Geert Van der Plas

Person

Leuven, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with 3D partitioning
- Patent number 11,822,475
- Issue date Nov 21, 2023
- Imec VZW
- Manu Komalan Perumkunnil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inducing stress in semiconductor devices
- Patent number 11,757,039
- Issue date Sep 12, 2023
- Imec VZW
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bipolar selector device for a memory array
- Patent number 11,621,295
- Issue date Apr 4, 2023
- Imec VZW
- Gaspard Hiblot
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with backside power delivery network and backsid...
- Patent number 11,257,764
- Issue date Feb 22, 2022
- Imec VZW
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical isolated gate field effect transistor integrated in a semi...
- Patent number 11,121,086
- Issue date Sep 14, 2021
- Imec VZW
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for bonding and interconnecting semiconductor chips
- Patent number 11,114,337
- Issue date Sep 7, 2021
- Imec VZW
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor fin structures having silicided portions
- Patent number 10,998,413
- Issue date May 4, 2021
- Imec VZW
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit manufactured using a plasma-proces...
- Patent number 10,825,806
- Issue date Nov 3, 2020
- Imec VZW
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a through semiconductor via connection
- Patent number 10,811,315
- Issue date Oct 20, 2020
- Imec VZW
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress sensor for semiconductor components
- Patent number 10,607,901
- Issue date Mar 31, 2020
- Imec VZW
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assembly of integrated circuit modules and method for identifying t...
- Patent number 10,382,042
- Issue date Aug 13, 2019
- Imec VZW
- Roeland Vandebriel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of forming a junction field effect transistor
- Patent number 9,847,336
- Issue date Dec 19, 2017
- Imec VZW
- Geert Hellings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for measuring capacitance difference between capa...
- Patent number 9,411,000
- Issue date Aug 9, 2016
- IMEC
- Geert Van der Plas
- G01 - MEASURING TESTING
Information Patent Grant
Micro-mirror arrays
- Patent number 9,217,861
- Issue date Dec 22, 2015
- Imec VZW
- Murali Jayapala
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Calibration of micro-mirror arrays
- Patent number 9,201,241
- Issue date Dec 1, 2015
- IMEC
- Murali Jayapala
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Holographic visualization system comprising a high data refresh rat...
- Patent number 8,625,187
- Issue date Jan 7, 2014
- IMEC
- Geert Van Der Plas
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method and device for testing TSVS in a 3D chip stack
- Patent number 8,593,170
- Issue date Nov 26, 2013
- IMEC
- Geert Van der Plas
- G01 - MEASURING TESTING
Information Patent Grant
Comparator based asynchronous binary search A/D converter
- Patent number 8,199,043
- Issue date Jun 12, 2012
- IMEC
- Geert Van der Plas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A/D converter comprising a voltage comparator device
- Patent number 7,773,010
- Issue date Aug 10, 2010
- IMEC
- Geert Van der Plas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A/D converter comprising a voltage comparator device
- Patent number 7,652,600
- Issue date Jan 26, 2010
- IMEC
- Geert Van der Plas
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
MICRO-ELECTRONIC COMPONENT COMBINING POWER DELIVERY AND COOLING FRO...
- Publication number 20240213120
- Publication date Jun 27, 2024
- IMEC vzw
- Herman Oprins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR COMPONENT INCLUDING BACK SIDE INPUT/OUTPUT SIGNAL ROU...
- Publication number 20230170297
- Publication date Jun 1, 2023
- IMEC vzw
- Shih-Hung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Structure with an Epitaxial Layer Stack for Fabricati...
- Publication number 20230025767
- Publication date Jan 26, 2023
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PRODUCING A GATE CUT IN A SEMICONDUCTOR COMPONENT
- Publication number 20220238388
- Publication date Jul 28, 2022
- IMEC vzw
- Gaspard HIBLOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with 3D Partitioning
- Publication number 20220214972
- Publication date Jul 7, 2022
- IMEC vzw
- Manu Komalan Perumkunnil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRODE ARRANGEMENT, A NEURAL PROBE, AND A METHOD FOR MANUFACTURI...
- Publication number 20220157704
- Publication date May 19, 2022
- IMEC vzw
- Gaspard HIBLOT
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method for Inducing Stress in Semiconductor Devices
- Publication number 20210408287
- Publication date Dec 30, 2021
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIPOLAR SELECTOR DEVICE FOR A MEMORY ARRAY
- Publication number 20210143211
- Publication date May 13, 2021
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH BACKSIDE POWER DELIVERY NETWORK AND BACKSID...
- Publication number 20200373242
- Publication date Nov 26, 2020
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR BONDING AND INTERCONNECTING SEMICONDUCTOR CHIPS
- Publication number 20200203224
- Publication date Jun 25, 2020
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL ISOLATED GATE FIELD EFFECT TRANSISTOR INTEGRATED IN A SEMI...
- Publication number 20200203276
- Publication date Jun 25, 2020
- IMEC vzw
- Gaspard Hiblot
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR FIN STRUCTURES HAVING SILICIDED PORTIONS
- Publication number 20200194567
- Publication date Jun 18, 2020
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A THROUGH SEMICONDUCTOR VIA CONNECTION
- Publication number 20200006142
- Publication date Jan 2, 2020
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURED USING A PLASMA-PROCES...
- Publication number 20190181133
- Publication date Jun 13, 2019
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSEMBLY OF INTEGRATED CIRCUIT MODULES AND METHOD FOR IDENTIFYING T...
- Publication number 20190165791
- Publication date May 30, 2019
- IMEC vzw
- Roeland Vandebriel
- G11 - INFORMATION STORAGE
Information Patent Application
Stress Sensor for Semiconductor Components
- Publication number 20190074231
- Publication date Mar 7, 2019
- IMEC vzw
- Gaspard Hiblot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A JUNCTION FIELD EFFECT TRANSISTOR
- Publication number 20170062431
- Publication date Mar 2, 2017
- IMEC vzw
- Geert Hellings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPA...
- Publication number 20140372057
- Publication date Dec 18, 2014
- Geert Van der Plas
- G01 - MEASURING TESTING
Information Patent Application
Micro-Mirror Arrays
- Publication number 20140368920
- Publication date Dec 18, 2014
- IMEC vzw
- Murali Jayapala
- G02 - OPTICS
Information Patent Application
Calibration of Micro-Mirror Arrays
- Publication number 20130187669
- Publication date Jul 25, 2013
- IMEC
- Murali Jayapala
- G02 - OPTICS
Information Patent Application
Oven Controlled MEMS Oscillator Device
- Publication number 20120305542
- Publication date Dec 6, 2012
- IMEC
- Stephane Donnay
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HOLOGRAPHIC VISUALIZATION SYSTEM COMPRISING A HIGH DATA REFRESH RAT...
- Publication number 20120127559
- Publication date May 24, 2012
- IMEC
- Geert VAN DER PLAS
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
CAPACITANCE MEASUREMENT IN MICROCHIPS
- Publication number 20120025841
- Publication date Feb 2, 2012
- IMEC
- Jaemin Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR TESTING TSVS IN A 3D CHIP STACK
- Publication number 20110102011
- Publication date May 5, 2011
- IMEC
- Geert Van der Plas
- G01 - MEASURING TESTING
Information Patent Application
Comparator Based Asynchronous Binary Search A/D Conveter
- Publication number 20100328120
- Publication date Dec 30, 2010
- IMEC
- Geert Van der Plas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Sigma-delta-based analog-to-digital converter
- Publication number 20100283649
- Publication date Nov 11, 2010
- IMEC
- Lynn Bos
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A/D Converter Comprising a Voltage Comparator Device
- Publication number 20090195424
- Publication date Aug 6, 2009
- Interuniversitair Microelektronica Centrum (IMEC)
- Geert Van Der Plas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A/D Converter Comprising a Voltage Comparator Device
- Publication number 20090066555
- Publication date Mar 12, 2009
- Interuniversitair Microelektronica Centrum(IMEC)
- Geert Van Der Plas
- H03 - BASIC ELECTRONIC CIRCUITRY

