Optical structures and methods for x-ray applications

Information

  • Patent Grant
  • 6625250
  • Patent Number
    6,625,250
  • Date Filed
    Tuesday, December 19, 2000
    24 years ago
  • Date Issued
    Tuesday, September 23, 2003
    21 years ago
Abstract
A reflective lens with at least one curved surface formed of polycrystalline material. In an example embodiment a lens structure includes a substrate having a surface of predetermined curvature and a film formed along a surface of the substrate with multiple individual members each having at least one similar orientation relative to the portion of the substrate surface adjacent the member such that collectively the members provide predictable angles for diffraction of x-rays generated from a common source.A system is also provided for performing an operation with x-rays. In one form of the invention the system includes a source for generating the x-rays and a polycrystalline surface region having crystal spacings suitable for reflecting a plurality of x-rays at the same Bragg angle along the region and transmitting the reflected x-rays to a reference position. An associated method includes providing x-rays to a polycrystalline surface region having crystal spacings suitable for reflecting a plurality of x-rays at the same Bragg angle along the region, transmitting the reflected x-rays to a reference position; and positioning a sample between the surface region and the reference position so that x-rays are transmitted through the sample.
Description




FIELD OF THE INVENTION




The present invention relates generally to X-ray focusing and, more particularly, to reflective lenses and systems which convert X rays from divergent sources into parallel or convergent radiation for a variety of applications.




BACKGROUND




Translation of X-rays from divergent sources into parallel beams and converging rays is subject to well-known limitations relating to Bragg diffraction theory. Focusing optics for x-rays have been based on Johann or Johansson methods applied to curved monolithic crystals. See, for example, Advances in X-Ray Spectroscopy, Eds. C. Bonnelle and C. Mande (Oxford, U.K., 1982). More recently, it has been shown that x-ray diffractors with doubly curved crystals can provide relatively greater throughput. For example, a spherical diffractor with a stepped surface has been designed at constant height conditions to provide a significantly greater solid angle aperture than achievable with a spherically curved crystal. See Witry et al., “Properties of curved x-ray diffractors with stepped surfaces”, J. Appl. Phys., 69, pp.3886-3892, (1991) which discusses problems associated with practical manufacture of high-efficiency x-ray diffractors.




A diffractor may also be formed with a few pseudo-spherical curved dispersive elements. See Marcelli et al. “Multistepped x-ray crystal diffractor based on a pseudo-spherical geometry”, SPIE Vol. 3448, July 1998. See, also, Mazuritsky et al. “A new stepped spherical x-ray diffractor for microbe analysis”, SPIE Vol. 3449, July 1998. Even with these advances, formation of satisfactory lens systems for x-ray optics has been limited by the size of practical crystal surfaces and the extent to which such surfaces can be conformed to a desired curvature.




Consequently, x-ray optics have so far only provided as throughput a relatively small portion of the energy available from x-ray sources. This has rendered systems applications relatively large and inefficient. If larger amounts of x-ray energy could be transformed into parallel or convergent radiation, many potential applications of x-ray energy would become commercial realities. For example, with higher efficiencies, x-ray systems could become more portable and therefore more mobile.




SUMMARY OF THE INVENTION




In one form of the invention a reflective lens is provided with at least one curved surface formed of polycrystalline material. In an example embodiment a lens structure includes a substrate having a surface of predetermined curvature and a film formed along a surface of the substrate with multiple individual members each having at least one similar orientation relative to the portion of the substrate surface adjacent the member such that collectively the members provide predictable angles for diffraction of x-rays generated from a common source. In another embodiment a lens structure is formed with a polycrystalline film formed along a surface and having a curved plane fiber texture orientation.




In another embodiment of the invention a Bragg reflecting surface is formed by providing a substrate having a surface of predetermined curvature and forming a polycrystalline layer over the surface with the majority of individual crystalline grains having a common orientation with respect to the underlying substrate surface.




In still another embodiment of the invention a device for translating x-rays includes a polycrystalline surface region having crystal spacings suitable for reflecting a plurality of x-rays at the same Bragg angle along the region and transmitting the reflected x-rays to a reference position.




