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Geoffrey P. O'Donoghue
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Andover, MA, US
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last 30 patents
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Patent Grant
Apparatus and method for detecting defects arising as a result of i...
Patent number
5,712,571
Issue date
Jan 27, 1998
Analog Devices, Inc.
Geoff O'Donoghue
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit interlevel conductor defect characterization tes...
Patent number
5,670,883
Issue date
Sep 23, 1997
Analog Devices, Inc.
Geoff O'Donoghue
G01 - MEASURING TESTING
Information
Patent Grant
Bitstream defect analysis method for integrated circuits
Patent number
5,497,381
Issue date
Mar 5, 1996
Analog Devices, Inc.
Geoffrey P. O'Donoghue
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Ripsaw analog-to-digital converter and method
Patent number
5,321,404
Issue date
Jun 14, 1994
Analog Devices, Inc.
A. Martin Mallinson
H03 - BASIC ELECTRONIC CIRCUITRY