Gigi Olive GAMBRELL

Person

West Chester, OH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for testing a component
- Patent number 8,013,599
- Issue date Sep 6, 2011
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Multi-frequency image processing for inspecting parts having comple...
- Patent number 7,817,845
- Issue date Oct 19, 2010
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 7,689,030
- Issue date Mar 30, 2010
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 7,436,992
- Issue date Oct 14, 2008
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current inspection method and system
- Patent number 7,233,867
- Issue date Jun 19, 2007
- General Electric Company
- Preeti Pisupati
- G01 - MEASURING TESTING
Information Patent Grant
Omnidirectional eddy current probe and inspection system
- Patent number 7,015,690
- Issue date Mar 21, 2006
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current calibration standard
- Patent number 6,356,069
- Issue date Mar 12, 2002
- General Electric Company
- Richard L. Trantow
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES
- Publication number 20110004452
- Publication date Jan 6, 2011
- Sanghamithra Korukonda
- G01 - MEASURING TESTING
Information Patent Application
PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTI...
- Publication number 20100312494
- Publication date Dec 9, 2010
- Sanghamithra Korukonda
- G01 - MEASURING TESTING
Information Patent Application
MULTI-FREQUENCY IMAGE PROCESSING FOR INSPECTING PARTS HAVING COMPLE...
- Publication number 20080159619
- Publication date Jul 3, 2008
- GENERAL ELECTRIC COMPANY
- Ui Won SUH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS
- Publication number 20070222439
- Publication date Sep 27, 2007
- GENERAL ELECTRIC COMPANY
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20070140546
- Publication date Jun 21, 2007
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Eddy current inspection method and system
- Publication number 20060229833
- Publication date Oct 12, 2006
- General Electric Company
- Preeti Pisupati
- G01 - MEASURING TESTING
Information Patent Application
Eddy current array probes with enhanced drive fields
- Publication number 20060132123
- Publication date Jun 22, 2006
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20060109001
- Publication date May 25, 2006
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20060023961
- Publication date Feb 2, 2006
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Omnidirectional eddy current probe and inspection system
- Publication number 20050264284
- Publication date Dec 1, 2005
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING

Gigi Olive GAMBRELL

Person

Patents Grantslast 30 patents

Methods and apparatus for testing a component

Multi-frequency image processing for inspecting parts having comple...

Methods and apparatus for testing a component

Methods and apparatus for testing a component

Eddy current inspection method and system

Omnidirectional eddy current probe and inspection system

Eddy current calibration standard

Patents Applicationslast 30 patents

METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES

PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTI...

MULTI-FREQUENCY IMAGE PROCESSING FOR INSPECTING PARTS HAVING COMPLE...

EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS

Methods and apparatus for testing a component

Eddy current inspection method and system

Eddy current array probes with enhanced drive fields

Methods and apparatus for testing a component

Methods and apparatus for testing a component

Omnidirectional eddy current probe and inspection system