Giuseppe Larosa

Person

Fishkill, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electrostatic discharge protection solutions
- Patent number 9,882,377
- Issue date Jan 30, 2018
- International Business Machines Corporation
- Giuseppe La Rosa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Structure and methodology for characterizing device self-heating
- Patent number 7,805,274
- Issue date Sep 28, 2010
- International Business Machines Corporation
- Ping-Chuan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for dynamic characterization of reliability we...
- Patent number 7,710,141
- Issue date May 4, 2010
- International Business Machines Corporation
- Giuseppe La Rosa
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method for thermally stressing or testing a semicondu...
- Patent number 7,375,371
- Issue date May 20, 2008
- International Business Machines Corporation
- Giuseppe La Rosa
- G01 - MEASURING TESTING
Information Patent Grant
Trench capacitor vertical structure
- Patent number 7,023,041
- Issue date Apr 4, 2006
- International Business Machines Corporation
- Giuseppe La Rosa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and circuit for element wearout recovery
- Patent number 6,958,621
- Issue date Oct 25, 2005
- International Business Machines Corporation
- Giuseppe La Rosa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced hot carrier induced parasitic sidewall device activation in...
- Patent number 6,867,472
- Issue date Mar 15, 2005
- Infineon Technologies AG
- Rajesh Renegarajan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-shield-trench isolation for gigabit DRAMs
- Patent number 6,762,447
- Issue date Jul 13, 2004
- Infineon Technologies North America Corp.
- Jack A. Mandelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and circuit to investigate charge transfer array transistor...
- Patent number 6,762,966
- Issue date Jul 13, 2004
- International Business Machines Corporation
- Giuseppe LaRosa
- G11 - INFORMATION STORAGE
Information Patent Grant
PMOSFET device with localized nitrogen sidewall implantation
- Patent number 6,724,053
- Issue date Apr 20, 2004
- International Business Machines Corporation
- Rama Divakaruni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Line monitoring of negative bias temperature instabilities by hole...
- Patent number 6,521,469
- Issue date Feb 18, 2003
- International Business Machines Corporation
- Giuseppe La Rosa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with STI sidewall implant
- Patent number 6,521,493
- Issue date Feb 18, 2003
- International Business Machines Corporation
- Johann Alsmeier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for array threshold voltage control by trapped ch...
- Patent number 6,348,394
- Issue date Feb 19, 2002
- International Business Machines Corporation
- Jack A. Mandelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auto-programmable current limiter to control current leakage due to...
- Patent number 6,049,495
- Issue date Apr 11, 2000
- International Business Machines Corporation
- Louis L. C. Hsu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM
- Publication number 20240203519
- Publication date Jun 20, 2024
- International Business Machines Corporation
- Giuseppe La Rosa
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION SOLUTIONS
- Publication number 20160218503
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Giuseppe La Rosa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND APPARATUS FOR DYNAMIC CHARACTERIZATION OF RELIABILITY WE...
- Publication number 20090167336
- Publication date Jul 2, 2009
- International Business Machines Corporation
- Giuseppe La Rosa
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHODOLOGY FOR CHARACTERIZING DEVICE SELF-HEATING
- Publication number 20080112458
- Publication date May 15, 2008
- International Business Machines Corporation
- Ping-Chuan Wang
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD FOR THERMALLY STRESSING OR TESTING A SEMICONDU...
- Publication number 20070235769
- Publication date Oct 11, 2007
- International Business Machines Corporation
- Giuseppe La Rosa
- G01 - MEASURING TESTING
Information Patent Application
Reduced hot carrier induced parasitic sidewall device activation in...
- Publication number 20040142500
- Publication date Jul 22, 2004
- Infineon Technologies North America Corp.
- Rajesh Renegarajan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND CIRCUIT TO INVESTIGATE CHARGE TRANSFER ARRAY TRANSISTOR...
- Publication number 20040130957
- Publication date Jul 8, 2004
- International Business Machines Corp.
- Giuseppe LaRosa
- G11 - INFORMATION STORAGE

Giuseppe Larosa

Person

Patents Grantslast 30 patents

Electrostatic discharge protection solutions

Structure and methodology for characterizing device self-heating

Method and apparatus for dynamic characterization of reliability we...

Structure and method for thermally stressing or testing a semicondu...

Trench capacitor vertical structure

Method and circuit for element wearout recovery

Reduced hot carrier induced parasitic sidewall device activation in...

Field-shield-trench isolation for gigabit DRAMs

Method and circuit to investigate charge transfer array transistor...

PMOSFET device with localized nitrogen sidewall implantation

Line monitoring of negative bias temperature instabilities by hole...

Semiconductor device with STI sidewall implant

Method and device for array threshold voltage control by trapped ch...

Auto-programmable current limiter to control current leakage due to...

Patents Applicationslast 30 patents

TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM

ELECTROSTATIC DISCHARGE PROTECTION SOLUTIONS

METHOD AND APPARATUS FOR DYNAMIC CHARACTERIZATION OF RELIABILITY WE...

STRUCTURE AND METHODOLOGY FOR CHARACTERIZING DEVICE SELF-HEATING

STRUCTURE AND METHOD FOR THERMALLY STRESSING OR TESTING A SEMICONDU...

Reduced hot carrier induced parasitic sidewall device activation in...

METHOD AND CIRCUIT TO INVESTIGATE CHARGE TRANSFER ARRAY TRANSISTOR...