Fumiharu Nakajima

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, semiconductor memory device, and manufacturin...
- Patent number 12,154,648
- Issue date Nov 26, 2024
- Kioxia Corporation
- Yoshiyuki Takasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask pattern verification method
- Patent number 10,606,165
- Issue date Mar 31, 2020
- TOSHIBA MEMORY CORPORATION
- Yayori Toriu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having a wiring line with an end portion havin...
- Patent number 10,483,202
- Issue date Nov 19, 2019
- TOSHIBA MEMORY CORPORATION
- Ryota Aburada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of wiring layout, semiconductor device, program for supporti...
- Patent number 9,977,855
- Issue date May 22, 2018
- TOSHIBA MEMORY CORPORATION
- Chikaaki Kodama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of wiring layout, semiconductor device, program for supporti...
- Patent number 9,953,126
- Issue date Apr 24, 2018
- TOSHIBA MEMORY CORPORATION
- Chikaaki Kodama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having contacts in drawing area and the contac...
- Patent number 9,917,049
- Issue date Mar 13, 2018
- TOSHIBA MEMORY CORPORATION
- Fumiharu Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the semiconductor...
- Patent number 9,786,556
- Issue date Oct 10, 2017
- TOSHIBA MEMORY CORPORATION
- Weiting Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the semiconductor...
- Patent number 9,646,982
- Issue date May 9, 2017
- Kabushiki Kaisha Toshiba
- Weiting Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern data generation method, pattern verification method, and op...
- Patent number 9,576,100
- Issue date Feb 21, 2017
- Kabushiki Kaisha Toshiba
- Seiro Miyoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing semiconductor device using sidewall films f...
- Patent number 9,177,854
- Issue date Nov 3, 2015
- Kabushiki Kaisha Toshiba
- Fumiharu Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern data generation method, pattern verification method, and op...
- Patent number 8,984,454
- Issue date Mar 17, 2015
- Kabushiki Kaisha Toshiba
- Seiro Miyoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing semiconductor device and computer readable...
- Patent number 8,617,999
- Issue date Dec 31, 2013
- Kabushiki Kaisha Toshiba
- Hiromitsu Mashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern layout in semiconductor device
- Patent number 8,618,665
- Issue date Dec 31, 2013
- Kabushiki Kaisha Toshiba
- Go Shikata
- G11 - INFORMATION STORAGE
Information Patent Grant
Mask pattern generating method and computer program product
- Patent number 8,609,303
- Issue date Dec 17, 2013
- Kabushiki Kaisha Toshiba
- Chikaaki Kodama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern correcting method, mask forming method, and method of manuf...
- Patent number 8,443,310
- Issue date May 14, 2013
- Kabushiki Kaisha Toshiba
- Masanari Kajiwara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern generation method, computer-readable recording medium, and...
- Patent number 8,347,241
- Issue date Jan 1, 2013
- Kabushiki Kaisha Toshiba
- Fumiharu Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern dimension calculation method and computer program product
- Patent number 8,336,005
- Issue date Dec 18, 2012
- Kabushiki Kaisha Toshiba
- Takafumi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern generating method, method of manufacturing semiconductor de...
- Patent number 8,266,552
- Issue date Sep 11, 2012
- Kabushiki Kaisha Toshiba
- Takafumi Taguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for manufacturing semiconductor device and computer readable...
- Patent number 8,143,171
- Issue date Mar 27, 2012
- Kabushiki Kaisha Toshiba
- Hiromitsu Mashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,713,833
- Issue date May 11, 2010
- Kabushiki Kaisha Toshiba
- Hiromitsu Mashita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY DEVICE, AND MANUFACTURIN...
- Publication number 20230307010
- Publication date Sep 28, 2023
- KIOXIA Corporation
- Yoshiyuki TAKASU
- G11 - INFORMATION STORAGE
Information Patent Application
MASK PATTERN VERIFICATION METHOD
- Publication number 20190243232
- Publication date Aug 8, 2019
- Toshiba Memory Corporation
- Yayori TORIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20170243818
- Publication date Aug 24, 2017
- KABUSHIKI KAISHA TOSHIBA
- Ryota ABURADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR...
- Publication number 20170133267
- Publication date May 11, 2017
- KABUSHIKI KAISHA TOSHIBA
- Weiting WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20160343658
- Publication date Nov 24, 2016
- Kabushiki Kaisha Toshiba
