Gerardus Nicolaas Anne van Veen

Follow

Person

Waalre, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Holder assembly for cooperating with an environmental cell and an e...
- Patent number 9,524,850
- Issue date Dec 20, 2016
- FEI Company
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for ex situ analysis of a substrate
- Patent number 8,884,247
- Issue date Nov 11, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Particle-optical device and detection means
- Patent number 6,972,412
- Issue date Dec 6, 2005
- FEI Company
- Jacob Johannes Scholtz
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Imaging a Sample with Multiple Beams and Multiple Detectors
- Publication number 20150279615
- Publication date Oct 1, 2015
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Ex Situ Analysis of a Substrate
- Publication number 20140084157
- Publication date Mar 27, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Application
Holder Assembly for Cooperating with an Environmental Cell and an E...
- Publication number 20130213439
- Publication date Aug 22, 2013
- DELFT UNIVERSITY OF TECHNOLOGY
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTOR FOR USE IN A CHARGED PARTICLE APPARATUS
- Publication number 20130099114
- Publication date Apr 25, 2013
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Application
Particle-optical device and detection means
- Publication number 20040124356
- Publication date Jul 1, 2004
- Jacob Johannes Scholtz
- H01 - BASIC ELECTRIC ELEMENTS