Fang-Shi Jorcan Lai

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Diode array for connecting to phase change memory and method formin...
- Patent number 10,861,700
- Issue date Dec 8, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change memory with diodes embedded in substrate
- Patent number 10,103,024
- Issue date Oct 16, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ADC calibration
- Patent number 9,344,106
- Issue date May 17, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Phase change memory with diodes embedded in substrate
- Patent number 9,276,209
- Issue date Mar 1, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ADC calibration
- Patent number 8,928,508
- Issue date Jan 6, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sigma delta modulator including digital to analog coverter (DAC) ca...
- Patent number 8,803,715
- Issue date Aug 12, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for measuring degradation of CMOS VLSI elements
- Patent number 8,692,571
- Issue date Apr 8, 2014
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fang-Shi Jordan Lai
- G01 - MEASURING TESTING
Information Patent Grant
Pipeline analog-to-digital converter
- Patent number 8,493,259
- Issue date Jul 23, 2013
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Switched-capacitor circuit with low signal degradation
- Patent number 8,441,384
- Issue date May 14, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
ADC calibration apparatus
- Patent number 8,416,105
- Issue date Apr 9, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Background calibration of analog-to-digital converters
- Patent number 8,279,097
- Issue date Oct 2, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for analog to digital conversion
- Patent number 8,279,102
- Issue date Oct 2, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for calibrating sigma-delta modulator
- Patent number 8,228,221
- Issue date Jul 24, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
ADC calibration
- Patent number 8,223,047
- Issue date Jul 17, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
DAC calibration
- Patent number 8,134,486
- Issue date Mar 13, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
DAC variation-tracking calibration
- Patent number 7,893,853
- Issue date Feb 22, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Static noise-immune SRAM cells
- Patent number 7,511,988
- Issue date Mar 31, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wesley Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit implementation of a dynamic power supply for SRAM core array
- Patent number 7,394,714
- Issue date Jul 1, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wesley Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM device with reduced leakage current
- Patent number 7,269,055
- Issue date Sep 11, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wesley Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for power management of standard cell application
- Patent number 7,183,808
- Issue date Feb 27, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fang-Shi Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Power management circuit and memory cell
- Patent number 7,158,404
- Issue date Jan 2, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fang-Shi Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
MRAM arrays and methods for writing and reading magnetic memory dev...
- Patent number 7,154,798
- Issue date Dec 26, 2006
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Chin Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Power management circuit
- Patent number 7,132,848
- Issue date Nov 7, 2006
- Taiwan Semiconductor Manufacturing Co, Ltd.
- Fang-Shi Lai
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Phase Change Memory with Diodes Embedded in Substrate
- Publication number 20190051528
- Publication date Feb 14, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase Change Memory with Diodes Embedded in Substrate
- Publication number 20160181106
- Publication date Jun 23, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADC CALIBRATION
- Publication number 20150097710
- Publication date Apr 9, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan LAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PIPELINE ANALOG-TO-DIGITAL CONVERTER
- Publication number 20130141260
- Publication date Jun 6, 2013
- Taiwan Semiconductor Manufacturing Co., LTD
- Fang-Shi Jordan LAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR MEASURING DEGRADATION OF CMOS VLSI ELEMENTS
- Publication number 20130015876
- Publication date Jan 17, 2013
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fang-Shi Jordan LAI
- G01 - MEASURING TESTING
Information Patent Application
ADC CALIBRATION
- Publication number 20120249351
- Publication date Oct 4, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SWITCHED-CAPACITOR CIRCUIT WITH LOW SIGNAL DEGRADATION
- Publication number 20120212361
- Publication date Aug 23, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ADC Calibration Apparatus
- Publication number 20120212359
- Publication date Aug 23, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DAC CALIBRATION
- Publication number 20120133536
- Publication date May 31, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan LAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR ANALOG TO DIGITAL CONVERSION
- Publication number 20120081244
- Publication date Apr 5, 2012
- Taiwan Semiconductor Manufacturing Co., LTD
- Fang-Shi Jordan LAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR CALIBRATING SIGMA-DELTA MODULATOR
- Publication number 20120075132
- Publication date Mar 29, 2012
- Taiwan Semiconductor Manufacturing Co., LTD
- Fang-Shi Jordan LAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Phase Change Memory with Diodes Embedded in Substrate
- Publication number 20110092041
- Publication date Apr 21, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DAC CALIBRATION
- Publication number 20110037631
- Publication date Feb 17, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan LAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ADC CALIBRATION
- Publication number 20110037632
- Publication date Feb 17, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Background Calibration of Analog-to-Digital Converters
- Publication number 20110012763
- Publication date Jan 20, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DAC Variation-Tracking Calibration
- Publication number 20100164766
- Publication date Jul 1, 2010
- Fang-Shi Jordan Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Phase Change Memory with Diodes Embedded in Substrate
- Publication number 20090108249
- Publication date Apr 30, 2009
- Fang-Shi Jordan Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bandgap Reference Circuits for Providing Accurate Sub-1V Voltages
- Publication number 20090096509
- Publication date Apr 16, 2009
- Fang-Shi Jordan Lai
- G05 - CONTROLLING REGULATING
Information Patent Application
Circuit implementation of a dynamic power supply for SRAM core array
- Publication number 20080062802
- Publication date Mar 13, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wesley Lin
- G11 - INFORMATION STORAGE
Information Patent Application
Static noise-immune SRAM cells
- Publication number 20070268747
- Publication date Nov 22, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wesley Lin
- G11 - INFORMATION STORAGE
Information Patent Application
SRAM DEVICE WITH REDUCED LEAKAGE CURRENT
- Publication number 20070189102
- Publication date Aug 16, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wesley Lin
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit for power management of standard cell application
- Publication number 20060017467
- Publication date Jan 26, 2006
- Fang-Shi Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Power management circuit
- Publication number 20060017469
- Publication date Jan 26, 2006
- Fang-Shi Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Power management circuit and memory cell
- Publication number 20060018146
- Publication date Jan 26, 2006
- Fang-Shi Lai
- G11 - INFORMATION STORAGE
Information Patent Application
MRAM arrays and methods for writing and reading magnetic memory dev...
- Publication number 20050243598
- Publication date Nov 3, 2005
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chin Lin
- G11 - INFORMATION STORAGE

