Alexandria, VA, US
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The Government of the United States of America, as represented by the Secreta...
Adam L. Friedman
C01 - INORGANIC CHEMISTRY
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The Government of the United States of America, as represented by the Secreta...
Evgeniya H. Lock
G01 - MEASURING TESTING
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Evgeniya H. Lock
G01 - MEASURING TESTING
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Adam L. Friedman
C01 - INORGANIC CHEMISTRY
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The Government of the United States of America, as represented by the Secreta...
Mario Ancona
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Adam L. Friedman
G01 - MEASURING TESTING
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Mario Ancona
G01 - MEASURING TESTING
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Adam L. Friedman
B82 - NANO-TECHNOLOGY
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Mario Ancona
G01 - MEASURING TESTING
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Patent Grant
The United States of America, as represented by the Secretary of the Navy, Na...
F. Keith Perkins
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
F. Keith Perkins
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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The United States of America as represented by the Secretary of the Navy
Eric S. Snow
G01 - MEASURING TESTING
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The United States of America as represented by the Secretary of the Navy
Keir C. Lauritzen
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
The United States of America as represented by the Secretary of the Navy
F. Keith Perkins
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Evgeniya H. Lock
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Adam L. Friedman
C01 - INORGANIC CHEMISTRY
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Patent Application
The Government of the United States of America, as represented by the Secreta...
F. Keith Perkins
B82 - NANO-TECHNOLOGY
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Evgeniya H. Lock
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Adam L. Friedman
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Adam L. Friedman
G01 - MEASURING TESTING
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Patent Application
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETA...
Adam L. Friedman
B82 - NANO-TECHNOLOGY
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Patent Application
The Government of the United States, as represented by the Secretary of the N...
F. Keith Perkins
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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Patent Application
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETA...
Perry Skeath
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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Patent Application
Eric S. Snow
G01 - MEASURING TESTING
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Patent Application
Keir C. Lauritzen
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Leonard M. Tender
G01 - MEASURING TESTING
