Frank Havermeyer

Person

La Verne, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Identification and analysis of materials and molecular structures
- Patent number 10,502,688
- Issue date Dec 10, 2019
- Ondax, Inc.
- James Carriere
- G01 - MEASURING TESTING
Information Patent Grant
Identification and analysis of materials and molecular structures
- Patent number 9,599,565
- Issue date Mar 21, 2017
- Ondax, Inc.
- James Carriere
- G01 - MEASURING TESTING
Information Patent Grant
Thermally compensated optical probe
- Patent number 9,587,983
- Issue date Mar 7, 2017
- Ondax, Inc.
- Lawrence Ho
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Correcting spatial beam deformation
- Patent number 9,097,896
- Issue date Aug 4, 2015
- Ondax, Inc.
- Christophe Moser
- G02 - OPTICS
Information Patent Grant
Correcting spatial beam deformation
- Patent number 8,384,992
- Issue date Feb 26, 2013
- Ondax, Inc.
- Christophe Moser
- G02 - OPTICS
Information Patent Grant
Optical pulse shaping method and apparatus
- Patent number 8,369,017
- Issue date Feb 5, 2013
- Ondax, Inc.
- Christophe Moser
- G02 - OPTICS
Information Patent Grant
Method and apparatus using volume holographic wavelength blockers
- Patent number 8,184,285
- Issue date May 22, 2012
- Ondax, Inc.
- Christophe Moser
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of volume holographic gratings
- Patent number 8,139,212
- Issue date Mar 20, 2012
- Ondax, Inc.
- Christophe Moser
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for large spectral coverage measurement of vol...
- Patent number 8,049,885
- Issue date Nov 1, 2011
- Ondax, Inc.
- Christophe Moser
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus using volume holographic wavelength blockers
- Patent number 7,986,407
- Issue date Jul 26, 2011
- Ondax, Inc.
- Christophe Moser
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for wavelength tuning laser diodes
- Patent number 7,636,376
- Issue date Dec 22, 2009
- Ondax, Inc.
- Christophe Moser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for wafer-level measurement of volume holograp...
- Patent number 7,359,046
- Issue date Apr 15, 2008
- Ondax, Inc.
- Gregory J. Steckman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Identification and Analysis of Materials and Molecular Structures
- Publication number 20170191939
- Publication date Jul 6, 2017
- Ondax, Inc.
- James Carriere
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY COMPENSATED OPTICAL PROBE
- Publication number 20170082489
- Publication date Mar 23, 2017
- Ondax, Inc.
- Lawrence Ho
- G02 - OPTICS
Information Patent Application
CORRECTING SPATIAL BEAM DEFORMATION
- Publication number 20120044554
- Publication date Feb 23, 2012
- Christophe Moser
- G02 - OPTICS
Information Patent Application
Method and Apparatus Using Volume Holographic Wavelength Blockers
- Publication number 20120002197
- Publication date Jan 5, 2012
- Christophe Moser
- G02 - OPTICS
Information Patent Application
CORRECTING SPATIAL BEAM DEFORMATION
- Publication number 20110216384
- Publication date Sep 8, 2011
- Ondax, Inc.
- Christophe Moser
- G02 - OPTICS
Information Patent Application
MEASUREMENT OF VOLUME HOLOGRAPHIC GRATINGS
- Publication number 20110216316
- Publication date Sep 8, 2011
- Ondax, Inc.
- Christophe Moser
- G01 - MEASURING TESTING
Information Patent Application
Optical pulse shaping method and apparatus
- Publication number 20100103489
- Publication date Apr 29, 2010
- ONDAX, INC.
- Christophe Moser
- G02 - OPTICS
Information Patent Application
Method and apparatus using volume holographic wavelength blockers
- Publication number 20100027001
- Publication date Feb 4, 2010
- ONDAX, INC.
- Christophe Moser
- G02 - OPTICS
Information Patent Application
Method and apparatus for wavelength tuning laser diodes
- Publication number 20090238217
- Publication date Sep 24, 2009
- ONDAX, INC.
- Christophe Moser
- H01 - BASIC ELECTRIC ELEMENTS

Frank Havermeyer

Person

Patents Grantslast 30 patents

Identification and analysis of materials and molecular structures

Identification and analysis of materials and molecular structures

Thermally compensated optical probe

Correcting spatial beam deformation

Correcting spatial beam deformation

Optical pulse shaping method and apparatus

Method and apparatus using volume holographic wavelength blockers

Measurement of volume holographic gratings

Method and apparatus for large spectral coverage measurement of vol...

Method and apparatus using volume holographic wavelength blockers

Method and apparatus for wavelength tuning laser diodes

Method and apparatus for wafer-level measurement of volume holograp...

Patents Applicationslast 30 patents

Identification and Analysis of Materials and Molecular Structures

THERMALLY COMPENSATED OPTICAL PROBE

CORRECTING SPATIAL BEAM DEFORMATION

Method and Apparatus Using Volume Holographic Wavelength Blockers

CORRECTING SPATIAL BEAM DEFORMATION

MEASUREMENT OF VOLUME HOLOGRAPHIC GRATINGS

Optical pulse shaping method and apparatus

Method and apparatus using volume holographic wavelength blockers

Method and apparatus for wavelength tuning laser diodes