Geert Van der Plas

Person

Patents Grantslast 30 patents

Integrated circuit with 3D partitioning

Method for inducing stress in semiconductor devices

Bipolar selector device for a memory array

Integrated circuit with backside power delivery network and backsid...

Vertical isolated gate field effect transistor integrated in a semi...

Method for bonding and interconnecting semiconductor chips

Semiconductor fin structures having silicided portions

Semiconductor integrated circuit manufactured using a plasma-proces...

Method for producing a through semiconductor via connection

Stress sensor for semiconductor components

Assembly of integrated circuit modules and method for identifying t...

Method of forming a junction field effect transistor

Method and system for measuring capacitance difference between capa...

Micro-mirror arrays

Calibration of micro-mirror arrays

Holographic visualization system comprising a high data refresh rat...

Method and device for testing TSVS in a 3D chip stack

Comparator based asynchronous binary search A/D converter

A/D converter comprising a voltage comparator device

A/D converter comprising a voltage comparator device

Patents Applicationslast 30 patents

MICRO-ELECTRONIC COMPONENT COMBINING POWER DELIVERY AND COOLING FRO...

SEMICONDUCTOR COMPONENT INCLUDING BACK SIDE INPUT/OUTPUT SIGNAL ROU...

Semiconductor Structure with an Epitaxial Layer Stack for Fabricati...

METHOD OF PRODUCING A GATE CUT IN A SEMICONDUCTOR COMPONENT

Integrated Circuit with 3D Partitioning

ELECTRODE ARRANGEMENT, A NEURAL PROBE, AND A METHOD FOR MANUFACTURI...

Method for Inducing Stress in Semiconductor Devices

BIPOLAR SELECTOR DEVICE FOR A MEMORY ARRAY

INTEGRATED CIRCUIT WITH BACKSIDE POWER DELIVERY NETWORK AND BACKSID...

METHOD FOR BONDING AND INTERCONNECTING SEMICONDUCTOR CHIPS

VERTICAL ISOLATED GATE FIELD EFFECT TRANSISTOR INTEGRATED IN A SEMI...

SEMICONDUCTOR FIN STRUCTURES HAVING SILICIDED PORTIONS

METHOD FOR PRODUCING A THROUGH SEMICONDUCTOR VIA CONNECTION

SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURED USING A PLASMA-PROCES...

ASSEMBLY OF INTEGRATED CIRCUIT MODULES AND METHOD FOR IDENTIFYING T...

Stress Sensor for Semiconductor Components

METHOD OF FORMING A JUNCTION FIELD EFFECT TRANSISTOR

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPA...

Micro-Mirror Arrays

Calibration of Micro-Mirror Arrays

Oven Controlled MEMS Oscillator Device

HOLOGRAPHIC VISUALIZATION SYSTEM COMPRISING A HIGH DATA REFRESH RAT...

CAPACITANCE MEASUREMENT IN MICROCHIPS

METHOD AND DEVICE FOR TESTING TSVS IN A 3D CHIP STACK

Comparator Based Asynchronous Binary Search A/D Conveter

Sigma-delta-based analog-to-digital converter

A/D Converter Comprising a Voltage Comparator Device

A/D Converter Comprising a Voltage Comparator Device