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Fumito MIYAZAKI

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  • Yokohama Kanagawa, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,834,326
    • Issue date Dec 5, 2023
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,796,319
    • Issue date Oct 24, 2023
    • Kabushiki Kaisha Toshiba
    • Fumito Miyazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,680,800
    • Issue date Jun 20, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke Gando
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,656,079
    • Issue date May 23, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroki Hiraga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,630,121
    • Issue date Apr 18, 2023
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,531,042
    • Issue date Dec 20, 2022
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240019248
    • Publication date Jan 18, 2024
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230288202
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND MOVABLE BODY
    • Publication number 20230288445
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230152099
    • Publication date May 18, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230152097
    • Publication date May 18, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230062441
    • Publication date Mar 2, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220326013
    • Publication date Oct 13, 2022
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220276052
    • Publication date Sep 1, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220268583
    • Publication date Aug 25, 2022
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220259035
    • Publication date Aug 18, 2022
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220137085
    • Publication date May 5, 2022
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20210396780
    • Publication date Dec 23, 2021
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY