Frank Pietzschmann

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Probe needle for testing semiconductor chips and method for produci...
- Patent number 7,212,019
- Issue date May 1, 2007
- Infineon Technologies AG
- Manfred Schneegans
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor circuit and method of testing semi...
- Patent number 6,784,678
- Issue date Aug 31, 2004
- Infineon Technologies AG
- Frank Pietzschmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST DEVICE
- Publication number 20090079450
- Publication date Mar 26, 2009
- QIMONDA AG
- Udo Hartmann
- G01 - MEASURING TESTING
Information Patent Application
Probe needle for testing semiconductor chips and method for produci...
- Publication number 20040239921
- Publication date Dec 2, 2004
- Manfred Schneegans
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus for semiconductor circuit and method of testing semi...
- Publication number 20020024354
- Publication date Feb 28, 2002
- Frank Pietzschmann
- G01 - MEASURING TESTING