Felix Kerstan

Person

Jena, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Plurality of structurally identical spectrometers and a calibration...
- Patent number 12,158,414
- Issue date Dec 3, 2024
- CARL ZEISS SPECTROSCOPY GMBH
- Clemens Michael Bier
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer system and method for testing of same
- Patent number 11,940,378
- Issue date Mar 26, 2024
- CARL ZEISS SPECTROSCOPY GMBH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometric measurement system and method for compensating for ve...
- Patent number 8,111,396
- Issue date Feb 7, 2012
- Carl Zeiss MicroImaging GmbH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with a slit for incident light and fabrication of the...
- Patent number 8,102,526
- Issue date Jan 24, 2012
- Carl Zeiss MicroImaging GmbH
- Jens Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Grating spectrometer system and method for the acquisition of measu...
- Patent number 7,692,790
- Issue date Apr 6, 2010
- Carl Zeiss MicroImaging GmbH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for compensation of the temperature dependen...
- Patent number 7,573,023
- Issue date Aug 11, 2009
- Carl Zeiss MicroImaging GmbH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Grant
Assembly and method for identifying coatings lying on the surface o...
- Patent number 7,502,108
- Issue date Mar 10, 2009
- Carl Zeiss MicroImaging GmbH
- Manfred Fritsch
- G01 - MEASURING TESTING
Information Patent Grant
Compact spectrometer
- Patent number 7,369,228
- Issue date May 6, 2008
- Carl Zeiss MicroImaging GmbH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Grant
Pressure compensating device for optical apparatus
- Patent number 7,082,003
- Issue date Jul 25, 2006
- Car Zeiss Jena GmbH
- Nico Correns
- G01 - MEASURING TESTING
Information Patent Grant
Gas sample vessel for a gas analyzer
- Patent number 6,888,637
- Issue date May 3, 2005
- Carl Zeiss Jena GmbH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining the thickness and growth rate of...
- Patent number 6,762,409
- Issue date Jul 13, 2004
- Carl Zeiss Jena GmbH
- Manfred Fritsch
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for fixing an optical component part
- Patent number 6,654,186
- Issue date Nov 25, 2003
- Carl Zeiss Jena GmbH
- Ullrich Klarner
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
A PLURALITY OF STRUCTURALLY IDENTICAL SPECTROMETERS AND A CALIBRATI...
- Publication number 20230243741
- Publication date Aug 3, 2023
- Carl Zeiss Spectroscopy GmbH
- Clemens Michael BIER
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER SYSTEM AND METHOD FOR TESTING OF SAME
- Publication number 20220187196
- Publication date Jun 16, 2022
- Carl Zeiss Spectroscopy GmbH
- Felix KERSTAN
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRIC MEASUREMENT SYSTEM AND METHOD FOR COMPENSATING FOR VE...
- Publication number 20120105847
- Publication date May 3, 2012
- Felix KERSTAN
- G01 - MEASURING TESTING
Information Patent Application
Spectrometric assembly and method for determining a temperature val...
- Publication number 20110255075
- Publication date Oct 20, 2011
- CARL ZEISS MICROIMAGING GMBH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Application
Arrangement for Determining the Reflectivity of a Sample
- Publication number 20110007319
- Publication date Jan 13, 2011
- CARL ZEISS MICROIMAGING GMBH
- Nico Correns
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR OPTICAL SPECTROSCOPY AND MECHANICAL SWITCH FOR SUCH A DE...
- Publication number 20100321686
- Publication date Dec 23, 2010
- CARL ZEISS MICROIMAGING GMBH
- Nico Correns
- G01 - MEASURING TESTING
Information Patent Application
Spectrometric Measurement System and Method for Compensating for Ve...
- Publication number 20090168060
- Publication date Jul 2, 2009
- CARL ZEISS MICROIMAGING GMBH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER WITH A SLIT FOR INCIDENT LIGHT AND FABRICATION OF THE...
- Publication number 20090103089
- Publication date Apr 23, 2009
- CARL ZEISS MICROIMAGING GMBH
- Jens Hofmann
- G01 - MEASURING TESTING
Information Patent Application
Assembly and method for identifying coatings lying on the surface o...
- Publication number 20070195323
- Publication date Aug 23, 2007
- Manfred Fritsch
- G01 - MEASURING TESTING
Information Patent Application
GRATING SPECTROMETER SYSTEM AND METHOD FOR THE ACQUISITION OF MEASU...
- Publication number 20060268270
- Publication date Nov 30, 2006
- Carl Zeiss Microlmaging GmbH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Application
Arrangement and method for compensation of the temperature dependen...
- Publication number 20060163460
- Publication date Jul 27, 2006
- Carl Zeiss Jena GmbH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Application
Compact spectrometer
- Publication number 20060139636
- Publication date Jun 29, 2006
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Application
Pressure compensating device for optical apparatus
- Publication number 20040027565
- Publication date Feb 12, 2004
- Nico Correns
- G02 - OPTICS
Information Patent Application
Gas sample vessel for a gas analyzer
- Publication number 20030103204
- Publication date Jun 5, 2003
- Carl Zeiss Jena GmbH
- Felix Kerstan
- G01 - MEASURING TESTING
Information Patent Application
Method and device for determining the thickness and growth rate of...
- Publication number 20030071217
- Publication date Apr 17, 2003
- Manfred Fritsch
- G01 - MEASURING TESTING
Information Patent Application
Arrangement for fixing an optical component part
- Publication number 20020171956
- Publication date Nov 21, 2002
- Carl Zeiss Jena GmbH
- Ullrich Klarner
- G02 - OPTICS

Felix Kerstan

Person

Patents Grantslast 30 patents

Plurality of structurally identical spectrometers and a calibration...

Spectrometer system and method for testing of same

Spectrometric measurement system and method for compensating for ve...

Spectrometer with a slit for incident light and fabrication of the...

Grating spectrometer system and method for the acquisition of measu...

Arrangement and method for compensation of the temperature dependen...

Assembly and method for identifying coatings lying on the surface o...

Compact spectrometer

Pressure compensating device for optical apparatus

Gas sample vessel for a gas analyzer

Method and device for determining the thickness and growth rate of...

Arrangement for fixing an optical component part

Patents Applicationslast 30 patents

A PLURALITY OF STRUCTURALLY IDENTICAL SPECTROMETERS AND A CALIBRATI...

SPECTROMETER SYSTEM AND METHOD FOR TESTING OF SAME

SPECTROMETRIC MEASUREMENT SYSTEM AND METHOD FOR COMPENSATING FOR VE...

Spectrometric assembly and method for determining a temperature val...

Arrangement for Determining the Reflectivity of a Sample

DEVICE FOR OPTICAL SPECTROSCOPY AND MECHANICAL SWITCH FOR SUCH A DE...

Spectrometric Measurement System and Method for Compensating for Ve...

SPECTROMETER WITH A SLIT FOR INCIDENT LIGHT AND FABRICATION OF THE...

Assembly and method for identifying coatings lying on the surface o...

GRATING SPECTROMETER SYSTEM AND METHOD FOR THE ACQUISITION OF MEASU...

Arrangement and method for compensation of the temperature dependen...

Compact spectrometer

Pressure compensating device for optical apparatus

Gas sample vessel for a gas analyzer

Method and device for determining the thickness and growth rate of...

Arrangement for fixing an optical component part