A system is also provided for performing an operation with x-rays. In one form of the invention the system includes a source for generating the x-rays and a polycrystalline surface region having crystal spacings suitable for reflecting a plurality of x-rays at the same Bragg angle along the region and transmitting the reflected x-rays to a reference position. An associated method includes providing x-rays to a polycrystalline surface region having crystal spacings suitable for reflecting a plurality of x-rays at the same Bragg angle along the region and transmitting the reflected x-rays to a reference position and positioning a sample between the surface region and the reference position so that x-rays are transmitted through the sample. In another embodiment the method includes providing x-rays to a polycrystalline surface region having crystal spacings suitable for reflecting a plurality of x-rays at the same Bragg angle along the region and transmitting the reflected x-rays to a reference position and positioning a sample at the reference position so that x-rays strike the sample.











BRIEF DESCRIPTION OF THE DRAWINGS




The invention is best understood from the following detailed description when read in conjunction with the accompanying figures, wherein:





FIGS. 1-13

illustrate numerous reflective lens surfaces according to the invention; and





FIGS. 14-21

illustrate systems constructed according to the invention.




Like numbers denote like elements throughout the figures and text. The features described in the figures are not drawn to scale.











DETAILED DESCRIPTION




Exemplary surface designs are illustrated in

FIGS. 1 through 13

for constructing a variety of optical systems suitable for converting x-rays into parallel or converging radiation. As used herein the term parallel means substantially parallel, including degrees of parallelism satisfactory for performing the functions of systems described herein. According to the invention, polycrystalline material is formed to define a curved surface, a portion of which is positioned to reflect x-rays at or near the Bragg angle. To achieve necessary conditions for Bragg reflection many of the individual grains in the polycrystalline material exhibit a common crystal orientation.




Conventionally, a fiber texture orientation in such a polycrystalline material is understood to mean that the crystallographic direction [uvw] in most of the grains is parallel or nearly parallel to the wire axis. Fiber orientation is a measure of the degree that all of the crystalline units are oriented with a certain crystal plane normal to a reference direction. This is referred to herein as normal plane textural fiber orientation, which is to be distinguished from curvature plane texture orientation, as defined below. It is now recognized that the preferred orientation of some polycrystalline films in fiber textures, with the primary x-ray reflector normal to the surface, creates the ability to make a polycrystalline lens system which both collimates or focuses an x-ray beam to a spot below the lens itself.




Deposition of certain polycrystalline films in fiber textures with their primary x-ray reflector plane normal to a reference surface provides an ability to realize Bragg reflection along a curved surface. Information from the ICDD (International Centre for Diffraction Data) database indicates that Aluminum (Al) crystallizes in a face centered cubic structure in the Fm3m(225) space group. The cell is=4.0494 with a z of 4. The primary low order reflections are the (111), (200), (220) and (311). Additional crystallographic data is available from the PDF (powder diffraction file) card. Aluminum, when exposed to copper K-alpha radiation, has specific reflections according to the Bragg condition for reflection:




λ=2 d sin θ, where




λ=reflection wavelength




d=interatomic plane spacing




θ=glancing incidence angle




This condition results in the following reflections and their associated relative

























#




d(A)




l(f)




h




k




l




2-Theta







































1




2.3380




100 




1




1




1




38.472














2




2.0240




47




2




0




0




44.738







3




1.4310




22




2




2




0




65.133







4




1.2210




24




3




1




1




78.227







5




1.1690




 7




2




2




2




82.436







6




1.0124




 2




4




0




0




99.078







7




0.9289




 8




3




3




1




112.041







8




0.9055




 8




4




2




0




116.569







9




0.8266




 8




4




2




2




137.455














intensities l(f):




As can be seen in the table, Aluminum's strongest reflection is in the <111> direction. This orientation has then a 2-theta Angle of approximately 38.472 degrees. Aluminum is used here as an example, while this effect can also be seen in other materials which exhibit similar orientation properties normal to the sample surface.




An inverse pole figure map was constructed for Aluminum deposited onto a titanium nitride surface by chemical vapor deposition. The map allowed color shading corresponding to the automatic tiling of the unit triangle of the inverse pole figure. For this Orientation Imaging Microscope scan of aluminum, the color red was assigned to the [001] crystal direction, the color blue was assigned to blue to [111] and the color green was assigned to [101]. A particular point was then shaded in the OIM scan according to the alignment of these three directions in the crystal to the [001] direction (normal to the surface of the wafer). For the Aluminum sample the entire inverse pole figure was a shade of blue, indicating a texture whereby the [111] crystal direction is aligned with the normal direction of the surface. The fiber texture of aluminum was shown to be almost entirely on axis.




