Fangchao ZHAO

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Chongqing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADJOINT AUTOMATIC MONITORING DEVICE AND METHOD FOR DEPOSITION RATE...
- Publication number 20250231136
- Publication date Jul 17, 2025
- SOUTHWEST TECHNICAL ENGINEERING RESEARCH INSTITUTE OF CHINA SOUTH INDUSTRIES...
- Hulin WU
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...
- Publication number 20220412901
- Publication date Dec 29, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING