Patent number 6,633,032
- Issue date Oct 14, 2003
- Agere Systems Inc.
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of focused ion beam pattern transfer using a smart dynamic t...
- Patent number 6,627,885
- Issue date Sep 30, 2003
- Agere Systems Inc.
- John M. McIntosh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical structures and methods for x-ray applications
- Patent number 6,625,250
- Issue date Sep 23, 2003
- Agere Systems Inc.
- Erik Cho Houge
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray system
- Patent number 6,606,371
- Issue date Aug 12, 2003
- Agere Systems Inc.
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of determining a crystallographic quality of a material loca...
- Patent number 6,577,970
- Issue date Jun 10, 2003
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system for determining progress in a fabrication activity
- Patent number 6,569,690
- Issue date May 27, 2003
- Agere Systems Guardian Corp.
- Erik Cho Houge
- B24 - GRINDING POLISHING
Information Patent Grant
Modular semiconductor substrates
- Patent number 6,534,851
- Issue date Mar 18, 2003
- Agere Systems, INC
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe tip locator having improved marker arrangement for reduced bi...
- Patent number 6,425,189
- Issue date Jul 30, 2002
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for scanning probe microscopy and related methods
- Patent number 6,405,584
- Issue date Jun 18, 2002
- Agere Systems Guardian Corp.
- Jeffrey Bruce Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of sectioning of photoresist for shape evaluation
- Patent number 6,265,235
- Issue date Jul 24, 2001
- Lucent Technologies, Inc.
- John M. McIntosh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of mapping a surface using a probe for stylus nanoprofilomet...
- Patent number 6,250,143
- Issue date Jun 26, 2001
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Crystallographic metrology and process control
- Publication number 20060231752
- Publication date Oct 19, 2006
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Monitoring and control of a fabrication process
- Publication number 20060048697
- Publication date Mar 9, 2006
- Erik C Houge
- B24 - GRINDING POLISHING
Information Patent Application
Apparatus for scanning a crystalline sample and associated methods
- Publication number 20030234359
- Publication date Dec 25, 2003
- Jennifer Lynn Drown
- G01 - MEASURING TESTING
Information Patent Application
ABNORMAL PHOTORESIST LINE/SPACE PROFILE DETECTION THROUGH SIGNAL PR...
- Publication number 20030219916
- Publication date Nov 27, 2003
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for detection of chemical mechanical planariza...
- Publication number 20030194945
- Publication date Oct 16, 2003
- Jennifer Lynne Drown
- B24 - GRINDING POLISHING
Information Patent Application
Calibration standard for high resolution electron microscopy
- Publication number 20030193022
- Publication date Oct 16, 2003
- Erik Cho Houge
- G01 - MEASURING TESTING
Information Patent Application
Patterned implant metrology
- Publication number 20030184769
- Publication date Oct 2, 2003
- Erik Cho Houge
- G01 - MEASURING TESTING
Information Patent Application
Chemical mechanical polishing of dual orientation polycrystalline m...
- Publication number 20030162481
- Publication date Aug 28, 2003
- Michael Antonell
- B24 - GRINDING POLISHING
Information Patent Application
OPTICAL STRUCTURES AND METHODS FOR X-RAY APPLICATIONS
- Publication number 20030142786
- Publication date Jul 31, 2003
- Erik Cho Houge
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Semiconductor manufacturing using modular substrates
- Publication number 20030107117
- Publication date Jun 12, 2003
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Control of semiconductor processing
- Publication number 20030062339
- Publication date Apr 3, 2003
- Erik Cho Houge
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for minimizing semiconductor wafer contamination
- Publication number 20030063967
- Publication date Apr 3, 2003
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe having a microstylet and method of manufacturing the same
- Publication number 20030042922
- Publication date Mar 6, 2003
- Erik C. Houge
- B82 - NANO-TECHNOLOGY
Information Patent Application
Process control using three dimensional reconstruction metrology
- Publication number 20020170021
- Publication date Nov 14, 2002
- Erik Cho Houge
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Three dimensional reconstruction metrology
- Publication number 20020156594
- Publication date Oct 24, 2002
- Erik Cho Houge
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Laboratory specimen sampler with integrated specimen mount
- Publication number 20020150509
- Publication date Oct 17, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Method for detecting defects in a material and a system for accompl...
- Publication number 20020131631
- Publication date Sep 19, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Method of determining a crystallographic quality of a material loca...
- Publication number 20020128789
- Publication date Sep 12, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometer particle counter
- Publication number 20020063201
- Publication date May 30, 2002
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING THE SHAPE OF A PROBE FOR A STYLUS PROFILOMETER
- Publication number 20020062572
- Publication date May 30, 2002
- Jeffrey Bruce Bindell
- G01 - MEASURING TESTING
Information Patent Application
X-ray system
- Publication number 20010043667
- Publication date Nov 22, 2001
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Erik Cho Houge

Person

Patents Grantslast 30 patents

Monitoring and control of a fabrication process

Crystallographic metrology and process control

Chemical mechanical polishing of dual orientation polycrystalline m...

Method for detecting defects in a material and a system for accompl...

Apparatus for scanning a crystalline sample and associated methods

Method and apparatus for detection of chemical mechanical planariza...

Calibration standard for high resolution electron microscopy

Probe having a microstylet

Semiconductor manufacturing using modular substrates

Three dimensional reconstruction metrology

Abnormal photoresist line/space profile detection through signal pr...

Method and apparatus for minimizing semiconductor wafer contamination

Process control using three dimensional reconstruction metrology

Control of semiconductor processing

Mass spectrometer particle counter

Method of focused ion beam pattern transfer using a smart dynamic t...

Optical structures and methods for x-ray applications

X-ray system

Method of determining a crystallographic quality of a material loca...

Monitoring system for determining progress in a fabrication activity

Modular semiconductor substrates

Probe tip locator having improved marker arrangement for reduced bi...

Probe for scanning probe microscopy and related methods

Method of sectioning of photoresist for shape evaluation

Method of mapping a surface using a probe for stylus nanoprofilomet...

Patents Applicationslast 30 patents

Crystallographic metrology and process control

Monitoring and control of a fabrication process

Apparatus for scanning a crystalline sample and associated methods

ABNORMAL PHOTORESIST LINE/SPACE PROFILE DETECTION THROUGH SIGNAL PR...

Method and apparatus for detection of chemical mechanical planariza...

Calibration standard for high resolution electron microscopy

Patterned implant metrology

Chemical mechanical polishing of dual orientation polycrystalline m...

OPTICAL STRUCTURES AND METHODS FOR X-RAY APPLICATIONS

Semiconductor manufacturing using modular substrates

Control of semiconductor processing

Method and apparatus for minimizing semiconductor wafer contamination

Probe having a microstylet and method of manufacturing the same

Process control using three dimensional reconstruction metrology

Three dimensional reconstruction metrology

Laboratory specimen sampler with integrated specimen mount

Method for detecting defects in a material and a system for accompl...

Method of determining a crystallographic quality of a material loca...

Mass spectrometer particle counter

METHOD OF DETERMINING THE SHAPE OF A PROBE FOR A STYLUS PROFILOMETER

X-ray system