An intensity pole figure plot of the aluminum sample for the 100, 110 and 111 directions confirmed a strong fiber texture in the [111] crystal direction of approximately 2500 times random at the center of the strongest rotational reflection on the pole plot.




With this application of polycrystalline materials on curved surfaces, the invention is understood in the context of curved plane texture orientation which is now defined to mean that the polycrystalline film is such that the individual members in the film have a plane that is oriented at a certain angle with respect to an adjacent portion of the curved substrate surface. Therefore the texture orientation is with respect to the adjacent surface and not necessarily the same as that of other members which comprise the polycrystalline film. Further, curved plane fiber texture orientation is understood to mean that the crystallographic direction [uvw] in most of the grains is parallel or nearly parallel to the wire axis. Given that aluminum deposits along its strongest x-ray reflector plane in a position normal to the substrate surface, a three dimensional lens structure may be designed to provide a focal point below the lens (as needed for projection lithography) by solving the Bragg equation for multiple paths of reflections along the three dimensional lens surface.




Once this three dimensional solution is found in space, glass (a good thermal conductor with good expansion properties) can be machined to the exact angular specifications of the lens structures and then the aluminum surface deposited on top of the glass will act as the Bragg reflector for the incident x-rays. The benefit of glass as the substrate is that, as an amorphous material, all x-rays of sufficient energy to migrate through the aluminum layer will become scattered internally to the amorphous glass atomic structure. Furthermore due to the initial conditions of a divergent x-ray source (such as by using an x-ray tube as the source) that is not delimited, e.g., by a slit, a much greater portion of the overall x-ray intensity can be used with a design that incorporates one or multiple sealed tubes or rotating anode x-ray sources.




According to the invention the design of the lens structure is a three dimensional solution to the Bragg equation for the polycrystalline reflector overlaying the glass. This could form a singular lens system or a dual lens system.




An optical system


10


for imaging with x-rays emitted from a divergent source


12


upon an ideal focal point


14


is shown in FIG.


1


. The system includes a lens surface


18


which may be formed of one continuous reflective surface, or of multiple surface elements, positioned to reflect radiation impinging various regions along the surface


18


at the Bragg angle.

FIG. 2

illustrates, as one example of the lens component, a full barrel-shaped surface


20


, in contrast to a spaced-apart two-component surface which would exhibit inherently less throughput. With the source


12


and focal point


14


symmetrically positioned about the surface


20


, a Bragg region


22


of width W along the surface


20


provides reflection of incident x-rays


24


to the focal point


14


. In addition, rays


26


incident upon portions of the surface


20


near but outside the Bragg region will result in reflection of radiation within a useful focal region


28


about the focal point


14


. A spaced-apart two component lens surface


32


is illustrated in FIG.


3


. As described for the full barren surface


20


of

FIG. 2

, the two component surface


32


includes a Bragg region


34


of width W from which x-rays emanating from the source


12


are reflected to the focal point


14


. The surface


32


also includes surface portions near but outside the Bragg region which reflect x-rays to a focal region


28


near the focal point


14


. See, for example, F.




In each of the schematic illustrations of

FIGS. 1

,


2


and


3


, the source


12


and focal point


14


are ideally along an axis symmetric with the curvature of the lens surface.

FIG. 1

thus provides a cross sectional view along a symmetric plane, illustrating for either the full barren surface


20


or the two component lens surface


32


, reflection of x-rays from the Bragg region to the focal point


14


.




With reference to

FIGS. 4 and 5

, a single reflecting surface


40


, comprising a series of axially symmetric partial circles, provides a suitable means for focusing the radiation about a point along a surface plane


44


of a work piece


46


such as a substrate. For example, a semiconductor wafer may be positioned along the axis defined by the source


1


and focal point


14


so that a selected portion of the surface is irradiated by x-rays reflected from the surface


40


. This arrangement is beneficial for a variety of analyses , e.g., x-ray photo electron spectroscopy (XPS), and elemental spectroscopy for chemical analysis (ESCA), as well as treatments such as butt welding, cutting, and various forms of surface treatment (e.g., alloying, cladding, scribing hardening, glazing, cutting, etc.) The work piece


46


may be manipulated about the focal region


28


to effect sweeping of the x-rays along a pattern, this facilitating the various operations.




