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Gary Rogers
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Mesa, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for energy recovery
Patent number
11,009,540
Issue date
May 18, 2021
Steven T. Clauter
G01 - MEASURING TESTING
Information
Patent Grant
Damage reduction method and apparatus for destructive testing of po...
Patent number
9,759,763
Issue date
Sep 12, 2017
Integrated Technology Corporation
Rodney E. Schwartz
G01 - MEASURING TESTING
Information
Patent Grant
High current Kelvin connection and verification method
Patent number
9,304,147
Issue date
Apr 5, 2016
Integrated Technology Corporation
Rodney Schwartz
G01 - MEASURING TESTING
Information
Patent Grant
Probe needle protection method for high current probe testing of po...
Patent number
7,521,947
Issue date
Apr 21, 2009
Integrated Technology Corporation
Gary Rogers
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit probe card inspection system
Patent number
6,118,894
Issue date
Sep 12, 2000
Rodney E. Schwartz
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit probe card inspection system
Patent number
5,657,394
Issue date
Aug 12, 1997
Integrated Technology Corporation
Rodney E. Schwartz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR PERFORMING AVALANCHE MODE DELTA VSD TESTING
Publication number
20180321304
Publication date
Nov 8, 2018
INTEGRATED TECHNOLOGY CORPORATION
Steven T. Clauter
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR ENERGY RECOVERY
Publication number
20180259568
Publication date
Sep 13, 2018
INTEGRATED TECHNOLOGY CORPORATION
Steven T. Clauter
G01 - MEASURING TESTING
Information
Patent Application
HIGH CURRENT KELVIN CONNECTION AND VERIFICATION METHOD
Publication number
20140354319
Publication date
Dec 4, 2014
Rodney Schwartz
G01 - MEASURING TESTING
Information
Patent Application
DAMAGE REDUCTION METHOD AND APPARATUS FOR DESTRUCTIVE TESTING OF PO...
Publication number
20130027067
Publication date
Jan 31, 2013
INTEGRATED TECHNOLOGY CORPORATION
Rodney E. Schwartz
G01 - MEASURING TESTING
Information
Patent Application
High Current Kelvin Connections and Contact Resistance Verification...
Publication number
20110309847
Publication date
Dec 22, 2011
Rodney Schwartz
G01 - MEASURING TESTING
Information
Patent Application
PROBE NEEDLE PROTECTION METHOD FOR HIGH CURRENT PROBE TESTING OF PO...
Publication number
20080290882
Publication date
Nov 27, 2008
INTEGRATED TECHNOLOGY CORPORATION
Gary Rogers
G01 - MEASURING TESTING