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Gary Bultman
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Los Altos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Equipment front end module for transferring wafers and method of tr...
Patent number
9,818,633
Issue date
Nov 14, 2017
Lam Research Corporation
Thorsten Lill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for determining a critical dimension and overla...
Patent number
8,502,979
Issue date
Aug 6, 2013
KLA-Tencor Technologies Corp.
Ady Levy
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a critical dimension and overla...
Patent number
8,179,530
Issue date
May 15, 2012
KLA-Tencor Technologies Corp.
Ady Levy
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a critical dimension and overla...
Patent number
7,751,046
Issue date
Jul 6, 2010
KLA-Tencor Technologies Corp.
Ady Levy
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a presence of macro and micro d...
Patent number
7,460,981
Issue date
Dec 2, 2008
KLA-Tencor Technologies Corp.
Gary Bultman
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a property of a specimen prior...
Patent number
7,349,090
Issue date
Mar 25, 2008
KLA-Tencor Technologies Corp.
Dan Wack
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a thin film characteristic and...
Patent number
7,196,782
Issue date
Mar 27, 2007
KLA-Tencor Technologies Corp.
John Fielden
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a composition and a thickness o...
Patent number
7,139,083
Issue date
Nov 21, 2006
KLA-Tencor Technologies Corp.
John Fielden
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining an adhesion characteristic and...
Patent number
7,130,029
Issue date
Oct 31, 2006
KLA-Tencor Technologies Corp.
Dan Wack
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a presence of defects and a thi...
Patent number
7,106,425
Issue date
Sep 12, 2006
KLA-Tencor Technologies Corp.
Gary Bultman
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining overlay and flatness of a specimen
Patent number
7,006,235
Issue date
Feb 28, 2006
KLA-Tencor Technologies Corp.
Ady Levy
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a thickness of a structure on a...
Patent number
6,950,196
Issue date
Sep 27, 2005
KLA-Tencor Technologies Corp.
John Fielden
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a characteristic of a layer for...
Patent number
6,946,394
Issue date
Sep 20, 2005
KLA Tencor Technologies
John Fielden
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a critical dimension, a presenc...
Patent number
6,919,957
Issue date
Jul 19, 2005
KLA-Tencor Technologies Corp.
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining flatness, a presence of defects...
Patent number
6,917,419
Issue date
Jul 12, 2005
KLA-Tencor Technologies Corp.
John Fielden
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a property of a specimen prior...
Patent number
6,917,433
Issue date
Jul 12, 2005
KLA-Tencor Technologies Corp.
Ady Levy
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a critical dimension and overla...
Patent number
6,891,627
Issue date
May 10, 2005
KLA-Tencor Technologies Corp.
Ady Levy
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining an implant characteristic and a...
Patent number
6,891,610
Issue date
May 10, 2005
KLA-Tencor Technologies Corp.
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a presence of macro and micro d...
Patent number
6,829,559
Issue date
Dec 7, 2004
KLA Tencor Technologies
Gary Bultman
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a presence of macro defects and...
Patent number
6,818,459
Issue date
Nov 16, 2004
KLA-Tencor Technologies Corp.
Dan Wack
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a characteristic of a specimen...
Patent number
6,812,045
Issue date
Nov 2, 2004
KLA-Tencor, Inc.
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining at least one characteristic of...
Patent number
6,806,951
Issue date
Oct 19, 2004
KLA-Tencor Technologies Corp.
Dan Wack
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a critical dimension an a prese...
Patent number
6,782,337
Issue date
Aug 24, 2004
KLA-Tencor Technologies Corp.
Dan Wack
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining at least four properties of a s...
Patent number
6,694,284
Issue date
Feb 17, 2004
KLA-Tencor Technologies Corp.
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a presence of macro defects and...
Patent number
6,673,637
Issue date
Jan 6, 2004
KLA Tencor Technologies
Dan Wack
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a critical dimension and a thin...
Patent number
6,633,831
Issue date
Oct 14, 2003
KLA Tencor Technologies
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
EQUIPMENT FRONT END MODULE FOR TRANSFERRING WAFERS AND METHOD OF TR...
Publication number
20160111309
Publication date
Apr 21, 2016
LAM RESEARCH CORPORATION
Thorsten Lill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods and Systems for Determining a Critical Dimension and Overla...
Publication number
20130314710
Publication date
Nov 28, 2013
KLA-Tencor Technologies Corporation
Ady Levy
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...
Publication number
20130039460
Publication date
Feb 14, 2013
KLA-Tencor Technologies Corporation
Ady Levy
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...
Publication number
20100271621
Publication date
Oct 28, 2010
KLA-Tencor Technologies Corporation
Ady Levy
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a presence of macro and micro d...
Publication number
20060072807
Publication date
Apr 6, 2006
KLA-Tencor Technologies.
Gary Bultman
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a critical dimension and overla...
Publication number
20040235205
Publication date
Nov 25, 2004
KLA-Tencor, Inc.
Ady Levy
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a presence of macro defects and...
Publication number
20040115843
Publication date
Jun 17, 2004
KLA-Tencor, Inc.
Dan Wack
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a presence of macro and micro d...
Publication number
20040092045
Publication date
May 13, 2004
Gary Bultman
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a critical dimension and a thin...
Publication number
20040073398
Publication date
Apr 15, 2004
KLA-Tencor, Inc.
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining overlay and flatness of a specimen
Publication number
20030011786
Publication date
Jan 16, 2003
Ady Levy
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a characteristic of micro defec...
Publication number
20020190207
Publication date
Dec 19, 2002
Ady Levy
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a property of a specimen prior...
Publication number
20020188417
Publication date
Dec 12, 2002
Ady Levy
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining an adhesion characteristic and...
Publication number
20020180961
Publication date
Dec 5, 2002
Dan Wack
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a presence of macro defects and...
Publication number
20020182760
Publication date
Dec 5, 2002
Dan Wack
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a thin film characteristic and...
Publication number
20020179864
Publication date
Dec 5, 2002
John Fielden
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a critical dimension, a presenc...
Publication number
20020180986
Publication date
Dec 5, 2002
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining flatness, a presence of defects...
Publication number
20020179867
Publication date
Dec 5, 2002
John Fielden
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining at least one characteristic of...
Publication number
20020180985
Publication date
Dec 5, 2002
Dan Wack
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a critical dimension and a thin...
Publication number
20020107660
Publication date
Aug 8, 2002
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a property of a specimen prior...
Publication number
20020106848
Publication date
Aug 8, 2002
Dan Wack
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a critical dimension and a pres...
Publication number
20020107650
Publication date
Aug 8, 2002
Dan Wack
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a composition and a thickness o...
Publication number
20020103564
Publication date
Aug 1, 2002
John Fielden
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a characteristic of a layer for...
Publication number
20020102749
Publication date
Aug 1, 2002
John Fielden
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining a thickness of a structure on a...
Publication number
20020097406
Publication date
Jul 25, 2002
John Fielden
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for determining an implant characterstic and a...
Publication number
20020093648
Publication date
Jul 18, 2002
Mehrdad Nikoonahad
G01 - MEASURING TESTING