Avon, OH, US
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Patent Grant
United States of America as represented by the Administrator of National Aero...
Azlin M. Biaggi-Labiosa
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Grant
United States of America as represented by the Administrator of National Aero...
Gary W Hunter
G01 - MEASURING TESTING
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Patent Grant
The United States of America as Represented by the Administrator of National...
Azlin M. Biaggi-Labiosa
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Grant
The United States of America as Represented by the Administrator of National...
Jennifer Xu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by the Adminstrator of National A...
Gary W Hunter
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America as Represented by the Administrator of National...
Gary W. Hunter
G01 - MEASURING TESTING
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Patent Grant
The United States of America as Represented by the Administrator of National...
Gary W. Hunter
G01 - MEASURING TESTING
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Patent Grant
The United States of America as Represented by the Administrator of National...
Gary W. Hunter
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the National Aeronautics and S...
Gary W. Hunter
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Administrator of Natural A...
Gary W. Hunter
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Gary William Hunter
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Gary William Hunter
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Gary W. Hunter
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Gary W. Hunter
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
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Patent Application
United States of America as represented by the Administrator of NASA
Jennifer Xu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Cleveland Clinic Foundation
Gary W. Hunter
G01 - MEASURING TESTING
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Patent Application
The Cleveland Clinic Foundation
Gary W. Hunter
G01 - MEASURING TESTING
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Patent Application
Gary W. Hunter
G01 - MEASURING TESTING
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Patent Application
Gary W. Hunter
G01 - MEASURING TESTING
