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George W. Hopkins II
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Graded thin film wedge interference filter and method of use for la...
Patent number
6,717,965
Issue date
Apr 6, 2004
Intel Corporation
George William Hopkins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas analyzer with arrangement for spray-cleaning optical element
Patent number
5,720,650
Issue date
Feb 24, 1998
Hewlett-Packard Company
Ganapati R. Mauze
G01 - MEASURING TESTING
Information
Patent Grant
Spectrograph with low focal ratio
Patent number
5,644,396
Issue date
Jul 1, 1997
Hewlett-Packard Company
George W. Hopkins
G01 - MEASURING TESTING
Information
Patent Grant
System for collecting weakly scattered electromagnetic radiation
Patent number
5,506,678
Issue date
Apr 9, 1996
Hewlett-Packard Company
William F. Carlsen
G01 - MEASURING TESTING
Information
Patent Grant
Raman spectroscopy of airway gases
Patent number
5,450,193
Issue date
Sep 12, 1995
Hewlett-Packard Company
William F. Carlsen
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
CCD camera and method for fundus imaging
Patent number
5,140,352
Issue date
Aug 18, 1992
Occipital, Inc.
Robert D. Moore
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Flat band optical relay using apertures and simple lenses
Patent number
4,784,487
Issue date
Nov 15, 1988
Hewlett-Packard Company
George W. Hopkins
G01 - MEASURING TESTING
Information
Patent Grant
Mask for spectrophotometer photodiode array having a bridge portion...
Patent number
4,746,793
Issue date
May 24, 1988
Hewlett-Packard Company
George W. Hopkins
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Graded thin film wedge interference filter and method of use for la...
Publication number
20030012230
Publication date
Jan 16, 2003
George W. Hopkins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detector array for optical spectrographs
Publication number
20020161289
Publication date
Oct 31, 2002
George W. Hopkins
G01 - MEASURING TESTING