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George A. Soli
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Lancaster, CA, US
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last 30 patents
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Patent Grant
Advanced x-ray imaging spectrometer
Patent number
5,757,005
Issue date
May 26, 1998
California Institute of Technology
John L. Callas
G01 - MEASURING TESTING
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Patent Grant
Integrated charge monitor
Patent number
5,753,920
Issue date
May 19, 1998
California Institute of Technology
Martin G. Buehler
G01 - MEASURING TESTING
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Patent Grant
Method for characterizing the upset response of CMOS circuits using...
Patent number
5,396,169
Issue date
Mar 7, 1995
Lynx Golf Inc.
Martin G. Buehler
G11 - INFORMATION STORAGE