Glen Gomes

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Providing precise timing control within a standardized test instrum...
- Patent number 7,437,589
- Issue date Oct 14, 2008
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Circuit card synchronization within a standardized test instrumenta...
- Patent number 7,437,588
- Issue date Oct 14, 2008
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Providing precise timing control between multiple standardized test...
- Patent number 7,366,939
- Issue date Apr 29, 2008
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Event processing apparatus and method for high speed event based te...
- Patent number 7,171,602
- Issue date Jan 30, 2007
- Advantest Corp.
- Glen Gomes
- G01 - MEASURING TESTING
Information Patent Grant
Event pipeline and summing method and apparatus for event based tes...
- Patent number 7,010,452
- Issue date Mar 7, 2006
- Advantest Corp.
- Glen Gomes
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for successively generating an event to establ...
- Patent number 6,668,331
- Issue date Dec 23, 2003
- Advantest Corp.
- Glen A. Gomes
- G01 - MEASURING TESTING
Information Patent Grant
Scaling logic for event based test system
- Patent number 6,557,133
- Issue date Apr 29, 2003
- Advantest Corp.
- Glen A. Gomes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Providing precise timing control between multiple standardized test...
- Publication number 20070168766
- Publication date Jul 19, 2007
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Application
Circuit card synchronization within a standardized test instrumenta...
- Publication number 20070040564
- Publication date Feb 22, 2007
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Application
Providing precise timing control within a standardized test instrum...
- Publication number 20070043990
- Publication date Feb 22, 2007
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Application
Event pipeline and summing method and apparatus for event based tes...
- Publication number 20040107058
- Publication date Jun 3, 2004
- Glen Gomes
- G01 - MEASURING TESTING
Information Patent Application
Event processing apparatus and method for high speed event based te...
- Publication number 20030229473
- Publication date Dec 11, 2003
- Glen Gomes
- G01 - MEASURING TESTING