Cylindrical reflective surfaces may employ the described concepts to converge x-rays about a focal point or along a focal line. The dual lens system


50


of

FIG. 6

comprises a pair of cylindrical reflector surfaces


52


as described by Cosslett, et al. “Xray Microscopy, published by the Syndics of the Cambridge University Press, (1960) at page 5, which receive x-rays from a divergent source


12


and collimates the radiation about a focal point


28


, i.e., at the focal point


14


or in a limited region


28


about the focal point


28


as afore-discussed with respect to

FIGS. 1

,


2


and


3


. This lens combination facilitates reduction of optical aberrations, e.g., astigmatism.




More generally, use of a single cylindrical lens surface


52


, as shown in

FIG. 7

, enables convergence of the x-rays from the divergent source


12


along a focal line


54


. Such a line


54


may be used in a scanning application for functions such as contact printing (e.g., photolithography), radiography and numerous forms of biological analyses. See again Coslett et al., at page


3


.




In other embodiments and applications of the invention it is desirable to generate a parallel beam of x-rays, e.g., to improve resolution of images.

FIG. 8

illustrates the surface


40


of

FIG. 4

applied to generate parallel x-rays


60


from a source


12


positioned along an arc having one half the radius of curvature as the Rowland circle. That is, the Rowland circle, having a center at


62


, is one half the radius of curvature of the surface


40


and has a point which is tangent about the Bragg region. Thus, the source is placed along a circle


64


, having a center at


66


. The circle


64


includes a point


68


tangent about the corresponding Bragg region of the surface


40


, and has a radius of curvature one fourth that of the surface


40


. The reflected x-rays


60


are substantially parallel to one another, and may be expected to deviate from perfect parallelism based on, for example, possible misalignments such as orientation and height of crystal grains along the surface


40


. However, with substantially parallel x-rays the resulting beam may be scanned to perform functions such as lithography.




With reference to

FIGS. 9 and 10

, another geometric surface


70


, suitable for generating parallel x-rays, corresponds to symmetric rotation of an arc of constant radius of curvature about a vertex point


72


. The resulting axis


76


of symmetry passes through the vertex point


72


and the point


12


from which diverging radiation may emanate. X-rays from the point


12


undergo Bragg reflection about various portions of the surface


70


to create a parallel beam


80


. Such generation of parallel rays is illustrated in the three dimensional view of

FIG. 9

, while the two dimensional view of

FIG. 10

illustrates, for clarity, the same arrangement along a symmetric plane of the lens surface


70


.




It is noted that a similar effect can be achieved with multiple lens segments which, when assembled together, may comprise a sufficient portion of the geometric surface


70


as to provide satisfactory throughput. The geometric surface


70


of

FIGS. 9 and 10

provides more throughput of reflected x-rays than does the surface


40


of FIG.


8


.




Moreover, the surface


40


is useful for constructing a telescope. That is, parallel x-ray radiation, e.g., from a distant source, may impinge upon the surface


70


, undergo Bragg diffraction and converge upon or about the point


12


. Theoretically such convergence can produce an image along a focal plane passing through the point


12


. The quality of a diffraction limited image will depend, in part, on the orientation and height of adjoining crystal grains along the surface


70


.




Generally, x-ray lenses constructed with polycrystalline surfaces suitable for Bragg reflection may be constructed according to the Johannson symmetrical arrangement or the Guinier assymetrical arrangement. See Peiser, et al. published by the London Institute of Physics (1955) at page 130. Such geometries enlarge the effective area of agreement between the Rowland circle and the mirror surface. Thus, throughput at and about the focal point may be substantially increased. See, for example the reflective lens surface


100


of

FIG. 11

wherein a portion


102


of the reflective surface corresponds to the Johann geometry and an adjoining portion


104


includes a radius of curvature coincident with the Rowland circle


106


. This arrangement provides an increased surface area over which reflected x rays will traverse the same path length between the source


112


and focal point


114


. An additional requirement for maximizing the throughput of this geometry is that of maintaining reflection at the Bragg angle over the entire surface portion. That is, throughput of the lens is dependent upon establishing an orientation of the individual polycrystalline surfaces which is normal to the original Johann curvature.




While the foregoing geometries are generally difficult or impossible to achieve with a monocrystalline structure, all of the designs illustrated or contemplated can be constructed with a polycrytalline Bragg reflecting surface as aforedescribed. This includes but is not limited to the many complex shapes that are known to have desirable imaging properties but which heretofore have not been manufacturable or which have been fabricated with limited throughput. See, for example, Coslett et al. at pages 113, 114. All of the foregoing may be fabricated according to the invention by replacing conventional monocrystalline structures with polycrystalline materials formed along substrate surfaces of desired shapes. Another feature of the polycrystalline systems is that they may be scaled to a broad range of dimensions without the limitations associated with conventional crystals.




