Eugene Atwood

Person

Housatonic, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System testing using partitioned and controlled noise
- Patent number 12,174,251
- Issue date Dec 24, 2024
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
User privacy for autonomous vehicles
- Patent number 12,105,834
- Issue date Oct 1, 2024
- International Business Machines Corporation
- Mary P. Kusko
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Dynamic weight selection process for logic built-in self test
- Patent number 11,112,457
- Issue date Sep 7, 2021
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor micro probe array having compliance
- Patent number 11,079,406
- Issue date Aug 3, 2021
- International Business Machines Corporation
- Eugene R. Atwood
- G01 - MEASURING TESTING
Information Patent Grant
Logic built-in self test dynamic weight selection method
- Patent number 11,079,433
- Issue date Aug 3, 2021
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Fluidized alignment of a semiconductor die to a test probe
- Patent number 11,041,879
- Issue date Jun 22, 2021
- International Business Machines Corporation
- Eugene Atwood
- G01 - MEASURING TESTING
Information Patent Grant
Optimizing generation of test configurations for built-in self-testing
- Patent number 9,588,177
- Issue date Mar 7, 2017
- International Business Machines Corporation
- Eugene R. Atwood
- G01 - MEASURING TESTING
Information Patent Grant
On-chip test for integrated AC coupling capacitors
- Patent number 9,335,370
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- Eugene Atwood
- G01 - MEASURING TESTING
Information Patent Grant
Testing a decision feedback equalizer (‘DFE’)
- Patent number 9,209,948
- Issue date Dec 8, 2015
- International Business Machines Corporation
- Eugene R. Atwood
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Testing a digital-to-analog converter
- Patent number 9,041,572
- Issue date May 26, 2015
- International Business Machines Corporation
- Eugene R. Atwood
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing a decision feedback equalizer (‘DFE’)
- Patent number 9,014,254
- Issue date Apr 21, 2015
- International Business Machines Corporation
- Eugene R. Atwood
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Digital test system and method for value based data
- Patent number 8,405,419
- Issue date Mar 26, 2013
- International Business Machines Corporation
- Eugene Rogers Atwood
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for locating and testing a chip
- Patent number 7,218,128
- Issue date May 15, 2007
- International Business Machines Corporation
- Eugene Atwood
- G01 - MEASURING TESTING
Information Patent Grant
Thermal enhancement approach using solder compositions in the liqui...
- Patent number 6,656,770
- Issue date Dec 2, 2003
- International Business Machines Corporation
- Eugene R. Atwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal enhancement approach using solder compositions in the liqui...
- Patent number 6,281,573
- Issue date Aug 28, 2001
- International Business Machines Corporation
- Eugene R. Atwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Zero force heat sink
- Patent number 6,212,070
- Issue date Apr 3, 2001
- International Business Machines Corporation
- Eugene R. Atwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer test fixture using a biasing bladder and methodology
- Patent number 6,147,506
- Issue date Nov 14, 2000
- International Business Machines Corporation
- Umar M. U. Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic interconnection of integrated circuits
- Patent number 5,818,984
- Issue date Oct 6, 1998
- International Business Machines Corporation
- Umar M. Ahmad
- G02 - OPTICS
Information Patent Grant
Zero force heat sink
- Patent number 5,805,430
- Issue date Sep 8, 1998
- International Business Machines Corporation
- Eugene R. Atwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bare die multiple dies for direct attach
- Patent number 5,790,384
- Issue date Aug 4, 1998
- International Business Machines Corporation
- Umar M. Ahmad
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM TESTING USING PARTITIONED AND CONTROLLED NOISE
- Publication number 20230094107
- Publication date Mar 30, 2023
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
USER PRIVACY FOR AUTONOMOUS VEHICLES
- Publication number 20220027501
- Publication date Jan 27, 2022
- International Business Machines Corporation
- Mary P. Kusko
- B60 - VEHICLES IN GENERAL
Information Patent Application
DYNAMIC WEIGHT SELECTION PROCESS FOR LOGIC BUILT-IN SELF TEST
- Publication number 20210156910
- Publication date May 27, 2021
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
LOGIC BUILT-IN SELF TEST DYNAMIC WEIGHT SELECTION METHOD
- Publication number 20210156911
- Publication date May 27, 2021
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
FLUIDIZED ALIGNMENT OF A SEMICONDUCTOR DIE TO A TEST PROBE
- Publication number 20200386785
- Publication date Dec 10, 2020
- International Business Machines Corporation
- Eugene Atwood
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MICRO PROBE ARRAY HAVING COMPLIANCE
- Publication number 20180059138
- Publication date Mar 1, 2018
- International Business Machines Corporation
- Eugene R. Atwood
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP TEST FOR INTEGRATED AC COUPLING CAPACITORS
- Publication number 20150198647
- Publication date Jul 16, 2015
- International Business Machines Corporation
- Eugene Atwood
- G01 - MEASURING TESTING
Information Patent Application
TESTING A DIGITAL-TO-ANALOG CONVERTER
- Publication number 20150145710
- Publication date May 28, 2015
- International Business Machines Corporation
- EUGENE R. ATWOOD
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING A DECISION FEEDBACK EQUALIZER ('DFE')
- Publication number 20150131707
- Publication date May 14, 2015
- International Business Machines Corporation
- EUGENE R. ATWOOD
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TESTING A DECISION FEEDBACK EQUALIZER ('DFE')
- Publication number 20140376603
- Publication date Dec 25, 2014
- International Business Machines Corporation
- EUGENE R. ATWOOD
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DIGITAL TEST SYSTEM AND METHOD FOR VALUE BASED DATA
- Publication number 20130069688
- Publication date Mar 21, 2013
- International Business Machines
- Eugene Rogers Atwood
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR LOCATING AND TESTING A CHIP
- Publication number 20060181291
- Publication date Aug 17, 2006
- International Business Machines Corporation
- Eugene R. Atwood
- G01 - MEASURING TESTING
Information Patent Application
Thermal enhancement approach using solder compositions in the liqui...
- Publication number 20010026957
- Publication date Oct 4, 2001
- International Business Machines Corporation
- Eugene R. Atwood
- H01 - BASIC ELECTRIC ELEMENTS

