Gary E. Sommargren

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Application of the phase shifting diffraction interferometer for me...
- Patent number 6,909,510
- Issue date Jun 21, 2005
- The Regents of the University of California
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Absolute calibration of optical flats
- Patent number 6,876,456
- Issue date Apr 5, 2005
- The Regents of the University of California
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Application of the phase shifting diffraction interferometer for me...
- Patent number 6,704,112
- Issue date Mar 9, 2004
- The Regents of the University of California
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of lithographic mask blanks for defects
- Patent number 6,177,993
- Issue date Jan 23, 2001
- The Regents of the University of California
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Embedded fiducials in optical surfaces
- Patent number 6,014,264
- Issue date Jan 11, 2000
- The Regents of the University of California
- Gary E. Sommargren
- G02 - OPTICS
Information Patent Grant
Micromachined electrostatic vertical actuator
- Patent number 5,969,848
- Issue date Oct 19, 1999
- The Regents of the University of California
- Abraham P. Lee
- G02 - OPTICS
Information Patent Grant
Phase shifting interferometer
- Patent number 5,933,236
- Issue date Aug 3, 1999
- The Regents of the University of California
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for increasing the frequency difference and stability of...
- Patent number 5,586,133
- Issue date Dec 17, 1996
- DeBell; Gary W.
- Gary E. Sommargren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase shifting diffraction interferometer
- Patent number 5,548,403
- Issue date Aug 20, 1996
- The Regents of the University of California
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Flying height and topography measuring interferometer
- Patent number 5,218,424
- Issue date Jun 8, 1993
- Zygo Corporation
- Gary E. Sommargren
- G11 - INFORMATION STORAGE
Information Patent Grant
High accuracy linear displacement interferometer with probe
- Patent number 5,133,599
- Issue date Jul 28, 1992
- Zygo Corporation
- Gary E. Sommargren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Angular displacement measuring interferometer
- Patent number 5,028,137
- Issue date Jul 2, 1991
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
An image focusing means by using an opaque object to diffract x-rays
- Patent number 5,022,061
- Issue date Jun 4, 1991
- The United States of America as represented by the United States Department o...
- Gary E. Sommargren
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for generating a straight reference line
- Patent number 4,963,022
- Issue date Oct 16, 1990
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
High accuracy differential plane mirror interferometer
- Patent number 4,950,078
- Issue date Aug 21, 1990
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Linear and angular displacement measuring interferometer
- Patent number 4,881,815
- Issue date Nov 21, 1989
- Zygo, Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Linear and angular displacement measuring interferometer
- Patent number 4,859,066
- Issue date Aug 22, 1989
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Angular displacement measuring interferometer
- Patent number 4,807,997
- Issue date Feb 28, 1989
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Differential plane mirror interferometer having beamsplitter/beam f...
- Patent number 4,802,764
- Issue date Feb 7, 1989
- Peter S. Young
- G01 - MEASURING TESTING
Information Patent Grant
Differential plane mirror having beamsplitter/beam folder assembly
- Patent number 4,802,765
- Issue date Feb 7, 1989
- Zygo Corporation
- Peter S. Young
- G01 - MEASURING TESTING
Information Patent Grant
Straightness of travel interferometer
- Patent number 4,787,747
- Issue date Nov 29, 1988
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Differential plane mirror interferometer
- Patent number 4,752,133
- Issue date Jun 21, 1988
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Angle measuring interferometer
- Patent number 4,746,216
- Issue date May 24, 1988
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for the measurement of the refractive index of a gas
- Patent number 4,733,967
- Issue date Mar 29, 1988
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Angle measuring interferometer
- Patent number 4,717,250
- Issue date Jan 5, 1988
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Differential plane mirror interferometer
- Patent number 4,693,605
- Issue date Sep 15, 1987
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne interferometer system
- Patent number 4,688,940
- Issue date Aug 25, 1987
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to transform a single frequency, linearly polarized laser...
- Patent number 4,687,958
- Issue date Aug 18, 1987
- Zygo Corporation
- Gary E. Sommargren
- G02 - OPTICS
Information Patent Grant
Method and apparatus for the measurement of the refractive index of...
- Patent number 4,685,803
- Issue date Aug 11, 1987
- Zygo Corporation
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to transform a single frequency, linearly polarized laser...
- Patent number 4,684,828
- Issue date Aug 4, 1987
- Zygo Corporation
- Gary E. Sommargren
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Application of the phase shifting diffraction interferometer for me...
- Publication number 20040150834
- Publication date Aug 5, 2004
- The Regents of the University of California.
- Gary E. Sommargren
- G01 - MEASURING TESTING
Information Patent Application
Absolute calibration of optical flats
- Publication number 20040061866
- Publication date Apr 1, 2004
- The Regents of the University of California.
- Gary E. Sommargren
- G01 - MEASURING TESTING

Gary E. Sommargren

Person

Patents Grantslast 30 patents

Application of the phase shifting diffraction interferometer for me...

Absolute calibration of optical flats

Application of the phase shifting diffraction interferometer for me...

Inspection of lithographic mask blanks for defects

Embedded fiducials in optical surfaces

Micromachined electrostatic vertical actuator

Phase shifting interferometer

Apparatus for increasing the frequency difference and stability of...

Phase shifting diffraction interferometer

Flying height and topography measuring interferometer

High accuracy linear displacement interferometer with probe

Angular displacement measuring interferometer

An image focusing means by using an opaque object to diffract x-rays

Method and apparatus for generating a straight reference line

High accuracy differential plane mirror interferometer

Linear and angular displacement measuring interferometer

Linear and angular displacement measuring interferometer

Angular displacement measuring interferometer

Differential plane mirror interferometer having beamsplitter/beam f...

Differential plane mirror having beamsplitter/beam folder assembly

Straightness of travel interferometer

Differential plane mirror interferometer

Angle measuring interferometer

Apparatus for the measurement of the refractive index of a gas

Angle measuring interferometer

Differential plane mirror interferometer

Heterodyne interferometer system

Apparatus to transform a single frequency, linearly polarized laser...

Method and apparatus for the measurement of the refractive index of...

Apparatus to transform a single frequency, linearly polarized laser...

Patents Applicationslast 30 patents

Application of the phase shifting diffraction interferometer for me...

Absolute calibration of optical flats