Generally, with reference to

FIG. 12

, such a polycrystalline lens


120


is fabricated by initially forming a substrate surface


122


, e.g., glass, to provide a surface


124


having curvature consistent with the Johann geometry or other complex shapes associated with differing lens designs. A polycrystalline metal film stack


124


is formed along the surface


124


. As noted herein, an exemplary material suitable for Bragg reflection is Al. Accordingly, an initial layer


128


of Ti (e.g., 37.5 nm +/−3.5 nm) is deposited, followed by a deposition of TiN layer


130


(60 nm +/−5 nm). The TiN layer


130


facilitates formation of fiber texture in the Al layer, which is deposited to a desired thickness (e.g., 450 nm or more). Alternately, amorphous metal, e.g., Al, may be formed on the layer


130


and annealed to achieve desired fiber texture. The deposition conditions are conventional. For example, the Ti may be deposited at 150 C, the TiN may be deposited at 250 C and the Al may be deposited at 300 C.




To effect a Johannson geometry, such as described for the lens surface


100


of

FIG. 11

, a layer


134


the polycrystalline material is first deposited to a desired thickness and a portion of the exposed metal surface


136


is then modified to provide desired curvature. This can be accomplished with conventional lens grinding techniques under thermally controlled conditions to minimize heating. To assure minimal heat generation the grinding may be performed at low rpm and may incorporate cooling techniques. The result will be removal of surface material without allowing substantial crystalline changes to occur, e.g., without alteration of grain structures or changes in grain orientations relative to the Johann surface. It is also noteworthy that the desired thickness of the lens design may be so great that a single deposition of the metal may not retain consistent orientation. That is, as the metal deposits, the fiber texture may transition to a more random orientation. To avoid this potential effect the film may be a stack created by repeated sequential depositions with an intervening amorphous material interposed between.




For example, after the initial layers of Ti, TiN and Al are deposited, a minimal layer


140


of silicon dioxide is deposited thereover, followed by repeated deposition of the stack comprising layers of Ti, TiN and Al. Deposition of a silicon dioxide layer


140


is repeated between subsequent metal stacks. An exemplary structure is shown in

FIG. 13

wherein like numerals reference layers of like materials as set forth in FIG.


12


. Other amporphous materials may be used as materials intervening between the metal stacks.




With a wide variety of lens designs now available for Bragg diffraction about polycrystalline surfaces (including those described in FIGS.


1


through


11


), a variety of x-ray systems may be assembled to provide useful functions. These systems applications span multiple fields of interest. Examples include mass storage, medical and non-medical use of parallel x-rays for shadow imaging of surfaces such as bones and density variations in solid media, radiation therapy, butt welding such as applicable to sheet metal fabrication, numerous analyses in the sciences of materials, molecular biology, crystallography and astronomy, lithography, x-ray lasers and laser targets, microscopy, formation of thin films, surface treatments such as formation of hardened materials or formation of thin oxide layers to inhibit corrosion of underlying material, or treatments that alter surface properties to improve mechanical properties. Other applications include application of heat treatments, alloying, surface cladding, machining, texturing, non-contact bending and plating. From the following examples methods of applying the principles set forth to these and other systems applications will be apparent.




Generally, the design of each lens structure is a three dimensional solution to the Bragg equation for the polycrystalline reflective surface


124


overlaying the substrate surface


122


. Accordingly, systems applications may be formed with a single lens or a multiple lens system. As one example, a multiple lens assembly is illustrated in the plan view of FIG.


14


and the elevation view of

FIG. 15

in a photolithographic system


150


suitable for fabrication of small geometry semiconductor products. The lens combination is designed to transmit x-rays from a divergent source


152


through two Bragg reflections toward a theoretical focal point


154


.




X-rays emitted from the source


152


are reflected by a first pair of lenses


158


and directed to a secondary lens


160


. The first lenses are proportioned to capture a large flux of the x-rays generated from the source


152


. The secondary lens


160


converges the reflected x-rays toward the focal point


154


. The secondary lens


160


has a conical-like shape. The sizes and shapes and positions of the lenses


158


and


160


are based on a theoretical solution of the Bragg equation which focuses the x-rays. Once the angles for multiple reflections are calculated, different lens shapes may be determined. As described above, the lenses are formed on a substrate material having good thermal and mechanical stability.




