Ernest Y. Wu

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
RRAM filament spatial localization using a laser stimulation
- Patent number 11,901,002
- Issue date Feb 13, 2024
- International Business Machines Corporation
- Franco Stellari
- G11 - INFORMATION STORAGE
Information Patent Grant
Reliable resistive random access memory
- Patent number 11,489,118
- Issue date Nov 1, 2022
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
E-fuse co-processed with MIM capacitor
- Patent number 11,257,750
- Issue date Feb 22, 2022
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sub-ground rule e-Fuse structure
- Patent number 11,121,082
- Issue date Sep 14, 2021
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 11,054,459
- Issue date Jul 6, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,996,259
- Issue date May 4, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,989,754
- Issue date Apr 27, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Sub-ground rule e-Fuse structure
- Patent number 10,811,353
- Issue date Oct 20, 2020
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having two-part spacer
- Patent number 10,804,368
- Issue date Oct 13, 2020
- International Business Machines Corporation
- Ruqiang Bao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
BEOL thin film resistor
- Patent number 10,770,393
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Andrew Tae Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Graded interconnect cap
- Patent number 10,651,083
- Issue date May 12, 2020
- International Business Machines Corporation
- Andrew Tae Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,564,214
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Three plate MIM capacitor via integrity verification
- Patent number 10,262,934
- Issue date Apr 16, 2019
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three plate MIM capacitor via integrity verification
- Patent number 10,229,873
- Issue date Mar 12, 2019
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures for dielectric reliability evaluations
- Patent number 10,103,060
- Issue date Oct 16, 2018
- GLOBALFOUNDRIES Inc.
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,739,824
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,395,403
- Issue date Jul 19, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Correction for stress induced leakage current in dielectric reliabi...
- Patent number 9,310,418
- Issue date Apr 12, 2016
- International Business Machines Corporation
- Steven W. Mittl
- G01 - MEASURING TESTING
Information Patent Grant
Determining appropriateness of sampling integrated circuit test dat...
- Patent number 9,287,185
- Issue date Mar 15, 2016
- GLOBALFOUNDRIES Inc.
- Griselda Bonilla
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric reliability assessment for advanced semiconductors
- Patent number 9,026,981
- Issue date May 5, 2015
- International Business Machines Corporation
- Baozhen Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dielectric reliability assessment for advanced semiconductors
- Patent number 8,839,180
- Issue date Sep 16, 2014
- International Business Machines Corporation
- Baozhen Li
- G01 - MEASURING TESTING
Information Patent Grant
Analytic experimental estimator for impact of voltage-overshoot of...
- Patent number 8,352,900
- Issue date Jan 8, 2013
- International Business Machines Corporation
- Ernest Y. Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuitry and methodology to establish correlation between gate die...
- Patent number 7,298,161
- Issue date Nov 20, 2007
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Circuitry and methodology to establish correlation between gate die...
- Patent number 6,891,359
- Issue date May 10, 2005
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor antifuse with heating element
- Patent number 6,750,530
- Issue date Jun 15, 2004
- International Business Machines Corporation
- William A. Klaasen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RRAM FILAMENT SPATIAL LOCALIZATION USING A LASER STIMULATION
- Publication number 20230170019
- Publication date Jun 1, 2023
- International Business Machines Corporation
- Franco Stellari
- G11 - INFORMATION STORAGE
Information Patent Application
E-FUSE CO-PROCESSED WITH MIM CAPACITOR
- Publication number 20210249348
- Publication date Aug 12, 2021
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUB-GROUND RULE E-FUSE STRUCTURE
- Publication number 20200335440
- Publication date Oct 22, 2020
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RELIABLE RESISTIVE RANDOM ACCESS MEMORY
- Publication number 20200287136
- Publication date Sep 10, 2020
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200141996
- Publication date May 7, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
SUB-GROUND RULE E-FUSE STRUCTURE
- Publication number 20200126911
- Publication date Apr 23, 2020
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200072897
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING TWO-PART SPACER
- Publication number 20200035808
- Publication date Jan 30, 2020
- International Business Machines Corporation
- Ruqiang Bao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEOL THIN FILM RESISTOR
- Publication number 20190295947
- Publication date Sep 26, 2019
- International Business Machines Corporation
- Andrew Tae Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRADED INTERCONNECT CAP
- Publication number 20190273022
- Publication date Sep 5, 2019
- International Business Machines Corporation
- Andrew Tae Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION
- Publication number 20180226339
- Publication date Aug 9, 2018
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION
- Publication number 20180226338
- Publication date Aug 9, 2018
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20180074114
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20170285094
- Publication date Oct 5, 2017
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURES FOR DIELECTRIC RELIABILITY EVALUATIONS
- Publication number 20160372389
- Publication date Dec 22, 2016
- GLOBALFOUNDRIES INC.
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20160258994
- Publication date Sep 8, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20150115994
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION FOR STRESS INDUCED LEAKAGE CURRENT IN DIELECTRIC RELIABI...
- Publication number 20150061724
- Publication date Mar 5, 2015
- International Business Machines Corporation
- Steven W. Mittl
- G01 - MEASURING TESTING
Information Patent Application
DIELECTRIC RELIABILITY ASSESSMENT FOR ADVANCED SEMICONDUCTORS
- Publication number 20140351785
- Publication date Nov 27, 2014
- BAOZHEN LI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DIELECTRIC BREAKDOWN IN A DYNAMIC MODE
- Publication number 20140195175
- Publication date Jul 10, 2014
- International Business Machines Corporation
- Eduard A. Cartier
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION FOR STRESS INDUCED LEAKAGE CURRENT IN DIELECTRIC RELIABI...
- Publication number 20120303303
- Publication date Nov 29, 2012
- International Business Machines Corporation
- Steven W. Mittl
- G01 - MEASURING TESTING
Information Patent Application
Dual Stage Voltage Ramp Stress Test for Gate Dielectrics
- Publication number 20120187974
- Publication date Jul 26, 2012
- International Business Machines Corporation
- David G. Brochu, JR.
- G01 - MEASURING TESTING
Information Patent Application
Non-Destructive Electrical Characterization Macro and Methodology f...
- Publication number 20090006014
- Publication date Jan 1, 2009
- International Business Machines Corporation
- Kaushik Chanda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuitry and methodology to establish correlation between gate die...
- Publication number 20050184720
- Publication date Aug 25, 2005
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
Circuitry And Methodology To Establish Correlation Between Gate Die...
- Publication number 20040145384
- Publication date Jul 29, 2004
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
Gate stack process for high reliability dual oxide CMOS devices and...
- Publication number 20020027681
- Publication date Mar 7, 2002
- International Business Machines Corportion
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS

Ernest Y. Wu

Person

Patents Grantslast 30 patents

RRAM filament spatial localization using a laser stimulation

Reliable resistive random access memory

E-fuse co-processed with MIM capacitor

Sub-ground rule e-Fuse structure

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Sub-ground rule e-Fuse structure

Semiconductor device having two-part spacer

BEOL thin film resistor

Graded interconnect cap

Optimization of integrated circuit reliability

Three plate MIM capacitor via integrity verification

Three plate MIM capacitor via integrity verification

Test structures for dielectric reliability evaluations

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Correction for stress induced leakage current in dielectric reliabi...

Determining appropriateness of sampling integrated circuit test dat...

Dielectric reliability assessment for advanced semiconductors

Dielectric reliability assessment for advanced semiconductors

Analytic experimental estimator for impact of voltage-overshoot of...

Circuitry and methodology to establish correlation between gate die...

Circuitry and methodology to establish correlation between gate die...

Semiconductor antifuse with heating element

Patents Applicationslast 30 patents

RRAM FILAMENT SPATIAL LOCALIZATION USING A LASER STIMULATION

E-FUSE CO-PROCESSED WITH MIM CAPACITOR

SUB-GROUND RULE E-FUSE STRUCTURE

RELIABLE RESISTIVE RANDOM ACCESS MEMORY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

SUB-GROUND RULE E-FUSE STRUCTURE

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

SEMICONDUCTOR DEVICE HAVING TWO-PART SPACER

BEOL THIN FILM RESISTOR

GRADED INTERCONNECT CAP

THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION

THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

TEST STRUCTURES FOR DIELECTRIC RELIABILITY EVALUATIONS

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

CORRECTION FOR STRESS INDUCED LEAKAGE CURRENT IN DIELECTRIC RELIABI...

DIELECTRIC RELIABILITY ASSESSMENT FOR ADVANCED SEMICONDUCTORS

MEASURING DIELECTRIC BREAKDOWN IN A DYNAMIC MODE

CORRECTION FOR STRESS INDUCED LEAKAGE CURRENT IN DIELECTRIC RELIABI...

Dual Stage Voltage Ramp Stress Test for Gate Dielectrics

Non-Destructive Electrical Characterization Macro and Methodology f...

Circuitry and methodology to establish correlation between gate die...

Circuitry And Methodology To Establish Correlation Between Gate Die...

Gate stack process for high reliability dual oxide CMOS devices and...