Eugene Atwood

Person

Patents Grantslast 30 patents

System testing using partitioned and controlled noise

User privacy for autonomous vehicles

Dynamic weight selection process for logic built-in self test

Semiconductor micro probe array having compliance

Logic built-in self test dynamic weight selection method

Fluidized alignment of a semiconductor die to a test probe

Optimizing generation of test configurations for built-in self-testing

On-chip test for integrated AC coupling capacitors

Testing a decision feedback equalizer (‘DFE’)

Testing a digital-to-analog converter

Testing a decision feedback equalizer (‘DFE’)

Digital test system and method for value based data

Method and apparatus for locating and testing a chip

Thermal enhancement approach using solder compositions in the liqui...

Thermal enhancement approach using solder compositions in the liqui...

Zero force heat sink

Wafer test fixture using a biasing bladder and methodology

Optoelectronic interconnection of integrated circuits

Zero force heat sink

Bare die multiple dies for direct attach

Patents Applicationslast 30 patents

SYSTEM TESTING USING PARTITIONED AND CONTROLLED NOISE

USER PRIVACY FOR AUTONOMOUS VEHICLES

DYNAMIC WEIGHT SELECTION PROCESS FOR LOGIC BUILT-IN SELF TEST

LOGIC BUILT-IN SELF TEST DYNAMIC WEIGHT SELECTION METHOD

FLUIDIZED ALIGNMENT OF A SEMICONDUCTOR DIE TO A TEST PROBE

SEMICONDUCTOR MICRO PROBE ARRAY HAVING COMPLIANCE

ON-CHIP TEST FOR INTEGRATED AC COUPLING CAPACITORS

TESTING A DIGITAL-TO-ANALOG CONVERTER

TESTING A DECISION FEEDBACK EQUALIZER ('DFE')

TESTING A DECISION FEEDBACK EQUALIZER ('DFE')

DIGITAL TEST SYSTEM AND METHOD FOR VALUE BASED DATA

METHOD AND APPARATUS FOR LOCATING AND TESTING A CHIP

Thermal enhancement approach using solder compositions in the liqui...