As illustrated in

FIG. 15

a mask


164


containing an image and a substrate


166


are placed between the lens


160


and the focal point


154


so that collimating radiation passes through the mask to project an image of reduced size on to the substrate. The shape and focusing ability of the dual lens design allows for the resolution to be well below the limits of current x-ray lithography techniques using 1× masks and eliminates the need to produce 1× masks.




With provision of a high throughput of x-rays, relative to the total flux generated from the source, relatively small x-ray sources may perform functions such as those provided with other types of optical sources such as LED lasers. Further, the ability to focus an x-ray beam enables formation of a narrow beam width capable of high-density storage such as achievable with laser read-write technology applied to optical media such as CD ROMs. Use of x-rays to read and write data also enables three-dimensional storage of information since x-rays easily pass through most media. That is, by defining multiple focal planes in a storage medium, information can be stored in stacked layers.




By way of example, x-ray optics could generate Write Once Optical Storage in a manner analogous to CD ROM technology. The storage medium may consist of an absorptive thin metal layer, e.g., tellurium (Te) formed between two protective layers of plastic or glass with an air gap to allow for the displacement of material during the write step. Another embodiment comprises multiple absorptive metallic layers separated by layers of SiO


2


similar to a thin film stack on a semiconductor.




Such a system for storing information, illustrated in

FIG. 16

, may include a circularly rotating “axis”


200


, a horizontal translation component


202


, a vertical translation component


214


, a storage disk


204


, an x-ray source


206


, focusing optics


208


and a detector


209


for sensing intensity of radiation transmitted through the disk


204


. The disk may be rotated and linearly translated in a conventional manner to progressively pass discrete data locations through the radiation transmitted from the focusing optics.




For high-density storage the translation component may displace the disk


204


along three orthogonal axes. The disk


204


will then comprise sequentially alternating


25


films of metal and insulator, each metal layer providing a level for storage of different information. In this example a Te layer


210


is alternately formed with a silicon dioxide layer


212


. The process for writing information at any level of metal can be effected by providing sufficient intensity at each storage location to cause localized physical transformation which affects the intensity of transmitted x-rays during a read operation. Preferably, for a multi-layer storage disk, the radiation used to write data comes from two different sources to avoid incidental deformation of the storage medium at a different level. In a disk which stores information at only one level, a single focused source may perform the write operation at a first, relatively high intensity while the read operation may be performed at a lower intensity generated by the same source. For example, the focusing lens may be shifted to vary the flux transmitted for each of the two operations.




The x-ray source


206


may be a low-cost rotating anode x-ray source and the x-rays may be generated from molybdenum or copper.




Conventional medical x-ray imaging, e.g., to examine a bone for fractures, is based on use of divergent radiation. Commonly, a plate of film is positioned under the tissue to be examined. The distance from the tissue to the plate must be uniform and minimal to avoid fuzziness of the image caused by divergence of the x-rays. When the bone or other tissue cannot be aligned with the film to avoid effects of divergence, satisfactory imaging cannot be had. For example, it may not be possible to acquire a satisfactory image of a knee or elbow joint from desired views when, due to injury, the joint cannot be adjusted to a straight position.




In contrast, provision of parallel x-rays will overcome such artifact and assure a relatively sharp image when the joint is not positioned a uniform distance from the film plate. Of course, in the past it has been possible to reduce the amount of divergence from a traditional source by moving it far away from the limb, but this approach has the disadvantage of requiring long exposure times or relatively higher powers of radiation. Thus, any prior efforts to address this problem have been countered with both health and economic disadvantages. Further, the distances which the x-rays must travel in order to approximate parallel radiation must be substantially larger than typical room dimensions.





FIG. 17

illustrates in simple schematic form an x-ray imaging system


230


including a source


232


of parallel x-rays (corresponding to the source and lens arrangement of

FIGS. 8

,


9


, and


10


) and a photographic film plate


234


sufficiently spaced apart from the source


232


to permit a patient to interpose the body portion


236


of interest for examination. Similar arrangements can be constructed for non-medical applications.




Numerous medical applications of x-rays may be undertaken according to the invention. Radiation therapy, one of the oldest and most cost-effective cancer therapies requires that healthy tissue as well as cancerous tissue be subjected to high exposure levels. External beam radiation, perhaps the most widely used type of cancer radiation therapy, allows relatively large areas of the body to be treated and permits treatment of more than a localized area such as the main tumor and nearby lymph nodes. External beam radiation is usually given in periodic doses over several weeks.