- Fumiharu NAKAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR...
- Publication number 20160071859
- Publication date Mar 10, 2016
- KABUSHIKI KAISHA TOSHIBA
- Weiting WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20160013097
- Publication date Jan 14, 2016
- Kabushiki Kaisha Toshiba
- Fumiharu NAKAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN DATA GENERATION METHOD, PATTERN VERIFICATION METHOD, AND OP...
- Publication number 20150113485
- Publication date Apr 23, 2015
- Kabushiki Kaisha Toshiba
- Seiro MIYOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN METHOD OF WIRING LAYOUT, SEMICONDUCTOR DEVICE, PROGRAM FOR S...
- Publication number 20150021782
- Publication date Jan 22, 2015
- KABUSHIKI KAISHA TOSHIBA
- Chikaaki KODAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN METHOD OF WIRING LAYOUT, SEMICONDUCTOR DEVICE, PROGRAM FOR S...
- Publication number 20140183702
- Publication date Jul 3, 2014
- KABUSHIKI KAISHA TOSHIBA
- Chikaaki KODAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN METHOD OF WIRING LAYOUT, SEMICONDUCTOR DEVICE, PROGRAM FOR S...
- Publication number 20140131879
- Publication date May 15, 2014
- KABUSHIKI KAISHA TOSHIBA
- Chikaaki KODAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DATA GENERATION METHOD, PATTERN VERIFICATION METHOD, AND OP...
- Publication number 20140059502
- Publication date Feb 27, 2014
- Kabushiki Kaisha Toshiba
- Seiro MIYOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20140017887
- Publication date Jan 16, 2014
- Kabushiki Kaisha Toshiba
- Fumiharu NAKAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN METHOD OF WIRING LAYOUT, SEMICONDUCTOR DEVICE, PROGRAM FOR S...
- Publication number 20130168827
- Publication date Jul 4, 2013
- KABUSHIKI KAISHA TOSHIBA
- Chikaaki Kodama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN DATA OPTIMIZATION METHOD, STORAGE MEDIUM INCLUDING PROGRAM F...
- Publication number 20130111416
- Publication date May 2, 2013
- Shinichi NAKAGAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK INSPECTION METHOD, MASK PRODUCTION METHOD, SEMICONDUCTOR DEVIC...
- Publication number 20120311511
- Publication date Dec 6, 2012
- Takafumi TAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120241834
- Publication date Sep 27, 2012
- Fumiharu Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN CORRECTING METHOD, MASK FORMING METHOD, AND METHOD OF MANUF...
- Publication number 20120246601
- Publication date Sep 27, 2012
- Masanari KAJIWARA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND COMPUTER READABLE...
- Publication number 20120184109
- Publication date Jul 19, 2012
- Kabushiki Kaisha Toshiba
- Hiromitsu MASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASK PATTERN GENERATING METHOD, MANUFACTURING METHOD OF SEMICONDUCT...
- Publication number 20120183906
- Publication date Jul 19, 2012
- Chikaaki KODAMA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN LAYOUT IN SEMICONDUCTOR DEVICE
- Publication number 20120106282
- Publication date May 3, 2012
- Go Shikata
- G11 - INFORMATION STORAGE
Information Patent Application
PATTERN DIMENSION CALCULATION METHOD AND COMPUTER PROGRAM PRODUCT
- Publication number 20110307845
- Publication date Dec 15, 2011
- Takafumi TAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK PATTERN DETERMINING METHOD, MASK MANUFACTURING METHOD, AND DEV...
- Publication number 20110065030
- Publication date Mar 17, 2011
- Toshiya KOTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DETERMINING METHOD
- Publication number 20110047518
- Publication date Feb 24, 2011
- Issui Aiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING AN IMPROVED LITHOGRAPHIC MARGIN
- Publication number 20100314771
- Publication date Dec 16, 2010
- Yoshikazu HOSOMURA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN GENERATING METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DE...
- Publication number 20100241261
- Publication date Sep 23, 2010
- Takafumi TAGUCHI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK VERIFICATION METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DEV...
- Publication number 20100168895
- Publication date Jul 1, 2010
- Hiromitsu MASHITA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20100081265
- Publication date Apr 1, 2010
- Hiromitsu Mashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN PREDICTING METHOD, RECORDING MEDIA AND METHOD OF FABRICATIN...
- Publication number 20100035168
- Publication date Feb 11, 2010
- Fumiharu NAKAJIMA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DESIGN LAYOUT DATA CREATING METHOD, COMPUTER PROGRAM PRODUCT, AND M...
- Publication number 20100003819
- Publication date Jan 7, 2010
- Takafumi TAGUCHI
- G06 - COMPUTING CALCULATING COUNTING

