Membership
Tour
Register
Log in
Fumiaki Endo
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Image classification standard update method, program, and image cla...
Patent number
8,625,906
Issue date
Jan 7, 2014
Hitachi High-Technologies Corporation
Yuya Isomae
G01 - MEASURING TESTING
Information
Patent Grant
Wafer inspection data handling and defect review tool
Patent number
8,209,135
Issue date
Jun 26, 2012
Hitachi High-Technologies Corporation
Tomohiro Funakoshi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit device and the process of the same
Patent number
7,132,341
Issue date
Nov 7, 2006
Renesas Technology Corp.
Masashi Sahara
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device producing method, system for carrying out the...
Patent number
6,650,409
Issue date
Nov 18, 2003
Hitachi, Ltd.
Minori Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting patterns
Patent number
5,153,444
Issue date
Oct 6, 1992
Hitachi, Ltd.
Shunji Maeda
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR PREPARING SPECIMEN
Publication number
20140084159
Publication date
Mar 27, 2014
Hitachi High-Technologies Corporation
Kaori Yaeshima
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE OBSERVATION APPARATUS AND METHOD OF MARKING
Publication number
20130134308
Publication date
May 30, 2013
Hitachi High-Technologies Corporation
Fumiaki ENDO
G01 - MEASURING TESTING
Information
Patent Application
IMAGE CLASSIFICATION STANDARD UPDATE METHOD, PROGRAM, AND IMAGE CLA...
Publication number
20110274362
Publication date
Nov 10, 2011
Hitachi High-Techologies Corporation
Yuya Isomae
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER INSPECTION DATA HANDLING AND DEFECT REVIEW TOOL
Publication number
20110211060
Publication date
Sep 1, 2011
Hitachi High-Technologies Corporation
Tomohiro Funakoshi
G01 - MEASURING TESTING
Information
Patent Application
DEFECT REVIEW METHOD AND APPARATUS
Publication number
20090278923
Publication date
Nov 12, 2009
Hitachi High-Technologies Corporation
Fumiaki ENDO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inspection Assistance System, Data Processing Equipment, and Data P...
Publication number
20080240545
Publication date
Oct 2, 2008
Hitachi High-Technologies Corporation
Fumiaki ENDO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Wafer inspection data handling and defect review tool
Publication number
20070105245
Publication date
May 10, 2007
Hitachi High-Technologies Corporation
Tomohiro Funakoshi
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit device and the process of the same
Publication number
20020048947
Publication date
Apr 25, 2002
Masashi Sahara
H01 - BASIC ELECTRIC ELEMENTS