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Georg Flatscher
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Schneizlreuth, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for manufacturing a scale, a scale manufactured according to...
Patent number
7,312,878
Issue date
Dec 25, 2007
Dr. Johannes Heidenhain GmbH
Peter Speckbacher
G02 - OPTICS
Information
Patent Grant
Method for producing a self-supporting electron-optical transparent...
Patent number
6,800,404
Issue date
Oct 5, 2004
Dr. Johannes Heidenhain GmbH
Peter Speckbacher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reflective measuring scale graduation and method for its manufacture
Patent number
6,671,092
Issue date
Dec 30, 2003
Johannes Heidenhain GmbH
Georg Flatscher
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric position measuring device
Patent number
6,445,456
Issue date
Sep 3, 2002
Dr. Johannas Heidenhain GmbH
Peter Speckbacher
G02 - OPTICS
Information
Patent Grant
Scale and method for making a scale
Patent number
5,880,882
Issue date
Mar 9, 1999
Dr. Johannes Heidenhain GmbH
Dieter Michel
G01 - MEASURING TESTING
Information
Patent Grant
Phase grating and method of producing phase grating
Patent number
5,786,931
Issue date
Jul 28, 1998
Johannes Heidenhain GmbH
Peter Speckbacher
G02 - OPTICS
Information
Patent Grant
Evaporator device for the evaporation of several materials
Patent number
4,632,059
Issue date
Dec 30, 1986
Dr. Johannes Heidenhain GmbH
Georg Flatscher
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
High resolution recording medium and method for producing same
Patent number
4,522,862
Issue date
Jun 11, 1985
Johannes Heidenhain GmbH
Erich Bayer
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
High resolution recording medium
Patent number
4,431,695
Issue date
Feb 14, 1984
Dr. Johannes Heidenhain GmbH
Georg Flatscher
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Method for producing a scale scale produced according to said metho...
Publication number
20050052743
Publication date
Mar 10, 2005
Peter Speckbacher
G02 - OPTICS
Information
Patent Application
Material measure in the form of an amplitude grating, as well as a...
Publication number
20040090677
Publication date
May 13, 2004
Michael Allgauer
G01 - MEASURING TESTING
Information
Patent Application
Method for producing a self-supporting electron-optical transparent...
Publication number
20030036022
Publication date
Feb 20, 2003
Peter Speckbacher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTOELECTRIC POSITION MEASURING DEVICE
Publication number
20010046055
Publication date
Nov 29, 2001
PETER SPECKBACHER
G01 - MEASURING TESTING
Information
Patent Application
Reflective measuring scale graduation and method for its manufacture
Publication number
20010021485
Publication date
Sep 13, 2001
Georg Flatscher
G01 - MEASURING TESTING