Fumiharu Nakajima

Person

Patents Grantslast 30 patents

Semiconductor device, semiconductor memory device, and manufacturin...

Mask pattern verification method

Semiconductor device having a wiring line with an end portion havin...

Method of wiring layout, semiconductor device, program for supporti...

Method of wiring layout, semiconductor device, program for supporti...

Semiconductor device having contacts in drawing area and the contac...

Semiconductor device and method of manufacturing the semiconductor...

Semiconductor device and method of manufacturing the semiconductor...

Pattern data generation method, pattern verification method, and op...

Method of manufacturing semiconductor device using sidewall films f...

Pattern data generation method, pattern verification method, and op...

Method of manufacturing semiconductor device and computer readable...

Pattern layout in semiconductor device

Mask pattern generating method and computer program product

Pattern correcting method, mask forming method, and method of manuf...

Pattern generation method, computer-readable recording medium, and...

Pattern dimension calculation method and computer program product

Pattern generating method, method of manufacturing semiconductor de...

Method for manufacturing semiconductor device and computer readable...

Method for manufacturing semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY DEVICE, AND MANUFACTURIN...

MASK PATTERN VERIFICATION METHOD

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

PATTERN DATA GENERATION METHOD, PATTERN VERIFICATION METHOD, AND OP...

DESIGN METHOD OF WIRING LAYOUT, SEMICONDUCTOR DEVICE, PROGRAM FOR S...

DESIGN METHOD OF WIRING LAYOUT, SEMICONDUCTOR DEVICE, PROGRAM FOR S...

DESIGN METHOD OF WIRING LAYOUT, SEMICONDUCTOR DEVICE, PROGRAM FOR S...

PATTERN DATA GENERATION METHOD, PATTERN VERIFICATION METHOD, AND OP...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

DESIGN METHOD OF WIRING LAYOUT, SEMICONDUCTOR DEVICE, PROGRAM FOR S...

DESIGN DATA OPTIMIZATION METHOD, STORAGE MEDIUM INCLUDING PROGRAM F...

MASK INSPECTION METHOD, MASK PRODUCTION METHOD, SEMICONDUCTOR DEVIC...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

PATTERN CORRECTING METHOD, MASK FORMING METHOD, AND METHOD OF MANUF...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND COMPUTER READABLE...

MASK PATTERN GENERATING METHOD, MANUFACTURING METHOD OF SEMICONDUCT...

PATTERN LAYOUT IN SEMICONDUCTOR DEVICE

PATTERN DIMENSION CALCULATION METHOD AND COMPUTER PROGRAM PRODUCT

MASK PATTERN DETERMINING METHOD, MASK MANUFACTURING METHOD, AND DEV...

PATTERN DETERMINING METHOD

SEMICONDUCTOR DEVICE INCLUDING AN IMPROVED LITHOGRAPHIC MARGIN

PATTERN GENERATING METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DE...

MASK VERIFICATION METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DEV...

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

PATTERN PREDICTING METHOD, RECORDING MEDIA AND METHOD OF FABRICATIN...

DESIGN LAYOUT DATA CREATING METHOD, COMPUTER PROGRAM PRODUCT, AND M...