George Ernest Harris

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Garland, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
CAM test structures and methods therefor
- Patent number 7,376,871
- Issue date May 20, 2008
- Texas Instruments Incorporated
- George Ernest Harris
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for predicting burn-in conditions
- Patent number 6,968,287
- Issue date Nov 22, 2005
- Texas Instrustments Incorporated
- George E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Multi-state test structures and methods
- Patent number 6,844,751
- Issue date Jan 18, 2005
- Texas Instruments Incorporated
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Grant
Robust reference sensing cell for flash memory
- Patent number 6,597,035
- Issue date Jul 22, 2003
- Texas Instruments Incorporated
- George E. Harris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for decreasing CHC degradation
- Patent number 6,350,673
- Issue date Feb 26, 2002
- Texas Instruments Incorporated
- David L. Larkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Balanced reference sensing circuit
- Patent number 6,297,990
- Issue date Oct 2, 2001
- Texas Instruments Incorporated
- George E. Harris
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Wafer Fixture For Testing And Transport
- Publication number 20210208193
- Publication date Jul 8, 2021
- II-VI Delaware, Inc.
- Raven Persaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREDICTING BURN-IN CONDITIONS
- Publication number 20050222800
- Publication date Oct 6, 2005
- TEXAS INSTRUMENTS INCORPORATED
- George E. Harris
- G01 - MEASURING TESTING
Information Patent Application
CAM test structures and methods therefor
- Publication number 20050120283
- Publication date Jun 2, 2005
- George Ernest Harris
- G11 - INFORMATION STORAGE
Information Patent Application
Multi-state test structures and methods
- Publication number 20020047724
- Publication date Apr 25, 2002
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Application
Method for decreasing CHC degradation
- Publication number 20020030247
- Publication date Mar 14, 2002
- David L. Larkin
- H01 - BASIC ELECTRIC ELEMENTS