Gaozeng CUI

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BEIJING, CN

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for detecting a surface defect using interference...
- Patent number 11,940,377
- Issue date Mar 26, 2024
- Skyverse Technology Co., Ltd.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for conducting optical measurement usingfull Mueller matrix...
- Patent number 11,187,649
- Issue date Nov 30, 2021
- AK OPTICS TECHNOLOGY CO., LTD.
- Tao Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION DEVICE AND DETECTION METHOD
- Publication number 20210270725
- Publication date Sep 2, 2021
- SKYVERSE TECHNOLOGY CO., LTD.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONDUCTING OPTICAL MEASUREMENT USINGFULL MUELLER MATRIX...
- Publication number 20190317010
- Publication date Oct 17, 2019
- BEI OPTICS TECHNOLOGY COMPANY LIMITED
- Tao LIU
- G01 - MEASURING TESTING