Fang-Shi Jorcan Lai

Person

Patents Grantslast 30 patents

Diode array for connecting to phase change memory and method formin...

Phase change memory with diodes embedded in substrate

ADC calibration

Phase change memory with diodes embedded in substrate

ADC calibration

Sigma delta modulator including digital to analog coverter (DAC) ca...

Apparatus and method for measuring degradation of CMOS VLSI elements

Pipeline analog-to-digital converter

Switched-capacitor circuit with low signal degradation

ADC calibration apparatus

Background calibration of analog-to-digital converters

Method and apparatus for analog to digital conversion

Method and apparatus for calibrating sigma-delta modulator

ADC calibration

DAC calibration

DAC variation-tracking calibration

Static noise-immune SRAM cells

Circuit implementation of a dynamic power supply for SRAM core array

SRAM device with reduced leakage current

Circuit for power management of standard cell application

Power management circuit and memory cell

MRAM arrays and methods for writing and reading magnetic memory dev...

Power management circuit

Patents Applicationslast 30 patents

Phase Change Memory with Diodes Embedded in Substrate

Phase Change Memory with Diodes Embedded in Substrate

ADC CALIBRATION

PIPELINE ANALOG-TO-DIGITAL CONVERTER

APPARATUS AND METHOD FOR MEASURING DEGRADATION OF CMOS VLSI ELEMENTS

ADC CALIBRATION

SWITCHED-CAPACITOR CIRCUIT WITH LOW SIGNAL DEGRADATION

ADC Calibration Apparatus

DAC CALIBRATION

METHOD AND APPARATUS FOR ANALOG TO DIGITAL CONVERSION

METHOD AND APPARATUS FOR CALIBRATING SIGMA-DELTA MODULATOR

Phase Change Memory with Diodes Embedded in Substrate

DAC CALIBRATION

ADC CALIBRATION

Background Calibration of Analog-to-Digital Converters

DAC Variation-Tracking Calibration

Phase Change Memory with Diodes Embedded in Substrate

Bandgap Reference Circuits for Providing Accurate Sub-1V Voltages

Circuit implementation of a dynamic power supply for SRAM core array

Static noise-immune SRAM cells

SRAM DEVICE WITH REDUCED LEAKAGE CURRENT

Circuit for power management of standard cell application

Power management circuit

Power management circuit and memory cell

MRAM arrays and methods for writing and reading magnetic memory dev...