George E. Sery

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Charging sensor method and apparatus
- Patent number 6,960,784
- Issue date Nov 1, 2005
- Intel Corporation
- Wallace W. Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangements to reduce charging damage in structures of integrated...
- Patent number 6,624,480
- Issue date Sep 23, 2003
- Intel Corporation
- Wallace W. Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangements to reduce charging damage in structures of integrated...
- Patent number 6,566,716
- Issue date May 20, 2003
- Intel Corporation
- Wallace W. Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangements to reduce charging damage in structures of integrated...
- Patent number 6,414,358
- Issue date Jul 2, 2002
- Intel Corporation
- Wallace W. Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage MOS transistor for flash EEPROM applications having a...
- Patent number 6,127,696
- Issue date Oct 3, 2000
- Intel Corporation
- George E. Sery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating a high voltage MOS transistor for flash EEP...
- Patent number 5,668,034
- Issue date Sep 16, 1997
- Intel Corporation
- George E. Sery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a high voltage MOS transistor for flash EEPRO...
- Patent number 5,580,807
- Issue date Dec 3, 1996
- Intel Corporation
- George E. Sery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of interpoly dielctric for EPROM-related technologies
- Patent number 5,104,819
- Issue date Apr 14, 1992
- Intel Corporation
- Philip E. Freiberger
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charging sensor method and apparatus
- Publication number 20040256642
- Publication date Dec 23, 2004
- Wallace W. Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRANGEMENTS TO REDUCE CHARGING DAMAGE IN STRUCTURES OF INTEGRATED...
- Publication number 20030075762
- Publication date Apr 24, 2003
- Wallace W. Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrangements to reduce charging damage in structures of integrated...
- Publication number 20030068878
- Publication date Apr 10, 2003
- Wallace W. Lin
- H01 - BASIC ELECTRIC ELEMENTS

George E. Sery

Person

Patents Grantslast 30 patents

Charging sensor method and apparatus

Arrangements to reduce charging damage in structures of integrated...

Arrangements to reduce charging damage in structures of integrated...

Arrangements to reduce charging damage in structures of integrated...

High voltage MOS transistor for flash EEPROM applications having a...

Process for fabricating a high voltage MOS transistor for flash EEP...

Method of fabricating a high voltage MOS transistor for flash EEPRO...

Fabrication of interpoly dielctric for EPROM-related technologies

Patents Applicationslast 30 patents

Charging sensor method and apparatus

ARRANGEMENTS TO REDUCE CHARGING DAMAGE IN STRUCTURES OF INTEGRATED...

Arrangements to reduce charging damage in structures of integrated...