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Glenn R. JOHNSON
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Aloha, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Trace delay error compensation
Patent number
7,634,747
Issue date
Dec 15, 2009
Tektronix, Inc.
Michael S. Hagen
G01 - MEASURING TESTING
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Patent Grant
Apparatus for use in a logic analyzer for compressing digital data...
Patent number
6,473,700
Issue date
Oct 29, 2002
Tektronix, Inc.
David A. Holaday
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TRACE DELAY ERROR COMPENSATION
Publication number
20080007712
Publication date
Jan 10, 2008
Tektronix, Inc.
Michael S. Hagen
G01 - MEASURING TESTING
Information
Patent Application
MACRO-LEVEL DIGITAL DATA EVENT DISPLAY
Publication number
20070273693
Publication date
Nov 29, 2007
Tektronix, Inc.
Glenn R. JOHNSON
G06 - COMPUTING CALCULATING COUNTING