Erwin Thalmann

Person

Villach, AT

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing semiconductor dies
- Patent number 10,018,667
- Issue date Jul 10, 2018
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor dies and a test apparatus
- Patent number 9,435,849
- Issue date Sep 6, 2016
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Grant
Data processing circuit apparatus having a data transmission unit o...
- Patent number 7,353,425
- Issue date Apr 1, 2008
- Infineon Technologies AG
- Erwin Thalmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring device for monitoring internal signals during initializa...
- Patent number 7,340,313
- Issue date Mar 4, 2008
- Infineon Technologies AG
- Manfred Moser
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic circuit apparatus and method for stacking electronic cir...
- Patent number 7,321,497
- Issue date Jan 22, 2008
- Infineon Technologies AG
- Sven Boldt
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Memory device with multistage sense amplifier
- Patent number 7,292,479
- Issue date Nov 6, 2007
- Infineon Technolgoies AG
- Sven Boldt
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and method for testing circuit units to be tested
- Patent number 7,276,896
- Issue date Oct 2, 2007
- Infineon Technologies AG
- Manfred Moser
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing circuit units to be tested with di...
- Patent number 7,254,758
- Issue date Aug 7, 2007
- Infineon Technologies AG
- Erwin Thalmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for testing circuit units to be tested
- Patent number 7,228,477
- Issue date Jun 5, 2007
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing an electric circuit
- Patent number 7,191,085
- Issue date Mar 13, 2007
- Infineon Technologies AG
- Thomas Neyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for testing a circuit having memory array and ad...
- Patent number 7,188,291
- Issue date Mar 6, 2007
- Infineon Technologies AG
- Erwin Thalmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic memory apparatus, and method for deactivating redundant...
- Patent number 7,184,335
- Issue date Feb 27, 2007
- Infineon Technologies AG
- Sven Boldt
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing circuit units to be tested by means of majority...
- Patent number 7,143,325
- Issue date Nov 28, 2006
- Infineon Technologies AG
- Erwin Thalmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing circuit units to be tested and test apparatus
- Patent number 7,039,544
- Issue date May 2, 2006
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Testing Semiconductor Dies
- Publication number 20160356839
- Publication date Dec 8, 2016
- INFINEON TECHNOLOGIES AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Method for Testing Semiconductor Dies and a Test Apparatus
- Publication number 20150377954
- Publication date Dec 31, 2015
- INFINEON TECHNOLOGIES AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Method for verification of electronic circuit units, and an apparat...
- Publication number 20060242518
- Publication date Oct 26, 2006
- Infineon Technologies AG
- Sven Boldt
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing an electric circuit
- Publication number 20060049844
- Publication date Mar 9, 2006
- Infineon Technologies AG
- Thomas Neyer
- G01 - MEASURING TESTING
Information Patent Application
Method for testing electronic circuit units and test apparatus
- Publication number 20060010359
- Publication date Jan 12, 2006
- Infineon Technologies AG
- Sven Boldt
- G11 - INFORMATION STORAGE
Information Patent Application
Memory device with multistage sense amplifier
- Publication number 20050286316
- Publication date Dec 29, 2005
- Sven Boldt
- G11 - INFORMATION STORAGE
Information Patent Application
Electronic circuit apparatus and method for stacking electronic cir...
- Publication number 20050281015
- Publication date Dec 22, 2005
- Sven Boldt
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Test apparatus and method for testing circuit units to be tested
- Publication number 20050280410
- Publication date Dec 22, 2005
- Manfred Moser
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus with memory data converter for redundant bit and wor...
- Publication number 20050270865
- Publication date Dec 8, 2005
- Infineon Technologies AG
- Sven Boldt
- G11 - INFORMATION STORAGE
Information Patent Application
Electronic memory apparatus, and method for deactivating redundant...
- Publication number 20050243636
- Publication date Nov 3, 2005
- Sven Boldt
- G11 - INFORMATION STORAGE
Information Patent Application
Monitoring device for monitoring internal signals during initializa...
- Publication number 20050209715
- Publication date Sep 22, 2005
- Manfred Moser
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for testing circuit units to be tested with di...
- Publication number 20050190629
- Publication date Sep 1, 2005
- Infineon Technologies AG
- Erwin Thalmann
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing circuit units to be tested by means of majority...
- Publication number 20050108609
- Publication date May 19, 2005
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Memory apparatus having redundancy, and method for storing data
- Publication number 20050108461
- Publication date May 19, 2005
- Infineon Technologies AG
- Sven Boldt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data processing circuit apparatus having a data transmission unit o...
- Publication number 20050076267
- Publication date Apr 7, 2005
- Erwin Thalmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test apparatus with static storage device and test method
- Publication number 20050076277
- Publication date Apr 7, 2005
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Method for testing circuit units to be tested and test apparatus
- Publication number 20050075821
- Publication date Apr 7, 2005
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a circuit unit to be tested, and a test apparatus
- Publication number 20050058007
- Publication date Mar 17, 2005
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a circuit which is under test, and circuit confi...
- Publication number 20050010844
- Publication date Jan 13, 2005
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for storing digital data
- Publication number 20040268081
- Publication date Dec 30, 2004
- Erwin Thalmann
- G11 - INFORMATION STORAGE

Erwin Thalmann

Person

Patents Grantslast 30 patents

Method for testing semiconductor dies

Method for testing semiconductor dies and a test apparatus

Data processing circuit apparatus having a data transmission unit o...

Monitoring device for monitoring internal signals during initializa...

Electronic circuit apparatus and method for stacking electronic cir...

Memory device with multistage sense amplifier

Test apparatus and method for testing circuit units to be tested

Method and apparatus for testing circuit units to be tested with di...

Apparatus and method for testing circuit units to be tested

Method for testing an electric circuit

Circuit and method for testing a circuit having memory array and ad...

Electronic memory apparatus, and method for deactivating redundant...

Method for testing circuit units to be tested by means of majority...

Method for testing circuit units to be tested and test apparatus

Patents Applicationslast 30 patents

Method for Testing Semiconductor Dies

Method for Testing Semiconductor Dies and a Test Apparatus

Method for verification of electronic circuit units, and an apparat...

Method for testing an electric circuit

Method for testing electronic circuit units and test apparatus

Memory device with multistage sense amplifier

Electronic circuit apparatus and method for stacking electronic cir...

Test apparatus and method for testing circuit units to be tested

Test apparatus with memory data converter for redundant bit and wor...

Electronic memory apparatus, and method for deactivating redundant...

Monitoring device for monitoring internal signals during initializa...

Method and apparatus for testing circuit units to be tested with di...

Method for testing circuit units to be tested by means of majority...

Memory apparatus having redundancy, and method for storing data

Data processing circuit apparatus having a data transmission unit o...

Test apparatus with static storage device and test method

Method for testing circuit units to be tested and test apparatus

Method for testing a circuit unit to be tested, and a test apparatus

Method for testing a circuit which is under test, and circuit confi...

Apparatus and method for storing digital data