Filip Christiaens

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Bornem, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for thermal impedance evaluation of packaged semiconductor c...
- Patent number 5,927,853
- Issue date Jul 27, 1999
- Filip Christiaens
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for thermal impedance evaluation of packaged s...
- Patent number 5,795,063
- Issue date Aug 18, 1998
- Interuniversitair Micro-Elektronica Centrum VZW
- Filip Christiaens
- G01 - MEASURING TESTING