An improved system


250


for imparting x-ray cancer radiation treatments is schematically shown in

FIG. 18

as comprising a divergent source


252


generating x-rays which are reflected from a lens structure


254


(such as the two lenses shown in FIGS.


8


-


10


), projecting substantially parallel x-rays


256


upon a desired region


258


of a patient's body, e.g., positioned on a table


260


. The source


252


and lens structure


254


are positioned in a suitable enclosure


262


from which the parallel x-rays emanate toward the table. The source


252


and lens structure


254


will vary substantially in size, depending on the application. For example, in order to examine a large portion of a person's body, the enclosure


262


may have to be of dimensions exceeding 4 m


3


. On the other hand, if examination is limited to small specimens, such as a finger or tooth, the enclosure size may be less than 1 m


3


.




According to another embodiment of the invention, internal radiation therapy, or, brachytherapy, may be performed with the High Energy Internal Spot Beam Radiation Therapy System


280


of FIG.


19


. Brachytherapy is based on interstitial radiation or intracavitary radiation. In the past, interstitial radiation has been effected by placement of the radiation source in the affected tissue in small pellets, wires, tubes, or containers. Intracavitary radiation treatment has been performed by placing a container of radioactive material in a cavity of the body. The container is placed a short distance from the affected area.




One objective of brachytherapy, delivery of a high dose of radiation within a small volume of tissue, is improved with the system


280


because the x-rays are projected from each of several sources


282


and focused via full barrel-shaped reflecting lens surfaces


284


(such as described with reference to

FIGS. 1 and 2

) about an irradiation volume


286


. The system


280


enables delivery of a high dose of radiation within the volume


286


. During operation the volume


286


includes tissue of a patient


288


undergoing treatment. Exposure of surrounding tissue is limited to tolerable, i.e., less damaging, levels.




Three sources


282


and three lens surfaces


284


are employed in the example system


280


to illustrate that a relatively high dose is created within the volume


286


while the intensity in regions outside the volume is proportionately lower than would be if all of the flux were generated from a single source. Specifically, the convergence angles based on reflection of each lens surface


284


limit the flux outside the volume


286


to low levels so as to not destroy cells, while sufficient flux is delivered within the volume


286


to perform radiation treatment.




Still another medical application of the invention may be based on one or more sources


282


and lens surfaces


284


to provide high energy and highly focused radiation in order to perform surgical procedures. Such a system may be configured as schematically described in

FIG. 19

with the lens surfaces


282


adapted to narrow the focal region to a desired volume. If multiple sources are deployed, automated adjustment and alignment of the system may be effected with detector elements coupled to a feed back system and alignment mechanism.




Operations of cutting, welding and other forms of surface treatment (e.g., hardening, modifying mechanical properties, melting, alloying , cladding, texturing, and machining) for industrial applications may be performed with the system


300


of

FIG. 20

comprising a source


302


, a barrel-shaped reflecting lens surface


304


(as described in

FIGS. 1 and 2

) configured to converge x-rays about a focal point


306


to perform an operation on a work piece


308


. Either the focal point or the work piece may be displaced to irradiate a desired area of the work piece on or within the work piece.




Alternately, and with application to low energy operations, lens surfaces such as illustrated in

FIG. 7

may be employed in lieu of the surface


304


to create a focal line to effect the surface treatment. The focal line or the work piece may be displaced to effect irradiation of a desired region on or within the work piece.




In the past x-ray photoemission spectroscopy (XPS) has been performed with unfocused x-rays, this resulting in a large beam spot. The size of the beam spot, e.g., ranging from tens of microns to millimeters in diameter, limits the spatial resolution of the technique. For XPS applications as well as other contexts in which a beam width substantially less than 10 microns is desired, converging x-rays emanating from a lens surface toward a desired focal region are passed through an aperture positioned relatively close to the focal region. Such apertures may be fabricated with focussed ion beam techniques. The exemplary XPS system


320


of

FIG. 21

illustrates a source


322


which generates x-rays for reflection at a lens surface


324


to transmit converging radiation through an aperture


326


and on to a sample


328


. The system


320


is positioned in a low pressure chamber


330


to detect emission of electrons


332


from about a focal region


334


by a collector


336


.




Other potential systems applications for the concepts described herein include x-ray microscopy and x-ray laser mirrors. Generally it should be recognized that the source and lens combination of each system should be statically fixed to one another in order to satisfy requisite tolerances for realizing optimum Bragg diffraction along the reflective surface.




The invention has been described with exemplary embodiments while the principles disclosed herein provide a basis for practicing the invention in a variety of ways. Other constructions, although not expressly described herein, do not depart from the scope of the invention which is only to be limited by the claims which follow:



Claims
  • 1. A lens structure comprising: a substrate having a surface of predetermined curvature; and a film formed along a surface of the said substrate with multiple individual members each having at least one similar orientation relative to the portion of the substrate surface adjacent the member such that collectively the members provide predictable angles for diffraction of x-rays generated from a common source.
  • 2. The lens structure of claim 1 wherein the film members each have a crystal orientation relative to an associated plane and the majority of the planes are each oriented with respect to a portion of said substrate surface adjacent the corresponding member at substantially the same angle.
  • 3. The lens structure of claim 2 wherein the film is a polycrystalline structure comprising a plurality of grains having a fiber texture normal to the curvature of the substrate surface.
  • 4. The lens of claim 1 wherein the film includes grains predominantly comprising Al with sufficient grains having a [111 ] direction normal to adjacent portions of the substrate surface such that the spatial distribution of the grains provides a fiber texture.
  • 5. A reflective lens for converging x-rays comprising at least one curved surface of polycrystalline material.
  • 6. The lens of claim 5 wherein the lens includes a reflective surface region of curvature for converging said x-rays into a beam of substantially parallel rays.
  • 7. The lens of claim 5 wherein the lens includes a reflective surface region of curvature for converging said x-rays about a focal region.
  • 8. A lens structure comprising:a polycrystalline film formed along a surface and having a curved plane fiber texture orientation-suitable to Provide parallel x-rays or suitable for focusing x-rays.
  • 9. The structure of claim 8 wherein the film comprises lattice structures suitable for Bragg reflection along a sufficient portion of the surface to focus x-rays.
  • 10. A method for transmitting x-rays to a region comprising:reflecting x-rays from a curved polycrystalline surface having a curved plane texture orientation based on Bragg diffraction.
  • 11. The method of claim 10 wherein the step of reflecting the x-rays is performed about a surface curvature which converges the x-rays.
  • 12. The method of claim 10 wherein the step of reflecting the x-rays is performed about a surface curvature which converges the x-rays into a beam of substantially parallel rays.
  • 13. The method of claim 10 wherein the step of reflecting the x-rays is performed about a surface curvature which focuses the x-rays about a point.
  • 14. A method for forming a Bragg reflecting surface comprising:providing a substrate having a surface of predetermined curvature; and forming a polycrystalline layer over the surface with the majority of individual crystalline grains having a common orientation with respect to the underlying substrate surface to provide a curved plane texture orientation of the type suitable for transforming divergent x-rays into Parallel or focusing radiation.
  • 15. A device for translating x-rays, comprising:a polycrystalline surface region having crystal spacings suitable for reflecting a plurality of x-rays at the same Bragg angle along the region and transmitting the reflected x-rays to a reference position.
RELATED APPLICATIONS

This is application is a conversion of provisional application Serial No. 60/172,654 filed Dec. 20, 1999 and incorporated herein by reference. This application is also related to Ser. No. 09/745,236 filed on even date herewith.

US Referenced Citations (9)
Number Name Date Kind
4525853 Keem et al. Jun 1985 A
4637691 Uehara et al. Jan 1987 A
4923717 Gladfelter et al. May 1990 A
5004319 Smither Apr 1991 A
5182763 Iizuka et al. Jan 1993 A
5418828 Carpenter May 1995 A
5579363 Ingal et al. Nov 1996 A
5850425 Wilkins Dec 1998 A
6051063 Tanabe et al. Apr 2000 A
Foreign Referenced Citations (4)
Number Date Country
0699776 Mar 1996 EP
63245923 Oct 1987 JP
02168149 Dec 1988 JP
5060898 Mar 1993 JP
Non-Patent Literature Citations (2)
Entry
Microtexture Measurements of Aluminum VLSI Metallization, Barr, et al, 1995, pp. 347-351.
Texture and Secondary Extinction Measurements In AL/Ti Stratified Films by X-ray Diffraction, Tomov, et al, May 1997, 497-502.
Provisional Applications (1)
Number Date Country
60/172654 Dec 1999 US