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Fumio Hosokawa
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Beam alignment method and electron microscope
Patent number
10,020,162
Issue date
Jul 10, 2018
Jeol Ltd.
Yuko Shimizu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Chromatic aberration corrector and method of controlling same
Patent number
8,952,339
Issue date
Feb 10, 2015
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Chromatic aberration corrector and electron microscope
Patent number
8,785,880
Issue date
Jul 22, 2014
Jeol Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope
Patent number
8,664,599
Issue date
Mar 4, 2014
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Chromatic aberration corrector for charged-particle beam system and...
Patent number
8,178,850
Issue date
May 15, 2012
Jeol Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of aberration correction and electron beam system
Patent number
7,763,862
Issue date
Jul 27, 2010
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged-particle beam system
Patent number
7,598,496
Issue date
Oct 6, 2009
Jeol Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope
Patent number
7,420,179
Issue date
Sep 2, 2008
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multipole field-producing apparatus in charged-particle optical sys...
Patent number
7,060,985
Issue date
Jun 13, 2006
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged-particle beam apparatus equipped with aberration corrector
Patent number
6,924,488
Issue date
Aug 2, 2005
Jeol Ltd.
Miyuki Matsuya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spherical aberration corrector for electron microscope
Patent number
6,836,373
Issue date
Dec 28, 2004
Jeol Ltd.
Fumio Hosokawa
G01 - MEASURING TESTING
Information
Patent Grant
Lens system for phase plate for transmission electron microscope an...
Patent number
6,744,048
Issue date
Jun 1, 2004
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope
Patent number
6,555,818
Issue date
Apr 29, 2003
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stigmator assembly
Patent number
6,548,816
Issue date
Apr 15, 2003
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope and similar instruments
Patent number
6,448,555
Issue date
Sep 10, 2002
Jeol Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Beam Alignment Method and Electron Microscope
Publication number
20170301507
Publication date
Oct 19, 2017
JEOL Ltd.
Yuko Shimizu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHROMATIC ABERRATION CORRECTOR AND ELECTRON MICROSCOPE
Publication number
20140158901
Publication date
Jun 12, 2014
JEOL Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Chromatic Aberration Corrector and Method of Controlling Same
Publication number
20140054468
Publication date
Feb 27, 2014
JEOL Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope
Publication number
20100224781
Publication date
Sep 9, 2010
JEOL Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Chromatic Aberration Corrector for Charged-Particle Beam System and...
Publication number
20100084567
Publication date
Apr 8, 2010
JEOL Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged-Particle Beam System
Publication number
20080128635
Publication date
Jun 5, 2008
JEOL Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Aberration Corrector and Method of Aberration Correction
Publication number
20080093563
Publication date
Apr 24, 2008
JEOL Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Aberration Correction and Electron Beam System
Publication number
20080054186
Publication date
Mar 6, 2008
JEOL Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron microscope
Publication number
20070114403
Publication date
May 24, 2007
JEOL Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multipole field-producing apparatus in charged-particle optical sys...
Publication number
20050167607
Publication date
Aug 4, 2005
JEOL Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged-particle beam apparatus equipped with aberration corrector
Publication number
20040036030
Publication date
Feb 26, 2004
JEOL Ltd.
Miyuki Matsuya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Spherical aberration corrector for electron microscope
Publication number
20030029999
Publication date
Feb 13, 2003
JEOL Ltd.
Fumio Hosokawa
G01 - MEASURING TESTING
Information
Patent Application
Lens system for phase plate for transmission electron microscope an...
Publication number
20020148962
Publication date
Oct 17, 2002
JEOL Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Stigmator assembly
Publication number
20020121609
Publication date
Sep 5, 2002
JEOL Ltd.
Fumio Hosokawa
H01 - BASIC ELECTRIC ELEMENTS